Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscope

Data di pubblicazione: 17 Mar 2009

LibroFonte dati: OPENALEXTipo OpenAlex: book-chapterAccesso chiuso
Autori: Giuseppe Nicotra, Corrado Bongiorno, C. Spinella, E. Rimini

Different physical and chemical methods can produce Si nanocomposite films, and most of them start with the deposition of silicon rich oxide (SRO) followed by hightemperature annealing [1].

Editore
Springer, Berlin, Heidelberg
Fonte
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Pagine
415-416
Citazioni
0
ID archivio
3c26fda41cf3c327f07e272c89ba8389
Riferimenti
Pages: 415-416