Scanning probe microscopy lab
Lab is equipped with three atomic force microscopes. The first one is the dimension 3100 by Digital with the nanoscope III A controller. It is equipped with modules for scanning capacitance microscopy, conductive microscopy, and atomic force microscopy. The second instrument is the multimode by Digital which allows us to carry out atomic force microscopy measurements with low noise and a very high spatial resolution (atomic level). The third instrument is the XE 150 by PSIA. It allows us to get morphological analysis with an interferometer control of the lateral position on the sample surface, either in contact or in true non contact mode.
Staff contact: Patrick Fiorenza
