2 pubblicazioni trovate

• Detailed arsenic concentration profiles at Si/SiO {sub 2} interfaces
  Antonio Terrasi
  2008-08-15
  Riferimenti: Volume: 104 Issue: 4
  Fonte: Journal of Applied Physics
• Detailed arsenic concentration profiles at interfaces
  Antonio Terrasi
  2008-08-15
  Riferimenti: Volume: 104 Issue: 4 Pages: 043507
  Fonte: Journal of Applied Physics