Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope

Data di pubblicazione: 31 Lug 2024

RivistaFonte dati: OPENALEXTipo OpenAlex: articleOpen Access
Autori: Amir Hossein Tavabi, Paolo Rosi, Raimond B. G. Ravelli, Abril Gijsbers, Enzo Rotunno, Tuğrul Güner, Yingwen Zhang, Alberto Roncaglia, Luca Belsito, G. Pozzi, Thibaud Denneulin, G. C. Gazzadi, M. Ghosh, R. Nijland, Stefano Frabboni, Peter J. Peters, Ebrahim Karimi, Peter C. Tiemeijer, Rafal E. Dunin‐Borkowski, Vincenzo Grillo

Chirality can appear at many length scales in nature. In this study the authors introduce planar chirality as a quantitative geometric measure of chirality for two-dimensional objects. They apply this measure to evaluate the chirality of nanometer-sized structures with an electron microscope. They employ an innovative electron-optics device, the orbital-angular-momentum sorter, which applies a log-polar conformal mapping to the electron wave function and reaches near-optimal resolution in orbital angular momentum.

Fonte
Physical Review Applied
Volume
22
Fascicolo
1
Citazioni
3
ID archivio
bef54c170b173ad5e415029b518c2907
Riferimenti
Volume: 22 Issue: 1 Pages: 014083