Fabrication and testing of a high resolution extensometer based on resonant MEMS strain sensors

Data di pubblicazione: 1 Giu 2011

conference-paperFonte dati: OPENALEXTipo OpenAlex: conference-paperAccesso chiuso
Autori: M. Ferri, Matteo Ferri, Luca Belsito, Fulvio Mancarella, Luca Masini, Alberto Roncaglia, Junqiang Yan, J. Yan, Ashwin A. Seshia, J. Zalesky, Jan Zalesky, Kenichi Soga

A novel type of linear extensometer with exceptionally high resolution of 4 nm based on MEMS resonant strain sensors bonded on steel and operating in a vacuum package is presented. The tool is implemented by means of a steel thin bar that can be pre-stressed in tension within two fixing anchors. The extension of the bar is detected by using two vacuum-packaged resonant MEMS double-ended tuning fork (DETF) sensors bonded on the bar with epoxy glue, one of which is utilized for temperature compensation. Both sensors are driven by a closed loop self-oscillating transresistance amplifier feedback scheme implemented on a PCB (Printed Circuit Board). On the same board, a microcontroller-based frequency measurement circuit is also implemented, which is able to count the square wave fronts of the MEMS oscillator output with a resolution of 20 nsec. The system provides a frequency noise of 0.2 Hz corresponding to an extension resolution of 4 nm for the extensometer. Nearly perfect temperature compensation of the frequency output is achieved in the temperature range 20-35°C using the reference sensor.

Editore
IEEE
Fonte
2011 16th International Solid-State Sensors, Actuators and Microsystems Conference
Pagine
1056-1059
Citazioni
6
ID archivio
74d996b519633181da571f1c18d84fd9
Riferimenti
Pages: 1056-1059