The role of self interstitials in As+ diffusion of implanted silicon

Data di pubblicazione: 31 Gen 2021

LibroFonte dati: ARCHIVIO

Arsenic implanted specimens after liquid phase epitaxy followed by annealing treatment were studied in the range 450 C-900 C. A detailed analysis of As and interstitial profiles reveals that arsenic diffuses, starting from 550 C, in two stages: as an interstitial-arsenic complex for 550 C≤ T≤ 650 C and independently of interstitials for T≥ 750* C. It is shown that interstitials are created during the liquid to solid transformation prior to the annealing treatments.ABSTRACT

Editore
CRC Press
Fonte
Microscopy of Semiconducting Materials, 1987
ID archivio
2c66c87db9e407d8145f26486fad57e9
Riferimenti
Pages: 491-496