Tem for characterization of semiconductor nanomaterials

Data di pubblicazione: 1 Gen 2014

LibroFonte dati: ARCHIVIO

Transmission electron microscopy provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution. In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.

Editore
Springer, Berlin, Heidelberg
Fonte
Transmission Electron Microscopy Characterization of Nanomaterials
ID archivio
ffe90462e3f59c273fd0ab18526173dd
Riferimenti
Pages: 89-138