Transmission electron microscopy lab
Lab is equipped with:
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a JEOL JEM 2010 transmission electron microscope with a LaB6 thermoionic source operating at an acceleration voltage of 200 kV. The instrument achieves a spatial resolution of 0.24 nm and is equipped with a Gatan multiscan digital camera, an Oxford energy dispersive spectroscopy apparatus, a heating specimen holder (maximum temperature of 1000 °C), and a specimen holder operating at the liquid nitrogen temperature
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a JEOL JEM 2010F transmission electron microscope with a Schottky field emission gun operating at an acceleration voltage of 200 kV. The instrument achieves a spatial resolution of 0.18 nm and is equipped with a Gatan image filter which allows us to get images tuned to narrow windows of the sample electron energy loss spectrum, with a scanning transmission electron microscopy (STEM) unit, and with an annular detector for Z-contrast analysis
Lab is also equipped with facilities for mechanical and ion milling of the samples (disc grinder, dimple grinder, ultrasonic cutter, Gatan precision ion polishing system, etc.)
Staff contact: Corrado Bongiorno, Salvo Pannitteri, Giuseppe Nicotra
