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Surname: 
Calvi
Firstname: 
Sabrina
Position: 
Temporary
Profile: 
PhD Student
Phone: 
+39 06 4993 4237
Source: 
Rome UNIT

Scientific Productions

G Giusi, O Giordano, G Scandurra, M Rapisarda, S Calvi, C Ciofi

Publisher’s Note:“High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors”[Rev. Sci. Instrum. 87, 044702 (2016)]

Review of Scientific Instruments [AIP Publishing], Volume: 87 Issue: 5 Pages: 059902

G Giusi, O Giordano, G Scandurra, M Rapisarda, S Calvi, C Ciofi

High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors

Review of Scientific Instruments [AIP Publishing], Volume: 87 Issue: 4 Pages: 044702

Luigi Mariucci, Matteo Rapisarda, Antonio Valletta, Sabrina Calvi, Mohammed Benwadih, Romain Coppard, Guglielmo Fortunato

(Invited) Contact effects in organic thin film transistors with different device structures

ECS Transactions [The Electrochemical Society], Volume: 64 Issue: 10 Pages: 131-142

G Giusi, O Giordano, G Scandurra, C Ciofi, M Rapisarda, S Calvi

Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level

Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International [IEEE], Pages: 2095-2100

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