https://www.imm.cnr.it/pubblicazioni/4423-mechanical-proprieties-and-residual-stress-evaluation-on-heteroepitaxial-3c-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4424-study-of-the-connection-between-stacking-faults-evolution-and-step-kinetics-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4425-advanced-stress-analysis-by-micro-structures-realization-on-high-quality-hetero/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4426-monte-carlo-study-of-morphological-surface-instabilities-during-misoriented/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4427-3c-sic-hetero-epitaxial-films-for-sensors-fabrication/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4428-optimisation-of-epitaxial-layer-growth-with-hcl-addition-by-optical-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4429-epitaxial-layers-grown-with-hcl-addition-a-comparison-with-the-standard-process/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4431-environment-influence-on-ti-diffusion-and-layer-degradation-of-a-sic-ni2si-tiw/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4432-effects-of-thermal-treatments-on-the-structural-and-electrical-properties-of-ni/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4433-origin-of-the-c49-c54-volume-anomaly-in-tisi2-thin-films-an-in-situ-xrd-and-tem/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4434-electrical-characterization-of-nickel-silicide-contacts-on-silicon-carbide/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4435-kinetics-of-the-c49-c54-transformation-by-micro-raman-imaging/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4436-ion-irradiation-effect-on-the-ni-sic-interface-reaction/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4437-effect-of-lateral-dimensional-scaling-on-the-thermal-stability-of-thin-layers/2021-09-27T16:32:34+00:00https://www.imm.cnr.it/pubblicazioni/4438-texturing-surface-energetics-and-morphology-in-the-c49-c54-transformation-of/2021-03-08T13:08:39+00:00https://www.imm.cnr.it/pubblicazioni/4439-formation-and-characterization-of-si-cosi2-si-epitaxial-heterostructures/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4440-pulsed-laser-melting-and-resolidification-of-metal-silicide-layers/2021-03-08T13:08:39+00:00https://www.imm.cnr.it/pubblicazioni/4441-titanium-silicide-as-a-diffusion-source-for-phosphorous-precipitation-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4442-silicon-carbide-detectors-study-for-numen-project/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4443-fast-growth-rate-epitaxy-by-chloride-precursors/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4444-study-of-microstructure-deflections-and-film-substrate-curvature-under/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4445-structural-characterization-of-heteroepitaxial-3c-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4446-stress-evaluation-on-hetero-epitaxial-3c-sic-film-on-100-si-substrates/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4447-sic-films-and-coatings-amorphous-polycrystalline-and-single-crystal-forms/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4448-wafer-cut-effect-on-hetero-epitaxial-3c-sic-film-for-mems-application/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4449-strain-field-analysis-of-3c-sic-free-standing-microstructures-by-micro-raman/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4450-multiscale-simulation-for-epitaxial-silicon-carbide-growth-by-chlorides-route/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4452-defects-in-high-energy-ion-irradiated-4h-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4453-c49-c54-phase-transition-in-nanometric-titanium-disilicide-grains/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4454-c49-c54-phase-transition-in-nanometric-titanium-disilicide-nanograins/2021-03-08T13:08:37+00:00https://www.imm.cnr.it/pubblicazioni/4455-electrical-properties-of-tisi2-clusters-in-poly-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4456-study-of-cosi2-thermal-stability-improved-by-interfacial-cavities/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4457-direct-measurement-of-the-growth-rate-during-the-c49-to-c54-transformation-in/2021-03-08T13:08:40+00:00https://www.imm.cnr.it/pubblicazioni/4458-kinetics-of-the-c49-c54-transformation-in-patterned-and-blanket-tisi2-films-a/2021-03-08T13:08:40+00:00https://www.imm.cnr.it/pubblicazioni/4459-exafs-investigation-of-co-sites-in-cosi2-film-grown-by-ion-beam-assisted/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4460-improved-thermal-stability-of-cobalt-silicide-formed-by-ion-beam-assisted/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4461-a-novel-micro-raman-technique-to-detect-and-characterize-4h-sic-stacking-faults/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4462-patterned-substrate-with-inverted-silicon-pyramids-for-3c-sic-epitaxial-growth/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4463-3c-sic-growth-on-001-si-substrates-by-using-a-multilayer-buffer/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4464-crystal-recovery-from-alimplantation-induced-damaging-in-3csic-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4465-extended-characterization-of-the-stress-fields-in-the-heteroepitaxial-growth-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4466-invited-high-quality-3c-sic-for-mos-applications/2017-05-15T11:13:09+00:00https://www.imm.cnr.it/pubblicazioni/4467-3c-sic-film-growth-on-si-substrates/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4468-reduction-of-the-surface-density-of-single-shockley-faults-by-tcs-growth-process/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4469-study-of-the-evolution-of-basal-plane-dislocations-during-epitaxial-growth-role/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4470-carbonization-study-of-different-silicon-orientations/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4471-heteroepitaxial-growth-of-3c-sic-on-silicon-porous-silicon-silicon-sps/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4472-effects-of-implantation-defects-on-the-carrier-concentration-of-6h-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4473-ohmic-contacts-to-sic/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4474-defect-evolution-in-ion-irradiated-6h-sic-epitaxial-layers/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4475-effects-of-epitaxial-layer-growth-parameters-on-the-defect-density-and-on-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4476-time-resolved-cosi2-reaction-in-presence-of-ti-and-tin-cap-layers/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4477-defects-in-he-irradiated-6h-sic-probed-by-dlts-and-ltpl-measurements/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4478-time-resolved-study-on-co-ni-a-si-phase-transition-during-isothermal-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4479-c49-defect-influence-on-the-c49-c54-transition/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4480-thermal-stability-of-thin-cosi2-layers-grown-on-amorphous-silicon/2021-09-27T16:32:40+00:00https://www.imm.cnr.it/pubblicazioni/4481-arsenic-redistribution-and-out-diffusion-in-tisi2-si-bilayered-structures/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/4482-electrical-properties-of-defects-in-4h-sic-investigated-by-photo-induced/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4483-ion-implantation-defects-in-4h-sic-dimosfet/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4484-laser-plasma-monitored-by-silicon-carbide-detectors/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4486-semiconductor-substrate-suitable-for-the-realization-of-electronic-and-or/2017-05-15T11:12:32+00:00https://www.imm.cnr.it/pubblicazioni/4487-invited-three-dimensional-epitaxial-si1-xgex-ge-and-sic-crystals-on-deeply/2017-06-15T08:13:16+00:00https://www.imm.cnr.it/pubblicazioni/4489-mev-ion-beams-generated-by-intense-pulsed-laser-monitored-by-silicon-carbide/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4490-curvature-evaluation-of-si-3c-sic-si-hetero-structure-grown-by-chemical-vapor/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4491-evaluation-of-mechanical-and-optical-properties-of-hetero-epitaxial-single/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4492-correlation-between-macroscopic-and-microscopic-stress-fields-application-to/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4493-large-area-optical-characterization-of-3-and-4-inches-4h-sic-wafers/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4494-micro-raman-analysis-of-a-micromachined-3c-sic-cantilever/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4495-a-study-of-structural-defects-in-3c-sic-hetero-epitaxial-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4496-bow-in-6-inch-high-quality-off-axis-111-3c-sic-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4497-void-formation-in-differently-oriented-si-in-the-early-stage-of-sic-growth/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4498-residual-stress-measurement-on-hetero-epitaxial-3c-sic-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4500-towards-large-area-1113c-sic-films-grown-on-off-oriented-111si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4501-point-defect-production-efficiency-in-ion-irradiated-4h-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4502-then-some-aspects-concerning-the-formation-of-low-resistance-10-10-qcm-ohmic/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4503-optimisation-of-epitaxial-layer-growth-by-schottky-diodes-electrical/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4504-temperature-stability-of-breakdown-voltage-on-sic-power-schottky-diodes-with/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4505-influence-of-defects-on-the-kinetic-of-c49-c54-tisi2-transformation/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4506-structural-characterization-and-oxygen-concentration-profiling-of-a-co-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4507-electrical-characterization-of-inhomogeneous-ni2-si-sic-schottky-contacts/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4508-low-power-dissipation-sic-schottky-rectifiers-with-a-dual-metal-planar-structure/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4509-high-reproducible-ideal-sic-schottky-rectifiers-by-controlling-surface/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4510-thermal-oxidation-of-high-dose-aluminum-implanted-silicon/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4511-enhanced-oxidation-of-ion-damaged-6h-sic/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4512-effect-of-lateral-dimension-scaling-on-thermal-stability-of-thin-cosi2-layers/2021-09-27T16:32:39+00:00https://www.imm.cnr.it/pubblicazioni/4513-electrical-properties-of-extended-defects-in-4h-sic-investigated-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4514-growing-bulk-like-3c-sic-from-seeding-material-produced-by-cvd/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4515-structural-and-electronic-transitions-in-ge2sb2te5-induced-by-ion-irradiation/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4516-the-nuclear-matrix-elements-of-0v-decay-and-the-numen-project-at-infn-lns/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4517-high-growth-rate-3c-sic-growth-from-hetero-epitaxy-to-homo-epitaxy/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4518-optimization-of-ion-implantation-processes-for-4h-sic-dimosfet/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4519-physical-vapor-growth-of-double-position-boundary-free-quasi-bulk-3c-sic-on/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4522-4h-sic-defects-analysis-by-micro-raman-spectroscopy/2017-05-15T11:13:04+00:00https://www.imm.cnr.it/pubblicazioni/4524-correlations-between-crystal-quality-and-electrical-properties-by-means-of/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/4525-3c-sic-polycrystalline-films-on-si-for-photovoltaic-applications/2021-09-27T16:32:36+00:00https://www.imm.cnr.it/pubblicazioni/4527-monte-carlo-study-of-the-early-growth-stages-of-3csic-on-misoriented-and-6hsic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4528-fracture-property-and-quantitative-strain-evaluation-of-hetero-epitaxial-single/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4529-4h-sic-epitaxial-layer-grown-on-150-mm-automatic-horizontal-hot-wall-reactor/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4530-micro-raman-characterization-of-4h-sic-stacking-faults/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4531-monte-carlo-study-of-the-early-growth-stages-of-3c-sic-on-misoriented-and-6h/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4532-introduction-to-silicon-carbide-materials-processing-and-devices-addendum/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4535-effects-of-al-ion-implantation-on-3c-sic-crystal-structure/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4536-manufacture-of-wafers-of-wide-energy-gap-semiconductor-material-for-the/2017-05-15T11:12:38+00:00https://www.imm.cnr.it/pubblicazioni/4537-growth-and-processing-of-heteroepitaxial-3c-sic-films-for-electronic-devices/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4538-consideration-on-the-thermal-expansion-of-3c-sic-epitaxial-layer-on-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4539-chloride-based-cvd-of-4h-sic-at-high-growth-rates-on-substrates-with-different/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4540-correlation-between-microstructure-deflections-and-film-substrate-curvature/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4541-publishers-note-defect-influence-on-heteroepitaxial-3c-sic-youngs-modulus/2019-12-21T23:56:59+00:00https://www.imm.cnr.it/pubblicazioni/4542-advanced-residual-stress-analysis-on-the-heteroepitaxial-growth-of-3c-sic-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4543-high-power-density-uv-optical-stress-for-quality-evaluation-of-4h-sic-epitaxial/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4544-evolution-of-extended-defects-during-epitaxial-growths-a-monte-carlo-study/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4545-raman-study-of-bulk-mobility-in-3c-sic-heteroepitaxy/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4546-optical-characterization-of-bulk-mobility-in-3c-sic-films-grown-on-different/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4547-systematic-first-principles-calculations-of-the-effects-of-stacking-faults/2020-05-06T22:40:20+00:00https://www.imm.cnr.it/pubblicazioni/4548-evolution-of-stacking-faults-defects-during-epitaxial-growths-role-of-surface/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4549-single-shockley-faults-evolution-under-uv-optical-pumping/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4550-compensation-effects-in-7-mev-c-irradiated-n-doped-4h-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4551-effect-of-mo-interlayer-on-thermal-stability-of-polycrystalline-nisi-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4552-thermal-stability-of-sio2-cosi2-polysilicon-multilayer-structures-improved-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4553-structural-and-electrical-characterization-of-nickel-silicides-contacts-on/2021-01-23T23:08:03+00:00https://www.imm.cnr.it/pubblicazioni/4554-structural-and-electrical-characterisation-of-nickel-silicides-contacts-on/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4555-effects-of-a-ta-interlayer-on-the-titanium-silicide-reaction-c40-formation-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4556-effect-of-lateral-dimensional-scaling-on-the-thermal-stability-of-poly-cosi2/2021-09-27T16:32:44+00:00https://www.imm.cnr.it/pubblicazioni/4557-investigation-on-c54-nucleation-and-growth-by-micro-raman-imaging/2020-12-18T23:24:04+00:00https://www.imm.cnr.it/pubblicazioni/4559-estimation-of-the-critical-radius-for-the-nucleation-of-the-c54-phase-in-c49/2021-03-08T13:08:38+00:00https://www.imm.cnr.it/pubblicazioni/4560-exafs-investigation-of-co-sites-in-cosi2-film-crown-by-ion-beam-assisted/2020-12-16T17:16:59+00:00https://www.imm.cnr.it/pubblicazioni/4561-thermal-stability-of-thin-cosi2-layers-on-polysilicon-implanted-with-as-bf2-and/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4562-surface-and-interface-roughness-after-thermal-oxidation-of-as-b-and-si/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/4563-electrical-characterization-of-ultra-shallow-junctions-formed-by-diffusion-from/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/4564-high-resolution-delineation-of-bi-dimensional-dopant-profiles-in-silicon-early/2020-12-12T23:27:53+00:00https://www.imm.cnr.it/pubblicazioni/4565-an-auger-electron-spectroscopy-study-of-the-influence-of-sputter-ambient-on-the/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/4566-in-microelectronic-manufacturing-chemical-mechanical-polishing-cmp-of-silicon/2018-06-30T22:14:02+00:00https://www.imm.cnr.it/pubblicazioni/4567-sic-films-and-coatings-chapter-2-amorphous-polycrystalline-and-single-crystal/2017-05-15T11:12:55+00:00https://www.imm.cnr.it/pubblicazioni/4568-crystallographic-defects-detection-in-3c-sic-by-micro-raman-analysis/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/4569-high-responsivity-4h-sic-schottky-uv-photodiodes-based-on-the-pinch-off-surface/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4570-design-fabrication-and-testing-of-anintegrated-si-based-light-modulator/2018-05-15T22:14:05+00:00https://www.imm.cnr.it/pubblicazioni/4571-highly-efficient-low-reverse-biased-4h-sic-schottky-photodiodes-for-uv-light/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4572-miniaturizable-si-based-electro-optical-modulator-working-at-1-5-m/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4573-electro-optical-response-of-ion-irradiated-4h-sic-schottky-ultraviolet/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4574-photocurrent-gain-in-4h-sic-interdigit-schottky-uv-detectors-with-a-thermally/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4575-luminescence-properties-of-sioxny-irradiated-by-ir-laser-808-nm-the-role-of-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4576-high-efficiency-4h-sic-schottky-uv-photodiodes-using-self-aligned/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4577-on-the-aging-effects-of-4h-sic-schottky-photodiodes-under-high-intensity/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4578-interdigit-4h-sic-vertical-schottky-diode-for-betavoltaic-applications/2019-06-10T22:47:14+00:00https://www.imm.cnr.it/pubblicazioni/4579-thin-metal-film-ni2si-4h-sic-vertical-schottky-photodiodes/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4580-synthesis-of-crystalline-si-quantum-dots-by-millisecond-laser-irradiation-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4581-4h-sic-schottky-photodiodes-for-ultraviolet-light-detection/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4582-experimental-evidences-of-carrier-distribution-and-behavior-in-frequency-in-a/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4586-temperature-and-light-induced-effects-on-the-capacitance-of-4h-sic-schottky/2019-06-09T22:57:54+00:00https://www.imm.cnr.it/pubblicazioni/4588-electro-optical-modulators-in-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4591-very-low-dose-ionimplantation-effect-on-heteroepitaxial-3csic-mechanical/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4593-miniaturizable-si-based-light-intensity-modulator-for-integrated-sensing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4594-gastrectomia-totale-versus-resezione-gastrica-distale-per-cancro-dello-stomaco/2019-06-09T22:57:53+00:00https://www.imm.cnr.it/pubblicazioni/4596-integrated-electronic-device-for-detecting-ultraviolet-radiation/2017-05-15T11:13:05+00:00https://www.imm.cnr.it/pubblicazioni/4597-4h-sic-schottky-array-photodiodes-for-uv-imaging-application-based-on-the-pinch/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/4598-fabrication-and-characterization-of-polymeric-optical-waveguides-using-standard/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4601-sic-detector-for-sub-mev-alpha-spectrometry/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4604-large-area-visible-blind-4h-sic-p-n-uv-photodiode-obtained-by-aluminium/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/4605-ni2si-4h-sic-schottky-photodiodes-for-ultraviolet-light-detection/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/4607-multiband-double-junction-photodiode-and-related-manufacturing-process/2017-05-15T11:12:36+00:00https://www.imm.cnr.it/pubblicazioni/4610-millisecond-infrared-laser-irradiation-of-sioxny-the-role-of-nitrogen-in-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4611-schottky-barrier-lowering-in-4h-sic-schottky-uv-detector/2021-01-11T15:00:30+00:00https://www.imm.cnr.it/pubblicazioni/4612-lasers-optics-and-optoelectronics/2018-06-25T22:11:22+00:00https://www.imm.cnr.it/pubblicazioni/4613-schottky-barrier-lowering-in-4h-sic-schottky-uv-detector/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/4614-4h-sic-schottky-array-photodiodes-for-uv-imaging-application-based-on-the-pinch/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4615-chapter-5-sic-devices-5-4-sensors-and-detectors-4h-sic-schottky-array/2018-03-31T22:36:19+00:00https://www.imm.cnr.it/pubblicazioni/4616-lasers-optics-and-optoelectronics/2018-03-31T22:36:21+00:00https://www.imm.cnr.it/pubblicazioni/4617-experimental-analysis-of-a-bmfet-light-intensity-modulator-from-static/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/4618-thermo-opto-electrical-analysis-of-an-optical-modulator-integrated-in-a-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4619-a-miniaturizable-integrated-si-based-light-modulator/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4620-an-integrated-si-based-electro-optical-modulator/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4621-design-fabrication-and-testing-of-an-integrated-si-based-light-modulator/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4622-mesenteric-venous-thrombosis/2019-06-09T22:57:53+00:00https://www.imm.cnr.it/pubblicazioni/4623-la-trombosi-venosa-mesenterica/2019-06-09T22:57:53+00:00https://www.imm.cnr.it/pubblicazioni/4624-amorphous-to-crystal-transition-of-nitrogen-and-oxygen-doped-films-studied-by/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4625-crystallization-and-phase-separation-in-ge2xsb2te5-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4626-crystal-nucleation-and-growth-processes-in-ge2sb2te5/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4627-effects-of-dopants-on-the-amorphous-to-fcc-transition-in-ge2sb2te5-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4629-morphological-and-electrical-characterization-of-sixcryczbv-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4630-amorphous-to-polycrystal-transition-in-gesbte-thin-films/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4631-mixed-phase-ge2sb2te5-thin-films-with-temperature-independent-resistivity/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4632-morphological-and-electrical-characterization-of-electrically-trimmable-thin/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4634-structural-transformations-in-ge2sb2te5-under-high-pressure-and-temperature/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4635-high-precision-resistor-and-trimming-method-thereof/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4636-impact-of-annealing-induced-structural-relaxation-on-the-electrical-properties/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4637-resistor-structure-of-phase-change-material-and-trimming-method-thereof/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4638-high-precision-resistor-and-trimming-method-thereof/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4640-semiconductor-substrate-suitable-for-the-realisation-of-electronic-and-or/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4641-electrically-trimmable-resistor-device-and-trimming-method-thereof/2020-12-11T23:31:49+00:00https://www.imm.cnr.it/pubblicazioni/4642-corrigendum-metal-insulator-transition-driven-by-vacancy-ordering-in-gesbte/2021-07-20T08:00:10+00:00https://www.imm.cnr.it/pubblicazioni/4644-vialess-integration-for-dual-thin-films-thin-film-resistor-and-heater/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4645-further-bibliography-abbreviations/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4646-electroactive-ionic-soft-actuators-with-monolithically-integrated-gold/2021-08-03T16:12:07+00:00https://www.imm.cnr.it/pubblicazioni/4647-resistor-structure-of-phase-change-material-and-trimming-method-thereof/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4648-ion-implantation-in-phase-change-ge2sb2te5-thin-films-for-non-volatile-memory/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4649-amorphous-to-fcc-transition-in-gesbte-alloys/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4650-amorphous-to-crystal-transition-of-nitrogen-and-oxygen-doped-equation-font/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4651-crystallization-and-phase-separation-in-equation-font-faceverdana-ge-sub-2-x/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4652-c49-c54-phase-transition-in-tisi2-thin-films-and-conductors/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4653-investigation-on-c54-nucleation-and-growth-by-micro-raman-imaging-stefania/2018-03-31T22:36:20+00:00https://www.imm.cnr.it/pubblicazioni/4654-effects-of-the-amorphous-structure-on-the-electrical-conductivity-and-the/2020-12-13T23:18:53+00:00https://www.imm.cnr.it/pubblicazioni/4655-amorphous-to-fcc-transition-in-ge2sb2te5-thin-films-kinetics-and-effects-of/2017-05-15T11:12:35+00:00https://www.imm.cnr.it/pubblicazioni/4656-si-sio2-core-shell-clusters-probed-by-raman-spectroscopy/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4657-distribution-of-the-threshold-voltage-window-in-nanocrystal-memories-with-si/2020-12-14T23:08:51+00:00https://www.imm.cnr.it/pubblicazioni/4658-large-grained-polycrystalline-si-films-obtained-by-selective-nucleation-and/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4659-confinement-of-ino-3-ino-6-and-inbo-3-clusters-in-a-glass-matrix/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4662-high-resolution-spectroscopy-of-metal-and-semiconductor-clusters/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4663-room-temperature-evolution-of-gold-nanodots-deposited-on-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4666-ni-induced-crystallization-of-poly-si-templates-and-subsequent-si-epitaxy/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4667-ni-induced-selective-nucleation-and-solid-phase-epitaxy-of-large-grained-poly/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4668-alagoz-arif-s-101/2021-05-01T00:20:25+00:00https://www.imm.cnr.it/pubblicazioni/4669-role-of-extended-vacancy-vacancy-interaction-on-the-ripening-of-voids-in-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4670-variational-study-of-the-discrete-holstein-model/2020-12-10T21:14:57+00:00https://www.imm.cnr.it/pubblicazioni/4671-mobile-intersite-bipolarons-in-the-discrete-holstein-hubbard-model/2020-12-10T21:14:58+00:00https://www.imm.cnr.it/pubblicazioni/4672-accelerated-monte-carlo-algorithms-for-defect-diffusion-and-clustering/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4673-atomic-transport-properties-and-electrical-activation-of-ultra-low-energy/2021-03-08T13:08:39+00:00https://www.imm.cnr.it/pubblicazioni/4674-a-lattice-kinetic-monte-carlo-code-for-the-description-of-vacancy-diffusion-and/2020-12-10T21:14:57+00:00https://www.imm.cnr.it/pubblicazioni/4675-modeling-vacancies-and-hydrogen-impurities-in-graphene-a-molecular-point-of-view/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4676-n-type-doping-of-ge-by-as-implantation-and-excimer-laser-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4677-b-doping-in-ge-by-excimer-laser-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4678-role-of-the-internal-strain-on-the-incomplete-sisio2-phase-separation-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4679-the-ground-state-of-an-electron-or-exciton-in-the-holstein-model/2020-12-10T21:14:57+00:00https://www.imm.cnr.it/pubblicazioni/4680-anomalous-impurity-segregation-and-local-bonding-fluctuation-in-l-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4681-efficiency-enhancement-in-znoal-based-dye-sensitized-solar-cells-structured/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4682-vacancy-generation-in-liquid-phase-epitaxy-of-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4683-role-of-light-scattering-in-excimer-laser-annealing-of-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4684-quasisoliton-states-in-a-two-dimensional-discrete-model/2020-12-10T21:14:57+00:00https://www.imm.cnr.it/pubblicazioni/4685-structural-characterization-of-ni2si-pseudoepitaxial-transrotational-structures/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4686-electrical-activation-of-ultralow-energy-as-implants-in-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4687-anomalous-transport-of-sb-in-laser-irradiated-ge/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4688-one-particle-interacting-with-the-acoustical-phonons-in-a-discrete-chain/2020-12-10T21:14:59+00:00https://www.imm.cnr.it/pubblicazioni/4689-damage-formation-and-evolution-in-ion-implanted-crystalline-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4690-extended-defects-formation-in-nanosecond-laser-annealed-ion-implanted-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4691-a-numerical-method-for-the-efficient-atomistic-simulation-of-the-plasma-etch-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4692-crystallization-of-implanted-amorphous-silicon-during-millisecond-annealing-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4693-a-mean-field-approach-to-many-particles-effects-in-dielectrophoresis/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4694-boron-electrical-activation-in-crystalline-si-after-millisecond-nonmelting/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4695-nucleation-and-growth-of-nisi-from-ni2si-transrotational-domains/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4696-nanoisland-shape-relaxation-mechanism/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4697-dopant-activation-and-damage-evolution-in-implanted-silicon-after-excimer-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4698-simultaneous-nickel-silicidation-and-silicon-crystallization-induced-by-excimer/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4699-particle-chain-formation-in-a-dc-dielectrophoretic-trap-a-reaction-diffusion/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4700-factors-affecting-profile-evolution-in-plasma-etching-of-sio2-modeling-and/2020-12-10T21:14:57+00:00https://www.imm.cnr.it/pubblicazioni/4701-kinetic-monte-carlo-simulations-of-boron-activation-in-implanted-si-under-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4702-role-of-oxygen-on-the-electrical-activation-of-b-in-ge-by-excimer-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4703-towards-a-laser-fluence-dependent-nanostructuring-of-thin-au-films-on-si-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4704-solid-phase-phosphorous-activation-in-implanted-silicon-by-excimer-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4705-laser-annealing-of-sige-and-ge-based-devices/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4706-computational-analysis-of-etched-profile-evolution-for-the-derivation-of-2d/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4707-atomic-scale-computer-aided-design-for-novel-semiconductor-devices/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4708-schottky-barrier-inhomogeneities-in-nickel-silicide-transrotational-contacts/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4709-defect-and-dopant-kinetics-in-laser-anneals-of-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4710-defect-evolution-and-dopant-activation-in-laser-annealed-si-and-ge/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4711-modeling-boron-profiles-in-silicon-after-pulsed-excimer-laser-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4712-a-multi-scale-atomistic-study-of-the-interstitials-agglomeration-in-crystalline/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/4713-surface-stress-and-impurity-effects-on-room-temperature-migration-of-ion-beam/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4714-combined-strategy-to-realize-efficient-photoelectrodes-for-low-temperature/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4715-role-of-the-early-stages-of-ni-si-interaction-on-the-structural-properties-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4716-activation-of-ion-implanted-si-for-backside-processing-by-ultra-fast-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4717-the-european-answer-to-the-integration-issues-of-excimer-laser-annealing-in-mos/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4718-atomistic-simulations-and-the-requirements-of-process-simulator-for-novel/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4719-modeling-of-laser-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4720-notching-effect-on-metal-etch-a-very-simple-predictive-model/2020-12-10T21:14:57+00:00https://www.imm.cnr.it/pubblicazioni/4721-topographic-and-structural-evolution-of-etched-si-samples/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4722-room-temperature-defect-diffusion-in-ion-implanted-c-si/2020-12-13T23:18:53+00:00https://www.imm.cnr.it/pubblicazioni/4723-impurity-and-defect-interactions-during-laser-thermal-annealing-in-ge/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4724-simulation-of-the-boron-buildup-formation-during-melting-laser-thermal-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4725-enthalpy-based-modeling-of-pulsed-excimer-laser-annealing-for-process-simulation/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4726-nickel-affected-silicon-crystallization-and-silicidation-on-polyimide-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4727-low-temperature-sputtered-tio-2-nano-sheaths-on-electrospun-pes-fibers-as-high/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4728-a-strategy-to-stabilise-the-local-structure-of-ti4-and-zn2-species-against/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4730-atomic-scale-monte-carlo-simulations-of-bf3-plasma-immersion-ion-implantation/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4731-dopant-dynamics-and-defects-evolution-in-implanted-silicon-under-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4732-numerical-study-of-particle-particle-interactions-in-lab-on-a-chip-devices/2021-01-11T15:00:29+00:00https://www.imm.cnr.it/pubblicazioni/4733-a-three-dimensional-phase-field-simulation-of-pulsed-laser-induced-epitaxial/2020-12-10T21:14:58+00:00https://www.imm.cnr.it/pubblicazioni/4734-quantitative-study-of-the-si-sio2-phase-separation-in-substoichiometric-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4735-point-defect-migration-in-crystalline-si-impurity-content-surface-and-stress/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/4736-on-the-dependence-of-the-critical-temperature-on-pressure-in-the-bisoliton/2020-12-10T21:14:59+00:00https://www.imm.cnr.it/pubblicazioni/4737-low-temperature-deactivation-of-ge-heavily-n-type-doped-by-ion-implantation-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4738-controlled-al3-incorporation-in-the-zno-lattice-at-188-c-by-soft-reactive-co/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4739-melt-depth-and-time-variations-during-pulsed-laser-thermal-annealing-with-one/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4740-defect-generation-and-evolution-in-laser-processing-of-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4741-highly-active-junctions-formed-in-crystalline-silicon-by-infrared-laser/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4742-temperature-dependent-reaction-of-thin-ni-silicide-transrotational-layers-on/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4743-role-of-the-sisio2-interface-during-dopant-diffusion-in-thin-silicon-on/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4744-interstitial-cluster-evolution-and-transient-phenomena-in-si-crystal/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/4745-the-role-of-cluster-size-and-topology-on-the-ripening-of-defect-aggregates-in/2020-12-10T21:14:58+00:00https://www.imm.cnr.it/pubblicazioni/4747-multi-objective-optimization-and-analysis-for-the-design-space-exploration-of/2017-05-15T11:12:50+00:00https://www.imm.cnr.it/pubblicazioni/4748-multi-scale-porosity-tio-2-scaffolds-grown-by-innovative-sputtering-methods-for/2021-09-27T16:32:22+00:00https://www.imm.cnr.it/pubblicazioni/4749-a-multi-objective-clonal-selection-algorithm-for-analog-circuit-and-solar-cell/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4750-extended-defects-in-ion-implanted-si-during-nanosecond-laser-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4751-role-of-the-early-stages-of-nisi-interaction-on-the-formation-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4752-invited-challenges-and-opportunities-for-doping-control-in-ge-for-micro-and/2017-06-12T10:56:30+00:00https://www.imm.cnr.it/pubblicazioni/4753-applied-physics-reviews/2018-03-31T22:36:20+00:00https://www.imm.cnr.it/pubblicazioni/4754-in-si-crystal/2020-05-06T22:40:15+00:00https://www.imm.cnr.it/pubblicazioni/4755-kinetic-monte-carlo-simulation-of-dopant-defect-systems-under-submicrosecond/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4756-challenges-and-opportunities-for-doping-control-in-ge-for-micro-and/2017-06-12T10:56:04+00:00https://www.imm.cnr.it/pubblicazioni/4757-damage-evolution-in-implanted-silicon-by-pulsed-excimer-laser-annealing/2017-06-12T10:56:34+00:00https://www.imm.cnr.it/pubblicazioni/4758-experimental-and-theoretical-analysis-of-dopant-activation-in-double-implanted/2019-07-17T18:00:41+00:00https://www.imm.cnr.it/pubblicazioni/4760-thermal-and-non-thermal-kinetics-of-defects-and-dopant-in-si/2019-07-11T20:00:26+00:00https://www.imm.cnr.it/pubblicazioni/4761-monte-carlo-analysis-of-the-evolution-from-point-to-extended-interstitial-type/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/4762-a-mixed-approach-to-the-study-of-the-magnetic-and-pairing-correlations-in-the/2020-12-10T21:14:58+00:00https://www.imm.cnr.it/pubblicazioni/4763-ultra-low-energy-boron-implants-in-crystalline-silicon-atomic-transport/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4764-exact-diagonalization-of-a-two-dimensional-double-band-hubbard-model-on-a/2020-12-10T21:14:58+00:00https://www.imm.cnr.it/pubblicazioni/4765-nuclear-inst-and-methods-in-physics-research-b/2018-03-31T22:36:21+00:00https://www.imm.cnr.it/pubblicazioni/4766-pccp/2018-04-01T22:20:47+00:00https://www.imm.cnr.it/pubblicazioni/4767-1007-fast-evaluation-of-time-domain-fields-in-sub-wavelength-source-observer/2017-05-15T11:12:49+00:00https://www.imm.cnr.it/pubblicazioni/4768-dielectric-properties-of-pr-2o-3-high-k-films-grown-by-metalorganic-chemical/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4769-core-shell-zn-doped-tio-2-zno-nanofibers-fabricated-via-a-combination-of/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4770-volatile-ceiii-hexafluoroacetylacetonate-glyme-adducts-as-promising-precursors/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/4771-praseodymium-silicate-as-a-highk-dielectric-candidate-an-insight-into-the/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4772-study-of-the-thermal-properties-of-priii-precursors-and-their-implementation-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4773-electro-structural-evolution-and-schottky-barrier-height-in-annealed-au-ni/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4774-morphological-and-structural-control-of-nanostructured-100-oriented-ceo-2-films/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/4775-a-volatile-pbii-diketonate-diglyme-complex-as-a-promising-precursor-for-mocvd/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4776-an-investigation-on-the-use-of-liquid-phase-photo-deposition-for-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4777-mocvd-of-cef-3-films-on-si-100-substrates-synthesis-characterization-and/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4778-mocvd-of-platinum-100-films-on-random-hastelloy-c276/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4779-structural-optical-study-of-high-dielectric-constant-oxide-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4780-nickel-nanostructured-materials-from-liquid-phase-photodeposition/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4781-neodymium-diketonate-glyme-complexes-synthesis-and-characterization-of-volatile/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4782-fragal-a-il-2003-electrochem/2019-06-10T22:47:11+00:00https://www.imm.cnr.it/pubblicazioni/4783-piezoelectric-domains-in-bifeo3-films-grown-via-mocvd-structure-property/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4784-magnesium-hydrotris1-pyrazolylborate-as-a-promising-single-source-mocvd/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4785-effects-of-the-thermal-annealing-processes-on-praseodymium-oxide-based-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4786-structural-and-morphological-characterisation-of-heteroepitaxial-ceo2-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4787-fabrication-of-laalo3-pt-100-hastelloy-c276-and-ceo2-100-pt-100-hastelloy-c276/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/4788-ti-al-w-ohmic-contacts-to-p-type-implanted-4h-sic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4789-mocvd-approach-to-perovskite-based-thin-films-from-high-tc-superconductors-to/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/4790-mocvd-growth-of-rare-earth-oxidesthe-case-of-the-praseodymium-oxygen-system/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4791-electrical-properties-of-mocvd-praseodymium-oxide-based-mos-structures/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4792-mocvd-growth-of-pr2o-high-gate-dielectric-for-silicon-synthesis-and-structural/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4793-morphology-controlled-synthesis-of-nio-films-the-role-of-the-precursor-and-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4794-nanoscale-probing-of-interfaces-in-gan-for-devices-applications/2018-03-31T22:36:21+00:00https://www.imm.cnr.it/pubblicazioni/4795-metal-organic-chemical-vapour-deposition-of-nd2-3-cu3ti4o12-films/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/4796-mocvd-of-complex-oxide-systems-from-precursor-chemistry-to-applications/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/4797-a-template-metal-organic-chemical-vapour-deposition-route-to-the-fabrication-of/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/4798-ceo2-films-by-metal-organic-chemical-vapor-deposition/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4799-properties-of-pr-based-high-k-dielectric-films-obtained-by-metal-organic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4800-dielectric-science-and-materials-fabrication-of-laalo3-pt-100-hastelloy-c276/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/4801-nanoscopic-investigation-of-advanced-dielectrics-for-innovative-electric-devices/2017-05-15T11:13:09+00:00https://www.imm.cnr.it/pubblicazioni/4802-a-novel-miniaturized-biofilter-based-on-silicon-micropillars-for-nucleic-acid/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/4804-sipm-as-miniaturised-optical-biosensor-for-dna-microarray-applications/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4805-photo-physical-characterization-of-fluorophore-ru-bpy-32-for-optical-biosensing/2021-01-11T15:00:31+00:00https://www.imm.cnr.it/pubblicazioni/4806-single-atom-detection-through-haadf-stem-and-eels-edx-characterization-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4808-structural-properties-of-pulsed-laser-deposited-snox-thin-films/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/4809-low-temperature-epitaxial-growth-of-sige-absorber-for-thin-film-heterojunction/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/4810-structural-properties-of-hydrogenated-microcrystalline-silicon-carbon-alloys/2018-04-01T22:20:47+00:00https://www.imm.cnr.it/pubblicazioni/4811-crystallization-of-deposited-amorphous-silicon-by-infrared-laser-irradiation/2020-06-11T22:44:56+00:00https://www.imm.cnr.it/pubblicazioni/4812-silicon-epitaxy-below-200-c-towards-thin-crystalline-solar-cells/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/4813-giant-photoluminescence-emission-in-crystalline-faceted-si-grains/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4814-in-situ-spectroscopic-ellipsometry-of-microcrystalline-silicon-deposited-by/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/4815-use-of-radio-frequency-power-silicon-tetrafluoride-and-methane-as-parameters-to/2018-04-01T22:20:47+00:00https://www.imm.cnr.it/pubblicazioni/4816-raman-and-photoluminescence-spectroscopy-of-si-nanocrystals-evidence-of-a-form/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4817-low-temperature-epitaxial-growth-of-si-and-sige-and-their-transfer-to-foreign/2018-04-01T22:20:49+00:00https://www.imm.cnr.it/pubblicazioni/4818-octahedral-faceted-si-nanoparticles-as-optical-traps-with-enormous-yield/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4819-structural-properties-of-relaxed-thin-film-germanium-layers-grown-by-low/2018-04-01T22:20:49+00:00https://www.imm.cnr.it/pubblicazioni/4820-pulsed-laser-deposited-sno-x-plasma-expansion-dynamics-effects/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/4821-anisotropic-extended-misfit-dislocations-in-overcritical-sige-films-by-local/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4822-strong-infrared-photoluminescence-in-highly-porous-layers-of-large-faceted-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4823-transient-crystal-grain-nucleation-in-as-doped-amorphous-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4824-tailored-voltage-deposition-of-c-si1-xcx-h-from-h2-diluted-sih4-and-ch4-gas/2018-04-01T22:20:49+00:00https://www.imm.cnr.it/pubblicazioni/4825-structural-and-electrical-characterization-of-microcrystalline-silicon-carbon/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/4826-caracterisations-structurales-et-electriques-de-c-si1-xcx-h-deposes-par-rf-pecvd/2018-04-01T22:20:47+00:00https://www.imm.cnr.it/pubblicazioni/4827-determination-of-gap-state-density-in-polycrystalline-silicon-by-fieldeffect/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4828-floating-body-effects-in-polysilicon-thin-film-transistors/2021-05-02T22:28:07+00:00https://www.imm.cnr.it/pubblicazioni/4829-dipole-induced-changes-of-the-band-discontinuities-at-the-si-o-2-si-interface/2021-05-02T22:28:09+00:00https://www.imm.cnr.it/pubblicazioni/4830-field-effect-analysis-for-the-determination-of-gap-state-density-and-fermi/2021-05-02T22:28:11+00:00https://www.imm.cnr.it/pubblicazioni/4831-model-for-the-abovethreshold-characteristics-and-threshold-voltage-in/2021-05-02T22:28:15+00:00https://www.imm.cnr.it/pubblicazioni/4832-hydrogen-sensitivity-of-pd-sio2-si-structure-a-correlation-with-the-hydrogen/2021-05-02T22:28:08+00:00https://www.imm.cnr.it/pubblicazioni/4833-conductivity-and-noise-in-thin-films-of-nonhydrogenated-amorphous-silicon-in/2021-05-02T22:28:08+00:00https://www.imm.cnr.it/pubblicazioni/4834-on-chip-fabrication-of-ultrasensitive-no2-sensors-based-on-silicon-nanowires/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4835-end-point-determination-by-reflected-power-monitoring/2021-05-02T22:28:16+00:00https://www.imm.cnr.it/pubblicazioni/4836-infrared-and-optical-study-of-a-sin-alloys/2021-05-02T22:28:10+00:00https://www.imm.cnr.it/pubblicazioni/4837-palladium-l3-absorption-edge-of-pdh0-6-films-evidence-for-hydrogen-induced/2021-05-02T22:28:13+00:00https://www.imm.cnr.it/pubblicazioni/4838-transport-properties-of-a-pd-insulator-a-si-h-schottky-diode-for-hydrogen/2021-05-02T22:28:10+00:00https://www.imm.cnr.it/pubblicazioni/4839-optical-constants-of-silicon-films-deposited-by-the-rf-glow-discharge-of-sicl4/2021-05-02T22:28:16+00:00https://www.imm.cnr.it/pubblicazioni/4840-photovoltaic-response-of-carbon-nanotube-silicon-heterojunctions-effect-of/2021-05-02T22:28:09+00:00https://www.imm.cnr.it/pubblicazioni/4841-evidence-of-two-phase-structure-in-amorphous-silicon-oxides-produced-by-n2o/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4842-high-substrate-temperature-420-c-excimer-laser-crystallization-of-hydrogenated/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4843-on-the-correlation-between-the-optical-gap-and-the-slope-of-the-power-law/2021-05-02T22:28:07+00:00https://www.imm.cnr.it/pubblicazioni/4844-hydrogenated-amorphous-silicon-based-light-addressable-potentiometric-sensor/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4845-ambient-sensors/2021-05-02T22:28:12+00:00https://www.imm.cnr.it/pubblicazioni/4846-a-stable-pd-bn-si3n4-sio2-si-fet-for-hydrogen-detection/2021-05-02T22:28:09+00:00https://www.imm.cnr.it/pubblicazioni/4847-capacitively-coupled-transistor-polysilicon-active-matrix-lcds/2021-05-02T22:28:05+00:00https://www.imm.cnr.it/pubblicazioni/4848-noise-measurements-in-thin-films-of-amorphous-silicon/2021-05-02T22:28:07+00:00https://www.imm.cnr.it/pubblicazioni/4849-photoemission-studies-of-a-sinx-h-a-si-h-heterojunctions/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4850-transient-current-response-in-pdsio2si-structures-during-hydrogen-absorption/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4851-correlation-studies-on-the-temperature-dependence-of-thermal-reactions-and/2017-05-15T11:13:11+00:00https://www.imm.cnr.it/pubblicazioni/4852-a-novel-quasistatic-c-t-measurement/2021-05-02T22:28:08+00:00https://www.imm.cnr.it/pubblicazioni/4853-a-si-h-produced-by-double-ion-beam-sputtering/2021-05-02T22:28:11+00:00https://www.imm.cnr.it/pubblicazioni/4854-photoluminescence-studies-on-a-si-h-cl-films/2021-05-02T22:28:10+00:00https://www.imm.cnr.it/pubblicazioni/4855-electrical-compensation-via-vacancy-donor-complexes-in-arsenic-implanted-and/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4856-pd-sio-2-gaas-mis-diode-for-hydrogen-detection/2021-05-02T22:28:07+00:00https://www.imm.cnr.it/pubblicazioni/4857-active-matrix-liquid-crystal-displays-tft-technology-characterization-modelling/2021-05-02T22:28:09+00:00https://www.imm.cnr.it/pubblicazioni/4858-durbin-sm-136/2021-05-03T12:00:20+00:00https://www.imm.cnr.it/pubblicazioni/4859-radiation-damage-formation-and-annealing-in-mg-ion-implanted-gan/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4860-interdisciplinary-physics-pacs-81-98-temperature-dependence-of-the-transfer/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4861-cross-disciplinary-physics-pacs-81-98-determination-of-hot-carrier-induced/2021-05-02T22:28:17+00:00https://www.imm.cnr.it/pubblicazioni/4863-chemically-sensitive-light-addressable-potentiometric-sensors-based-on/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4864-evidence-for-localized-p-like-states-at-the-conduction-band-edge-of-amorphous/2021-05-02T22:28:06+00:00https://www.imm.cnr.it/pubblicazioni/4865-correlation-studies-on-the-temperature-dependence-of-thermal-reactions-and/2017-05-15T11:13:19+00:00https://www.imm.cnr.it/pubblicazioni/4866-preparation-study-and-characterization-of-hydrogenated-amorphous-silicon-for/2021-05-02T22:28:07+00:00https://www.imm.cnr.it/pubblicazioni/4867-luminescence-studies-of-a-si-h-cl-films/2017-05-15T11:13:07+00:00https://www.imm.cnr.it/pubblicazioni/4868-hicks-rcj-165-holland-l-183-227/2021-05-02T22:28:05+00:00https://www.imm.cnr.it/pubblicazioni/4869-using-the-electromyogram-to-anticipate-torques-about-the-elbow-k-koirala-m/2023-01-11T11:59:18+00:00https://www.imm.cnr.it/pubblicazioni/4870-ionizing-radiation-effects-on-nrom-memory-cells/2023-07-18T13:00:12+00:00https://www.imm.cnr.it/pubblicazioni/4871-an-olfactory-bulb-model-mitigates-the-drift-in-chemical-sensors/2021-05-17T10:00:27+00:00https://www.imm.cnr.it/pubblicazioni/4872-jacob-kt-311-jon-mg-216/2017-05-15T11:12:53+00:00https://www.imm.cnr.it/pubblicazioni/4873-thickness-and-orientation-dependence-of-the-average-haadf-stem-normalized/2018-06-08T22:15:50+00:00https://www.imm.cnr.it/pubblicazioni/4874-macroscopic-simulation-of-quantum-mechanical-effects-in-two-dimensional-mos/2021-05-02T22:28:05+00:00https://www.imm.cnr.it/pubblicazioni/4875-ieee-rtp-2007-conference-tuesday-october-2-2007/2021-05-02T22:28:09+00:00https://www.imm.cnr.it/pubblicazioni/4876-carbon-nanotube-based-devices-for-solar-cell-applications/2021-05-02T22:28:07+00:00https://www.imm.cnr.it/pubblicazioni/4877-breakdown-in-the-output-characteristics-of-deep-submicron-a-si-h-tfts/2021-05-02T22:28:08+00:00https://www.imm.cnr.it/pubblicazioni/4878-other-classes/2021-05-02T22:28:10+00:00https://www.imm.cnr.it/pubblicazioni/4879-strain-relaxation-in-high-ge-content-sige-layers-deposited-on-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4880-the-role-of-the-surfaces-in-the-photon-absorption-in-ge-nanoclusters-embedded/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4881-microstructural-evolution-of-siox-films-and-its-effect-on-the-luminescence-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4882-first-and-second-order-raman-scattering-in-si-nanostructures-within-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4883-investigation-of-sio2-hfo2-gate-stacks-for-application-to-non-volatile-memory/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4885-matrix-role-in-ge-nanoclusters-embedded-in-si3n4-or-sio2/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4886-near-and-far-infrared-absorption-and-electronic-structure-of-ge-sige-multiple/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4887-quantitative-determination-of-the-clustered-silicon-concentration-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4888-crystallization-of-sputtered-deposited-and-ion-implanted-amorphous-ge2sb2te5/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4889-properties-of-mixed-phase-n-doped-silicon-oxide-layers-and-application-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4890-tio2-coated-nanostructures-for-dye-photo-degradation-in-water/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4891-room-temperature-efficient-light-detection-by-amorphous-ge-quantum-wells/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4892-observation-of-stimulated-raman-scattering-in-silicon-nanocomposites/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4894-light-harvesting-with-ge-quantum-dots-embedded-in-sio2-or-si3n4/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4895-effect-of-pt-nanoparticles-on-the-photocatalytic-activity-of-zno-nanofibers/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4898-fe-ion-implanted-tio2-thin-film-for-efficient-visible-light-photocatalysis/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4899-light-absorption-enhancement-in-closely-packed-ge-quantum-dots/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4900-homogeneity-of-ge-rich-nanostructures-as-characterized-by-chemical-etching-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4901-as-doping-of-si-based-low-dimensional-systems/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4904-narrow-intersubband-transitions-in-n-type-ge-sige-multi-quantum-wells-control/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4906-titanium-dioxide-grafted-on-graphene-oxide-hybrid-nanofiller-for-effective-and/2024-11-05T12:37:08+00:00https://www.imm.cnr.it/pubblicazioni/4907-the-role-of-the-interface-in-germanium-quantum-dots-when-not-only-size-matters/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4908-monitoring-the-kinetic-evolution-of-self-assembled-sige-islands-grown-by-ge/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4909-stem-and-eels-study-of-the-graphene-bi2se3-interface/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4910-strain-induced-generation-of-silicon-nanopillars/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4911-quantitative-electron-energy-loss-spectroscopy-of-si-nanoclusters-embedded-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4913-composite-gel-polymer-electrolytes-based-on-organo-modified-nanoclays/2024-11-05T12:37:06+00:00https://www.imm.cnr.it/pubblicazioni/4914-structural-properties-of-annealed-siox/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4915-the-influence-of-hydrogen-and-nitrogen-on-the-formation-of-si-nanoclusters/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4916-avoiding-charge-induced-drift-in-vitrified-biological-specimens-through/2020-12-14T23:08:51+00:00https://www.imm.cnr.it/pubblicazioni/4918-programmable-extreme-chirality-in-the-visible-by-helix-shaped-metamaterial/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4919-atomic-layer-deposition-of-zno-tio-2-multilayers-towards-the-understanding-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4920-tuning-the-thermoelectric-properties-of-a-site-deficient-srtio-3-ceramics-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4921-a-new-route-for-fabrication-of-silicon-qds-in-a-dielectric-matrix-of-silica-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4922-atomic-structure-of-metal-free-and-catalyzed-si-nanowires/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4925-site-selective-surface-enhanced-raman-detection-of-proteins/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4926-noncovalent-functionalization-of-few-layer-black-phosphorus-with-metal/2018-03-30T16:21:12+00:00https://www.imm.cnr.it/pubblicazioni/4927-ge-quantum-dots-embedded-in-sio2-or-sinx-synthesis-and-light-absorption/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4928-analyses-of-the-as-doping-of-sio2-si-sio2-nanostructures/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4929-n-type-sige-heterostructures-for-thz-intersubband-transitions/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4931-evolution-of-the-transrotational-structure-during-crystallization-of-amorphous/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4932-strauctural-properties-of-si-nanocrystals-implications-for-light-emitting/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4933-phase-separation-study-of-annealed-siox-films-through-energy-filtered-scanning/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4934-analysis-and-structural-characterization-of-the-system-si-nanoclusters-siox/2020-12-14T23:08:54+00:00https://www.imm.cnr.it/pubblicazioni/4935-applications-of-atomic-scale-scanning-transmission-electron-microscopy/2020-12-14T23:08:52+00:00https://www.imm.cnr.it/pubblicazioni/4936-fabrication-of-miniaturised-si-based-electrocatalytic-membranes/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4938-nucleation-and-grain-growth-in-as-deposited-and-ion-implanted-gete-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4939-characterization-and-pattering-of-bacteriorhodopsin-films-on-si-based-materials/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4940-ag-assisted-chemical-etching-of-100-and-111-n-type-silicon-substrates-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4941-full-characterization-of-the-loading-of-a-magneto-optical-trap-from-an-alkali/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4944-development-of-a-planar-dmfc-operating-at-room-temperature/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4945-fabrication-of-miniaturized-si-based-electrocatalytic-membranes/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4946-high-resolution-measurements-of-two-dimensional-dopant-diffusion-in-silicon/2020-05-06T22:40:14+00:00https://www.imm.cnr.it/pubblicazioni/4947-advanced-micromachining-processes-for-micro-opto-electromechanical-components/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4948-micro-silicon-fuel-cell-method-of-fabrication-and-self-powered-semiconductor/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4949-radiation-pressure-excitation-and-cooling-of-a-cryogenic-micro-mechanical/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4950-process-for-fabricating-a-semiconductor-device-having-a-suspended-micro-system/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4951-method-for-manufacturing-a-soi-wafer/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4952-investigation-of-ag-assisted-chemical-etching-on-100-and-111-contiguous-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4953-growth-of-wide-bandgap-materials/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4954-porous-si-based-bioreactors-for-glucose-monitoring/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4956-towards-fabrication-of-ordered-gallium-nanostructures-by-laser-manipulation-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4957-electrochemical-etching-of-silicon-a-powerful-tool-for-delineating-junction/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4958-crystallization-of-nanometer-ge2sb2te5-amorphous-regions-embedded-in-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4960-maskless-implants-of-20-kev-ga-in-thin-crystalline-silicon-on-insulator/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4961-crystallization-of-ion-amorphized-ge2sb2te5-in-nano-structured-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4962-magnetic-microtraps-for-quantum-control/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4963-characterization-of-embedded-rhomboidal-microchannels-formation-on-silicon-100/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4964-competitive-delineation-of-n-and-p-doped-si-by-selective-electrochemical-etch/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4965-coalescence-of-silver-clusters-by-immersion-in-diluted-hf-solution/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4968-a-new-position-sensitive-anode-for-plasmas-diagnostic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4969-manipulation-of-amorphous-ge2sb2te5-nano-structures-in-isolated-and-crystalline/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4971-sistema-a-microcelle-a-combustibile-e-relativo-metodo-di-fabbricazione/2024-02-22T12:09:03+00:00https://www.imm.cnr.it/pubblicazioni/4972-physics-research-a/2017-05-15T11:12:56+00:00https://www.imm.cnr.it/pubblicazioni/4973-ion-irradiation-on-phase-change-materials/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4974-semiconductor-device-having-a-suspended-micro-system/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4975-micro-fuel-cell-system-and-corresponding-manufacturing-method/2017-05-15T11:12:55+00:00https://www.imm.cnr.it/pubblicazioni/4976-radiation-pressure-excitation-and-cooling-of-a-cryogenic-mems-cavity/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4977-planar-structure-dmfcs/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4978-interferometric-quantum-sensors/2018-03-30T16:21:11+00:00https://www.imm.cnr.it/pubblicazioni/4979-interferometric-quantum-sensors/2020-12-11T23:31:48+00:00https://www.imm.cnr.it/pubblicazioni/4980-novel-electrochemical-patterning-method-of-silicon-carbide/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4981-bipolar-miniaturised-proton-exchange-fuel-cell-fabricated-in-a-polymeric/2020-05-06T22:40:19+00:00https://www.imm.cnr.it/pubblicazioni/4982-bipolar-miniaturized-proton-exchange-fuel-cell-full-integrated-in-a/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4983-thermal-stability-of-1x-1020-cm-3-al-implanted-4h-sic-after-electrical/2020-09-24T08:00:23+00:00https://www.imm.cnr.it/pubblicazioni/4984-micro-dmfc-for-portable-applications-realised-with-mems-technologies/2023-07-18T13:00:18+00:00https://www.imm.cnr.it/pubblicazioni/4985-miniaturized-proton-exchange-fuel-cell-in-micromachined-silicon-surface/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4986-characterization-of-silicon-carbide-electrochemical-etch-in-hydrofluoric-acid/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/4987-papers-from-the-fifth-international-workshop-on-the-measurement/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/4988-investigation-of-the-structural-order-in-amorphous-gete-based-alloys/2021-03-08T13:08:46+00:00https://www.imm.cnr.it/pubblicazioni/4989-correlation-between-microstructure-and-temperature-dependent-electrical/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4990-ohmic-contacts-to-gallium-nitride-materials/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4991-a-thermal-neutron-mini-detector-with-sipm-and-scintillating-fibers/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/4992-effects-of-annealing-treatments-on-the-properties-of-al-ti-p-gan-interfaces-for/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4993-development-of-a-thermal-neutron-detector-based-on-scintillating-fibers-and/2020-12-14T23:08:53+00:00https://www.imm.cnr.it/pubblicazioni/4994-silicon-photomultipliers-for-radioactive-waste-online-monitoring/2021-01-11T15:00:30+00:00https://www.imm.cnr.it/pubblicazioni/4995-an-online-monitoring-system-for-nuclear-waste-storage/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/4996-algan-gan-heterostructures-for-enhancement-mode-transistors/2017-05-15T11:13:05+00:00https://www.imm.cnr.it/pubblicazioni/4997-microstructure-and-temperature-dependent-electrical-characteristics-of-ohmic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/4998-evolution-of-structural-and-electrical-properties-of-au-ni-contacts-onto-p-gan/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/4999-temperature-dependence-of-the-specific-resistance-in-tialniau-contacts-on-n/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5000-relaxation-and-crystallization-of-amorphous-silicon-carbide-probed-by-optical/2023-07-19T08:26:36+00:00https://www.imm.cnr.it/pubblicazioni/5001-solid-phase-epitaxial-regrowth-of-ion-beam-amorphized-quartz/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5002-ripple-topography-of-ion-beam-eroded-graphite-a-key-to-ion-beam-induced-damage/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5003-crystallisation-mechanism-of-amorphous-silicon-carbide/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5004-crystallization-process-of-amorphous-silicon-carbon-alloys/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5005-epitaxial-crystallization-of-kev-ion-bombarded-quartz/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5006-oxygen-activated-epitaxial-recrystallization-of-li-implanted-sio-2/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5007-oxygen-migration-during-epitaxial-regrowth-in-irradiated-quartz-investigated-by/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5008-ion-beam-erosion-of-graphite-surfaces-studied-by-stm-ripples-self-affine/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5009-epitaxial-crystallization-of-amorphous-films-deposited-on-single-crystalline/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5010-defects-and-electrical-behavior-in-1mev-si-ion-irradiated-4h-sic-schottky-diodes/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5011-network-modification-and-epitaxial-recrystallisation-of-ion-implanted-quartz/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/5012-angular-distortion-of-si-clusters-in-a-sic/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5013-interaction-between-dislocations-and-he-implantation-induced-voids-in-gan/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5014-addendum-solid-phase-epitaxial-regrowth-in-ion-beam-amorphized-quartz-appl-phys/2020-12-12T23:27:53+00:00https://www.imm.cnr.it/pubblicazioni/5015-epitaxial-recrystallization-of-alkali-ion-implanted-quartz/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5016-ion-beam-doping-and-epitaxial-regrowth-of-quartz/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5017-diffusion-of-hydrogen-implanted-in-quartz-during-air-annealing/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5018-comparison-of-si-sapphire-sic-and-gan-substrates-for-hemt-epitaxy/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5020-annealing-temperature-dependence-of-the-electrically-active-profiles-and/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5021-correlation-between-leakage-current-and-ion-irradiation-induced-defects-in-4h/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5022-chapter-4-sic-characterization-4-2-optical-and-electrical-effects-of-epitaxial/2024-11-05T10:10:14+00:00https://www.imm.cnr.it/pubblicazioni/5023-chapter-6-sic-devices-6-2-unipolar-diodes-temperature-stability-of-breakdown/2018-03-30T16:21:11+00:00https://www.imm.cnr.it/pubblicazioni/5024-chapter-4-sic-characterization-4-3-defects-defect-evolution-in-ion-irradiated/2018-03-30T16:21:12+00:00https://www.imm.cnr.it/pubblicazioni/5025-chapter-2-sic-epitaxy-2-1-homoepitaxial-growth-new-achievements-on-cvd-based/2018-03-30T16:21:12+00:00https://www.imm.cnr.it/pubblicazioni/5026-chapter-8-device-processing-8-2-contacts-effects-of-thermal-treatments-on-the/2024-11-05T10:10:42+00:00https://www.imm.cnr.it/pubblicazioni/5027-chapter-8-device-processing-8-2-contacts-study-of-tiw-au-thin-films/2024-11-05T10:10:01+00:00https://www.imm.cnr.it/pubblicazioni/5028-procedimento-di-formazione-di-contatti-ohmici-su-carburo-di-silicio-con/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5029-articles-structure-structural-phase-transitions-mechanical-properties-defects/2017-05-15T11:13:21+00:00https://www.imm.cnr.it/pubblicazioni/5030-structural-mechanical-thermodynamic-and-optical-properties-of-condensed-matter/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5031-solid-phase-epitaxial-regrowth-of-ion-beam-amorphized-a-quartz-alpha-quartz/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/5032-structural-mechanical-thermodynamic-and-optical-properties-of-condensed-matter/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/5033-addendumsolid-phase-epitaxial-regrowth-in-ion-beam-amorphized-quartz-appl-phys/2019-02-16T23:12:12+00:00https://www.imm.cnr.it/pubblicazioni/5034-optical-transient-in-ion-irradiated-silicon-carbide/2021-03-08T13:08:37+00:00https://www.imm.cnr.it/pubblicazioni/5035-role-of-the-strain-in-the-epitaxial-regrowth-rate-of-heavily-doped-amorphous-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5036-anomalous-and-normal-hall-effect-in-hydrogenated-amorphous-si-prepared-by/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/5037-interface-roughening-and-defect-nucleation-during-solid-phase-epitaxy-regrowth/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5038-role-of-c-in-the-formation-and-kinetics-of-nanovoids-induced-by-he-implantation/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5039-amorphous-crystalline-interface-evolution-during-solid-phase-epitaxy-regrowth/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5040-strain-effects-in-si-and-sige-during-solid-phase-epitaxy-and-defect-formation/2018-03-31T22:36:19+00:00https://www.imm.cnr.it/pubblicazioni/5041-graphene-heterostructures-with-wide-bandgap-semiconductors/2018-03-31T22:36:21+00:00https://www.imm.cnr.it/pubblicazioni/5042-elusive-presence-of-chloride-in-mixed-halide-perovskite-solar-cells/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5043-pseudoepitaxial-transrotational-structures-in-14-nm-thick-nisi-layers-on-001/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5044-critical-nickel-thickness-to-form-silicide-transrotational-structures-on-001/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5045-dye-sensitizing-of-self-nanostructured-tizno2-azo-transparent-electrodes-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5046-low-temperature-formation-and-evolution-of-a-10-nm-amorphous-ni-si-layer-on-001/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5047-role-of-the-ge-surface-during-the-end-of-range-dissolution/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5048-anatase-rutile-nucleation-and-growth-on-0002-and-11-20-oriented-znoal-glass/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5049-fiber-texturing-in-nano-crystalline-tio2-thin-films-deposited-at-150-c-by-dc/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5050-thermally-induced-structural-modifications-of-nano-sized-anatase-films-and-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5052-structural-and-electrical-characterization-of-silicided-ni-au-contacts-formed/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5053-thin-nickel-silicide-layer-formation-on-silicon-on-insulator-material/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5054-thermal-stability-of-nickel-silicide-on-silicon-on-insulator-soi-material/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5055-silicided-au-ni-bilayer-on-p-type-0-0-1-silicon-for-low-contact-resistance/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5056-ab-initio-investigations-of-textured-ni2si-films-on-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5057-the-effect-of-the-reaction-temperature-on-the-thermal-stability-of/2021-09-27T16:32:39+00:00https://www.imm.cnr.it/pubblicazioni/5058-integrated-circuits-with-backside-metalization-and-production-method-thereof/2017-05-15T11:12:39+00:00https://www.imm.cnr.it/pubblicazioni/5059-diffusion-phenomena-in-a-pt-iro2-ir-tin-w-multilayer-structure-during-annealing/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5061-metal-polymer-nanocomposites-co-evaporation-cosputtering-approaches-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5062-structural-characterization-of-insitu-silicided-contacts-textured-on-ptype-001/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5063-integrated-circuits-with-backside-metalization-and-production-method-thereof/2017-05-15T11:12:48+00:00https://www.imm.cnr.it/pubblicazioni/5065-elsevier-materials-science-and-engineering-b-114-115-2004-228-231/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/5066-agglomeration-of-cobalt-disilicide-on-silicon/2021-09-27T16:32:44+00:00https://www.imm.cnr.it/pubblicazioni/5067-structural-mechanical-thermodynamic-and-optical-properties-of-condensed-matter/2024-11-05T10:10:42+00:00https://www.imm.cnr.it/pubblicazioni/5068-a-comparison-among-low-temperature-piezoelectric-flexible-sensors-based-on/2018-04-01T22:20:47+00:00https://www.imm.cnr.it/pubblicazioni/5069-the-erbiumimpurity-interaction-and-its-effects-on-the-1-54-m-luminescence-of/2021-03-08T13:08:40+00:00https://www.imm.cnr.it/pubblicazioni/5070-evolution-from-point-to-extended-defects-in-ion-implanted-silicon/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5071-the-effects-of-oxygen-and-defects-on-the-deeplevel-properties-of-er-in/2021-03-08T13:08:47+00:00https://www.imm.cnr.it/pubblicazioni/5072-transition-from-small-interstitial-clusters-to-extended-311-defects-in-ion/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5073-electrical-signatures-and-thermal-stability-of-interstitial-clusters-in-ion/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5074-lifetime-control-in-silicon-devices-by-voids-induced-by-he-ion-implantation/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5075-formation-evolution-and-annihilation-of-interstitial-clusters-in-ion-implanted/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5076-depth-profiles-of-vacancy-and-interstitial-type-defects-in-mev-implanted-si/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/5077-evolution-of-interstitial-and-vacancy-type-defects-upon-thermal-annealing-in/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5078-materials-issues-and-device-performances-for-light-emitting-er-implanted-si/2021-03-08T13:08:37+00:00https://www.imm.cnr.it/pubblicazioni/5079-design-and-performance-of-an-erbium-doped-silicon-waveguide-detector-operating/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5080-room-temperature-diffusivity-of-self-interstitials-and-vacancies-in-ion/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5081-on-the-relationship-between-jetted-inks-and-printed-biopatterns-molecular-thin/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5082-formation-evolution-and-annihilation-of-interstitial-clusters-in-ion-implanted/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5083-immobilization-of-the-enzyme-glucose-oxidase-on-both-bulk-and-porous-sio2/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5084-the-effect-of-impurity-content-on-point-defect-evolution-in-ion-implanted-and/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5085-experimental-characterization-of-proteins-immobilized-on-si-based-materials/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5086-feasibility-analysis-of-laser-action-in-erbium-doped-silicon-waveguides/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5087-design-and-fabrication-of-integrated-si-based-optoelectronic-devices/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5088-biosensor-integration-on-si-based-devices-feasibility-studies-and-examples/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5089-semiconductor-device-for-electro-optic-applications-method-for-manufacturing/2020-12-13T23:18:53+00:00https://www.imm.cnr.it/pubblicazioni/5090-cluster-formation-and-growth-in-si-ion-implanted-c-si/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5091-defect-evolution-in-ion-implanted-crystalline-si-probed-by-in-situ-conductivity/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5092-optical-and-structural-characterization-of-bacterio-rhodopsin-films-on-si-based/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5093-interaction-and-migration-properties-of-ion-beam-induced-point-defects-in/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5094-high-gain-photodetector-with-separated-pn-junction-and-rare-earth-doped-region/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/5095-room-temperature-migration-of-ion-beam-injected-point-defects-in-crystalline/2020-12-13T23:18:54+00:00https://www.imm.cnr.it/pubblicazioni/5096-characterization-of-interstitial-defect-clusters-in-ion-implanted-si/2020-12-13T23:18:53+00:00https://www.imm.cnr.it/pubblicazioni/5097-ion-implantation-doping-of-si-for-optoelectronic-applications/2021-03-08T13:08:38+00:00https://www.imm.cnr.it/pubblicazioni/5098-room-temperature-point-defect-migration-in-crystalline-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5099-defect-evolution-in-ion-implanted-si-from-point-to-extended-defects/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5100-the-effect-of-impurity-content-and-ion-mass-on-the-depth-profiles-of-vacancy/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5101-formation-evolution-and-thermal-stability-of-interstitial-clusters-in-ion/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5102-impurity-and-clustering-effects-on-defect-evolution-in-ion-implanted-si/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5103-the-effect-of-the-extra-ion-on-residual-damage-in-mev-implanted-si/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5104-ion-beam-injected-point-defects-in-crystalline-silicon-migration-interaction/2020-12-13T23:18:50+00:00https://www.imm.cnr.it/pubblicazioni/5105-new-method-for-the-detection-of-enzyme-immobilized-on-si-based-glucose/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5106-silicon-resonant-cavity-enhanced-photodetector-at-1-55-m/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5107-diamond-based-vacuum-uv-photodetectors-for-space-applications/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5108-cmos-based-vuv-detectors-for-the-solar-orbiter/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5109-the-electrical-properties-of-terbium-ions-in-crystalline-si/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5110-defect-evolution-in-ion-implanted-silicon/2023-07-18T13:00:11+00:00https://www.imm.cnr.it/pubblicazioni/5111-point-defects-migration-and-agglomeration-in-si-at-room-temperature-the-role-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5112-design-of-a-rce-photodetectors-based-on-the-internal-photoemission-effect/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5113-si-based-resonant-cavity-enhanced-photodetectors-at-1-55m/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5114-realization-and-characterization-of-a-silicon-optical-modulator-based-on-a/2023-07-18T13:00:12+00:00https://www.imm.cnr.it/pubblicazioni/5115-migration-and-interaction-properties-of-ion-beam-generated-point-defects-in-c-si/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5116-the-effects-of-impurity-codoping-on-the-electrical-properties-of-erbium-ions-in/2020-05-06T22:40:19+00:00https://www.imm.cnr.it/pubblicazioni/5117-point-defects-migration-and-agglomeration-in-si-at-room/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5118-the-effect-of-impurity-content-and-ion-mass-on-the-depth/2020-12-13T23:18:51+00:00https://www.imm.cnr.it/pubblicazioni/5119-15001-au9716561-material-issues-and-device-performances-for-si-based/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/5120-10-001-au9716436/2018-06-30T22:14:02+00:00https://www.imm.cnr.it/pubblicazioni/5121-material-issues-and-device-performances-for-si-based-optoelectronics/2020-12-13T23:18:54+00:00https://www.imm.cnr.it/pubblicazioni/5122-point-defect-dynamics-in-ion-irradiated-crystalline-si/2020-12-13T23:18:52+00:00https://www.imm.cnr.it/pubblicazioni/5123-formation-and-evolution-of-luminescent-si-nanoclusters-produced-by-thermal/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5124-sensitizing-properties-of-amorphous-si-clusters-on-the-1-54-m-luminescence-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5125-si-based-materials-and-devices-for-light-emission-in-silicon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5126-efficient-luminescence-and-energy-transfer-in-erbium-silicate-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5127-origin-and-perspectives-of-the-1-54-m-luminescence-from-ion-beam-synthesized/2023-07-19T08:26:28+00:00https://www.imm.cnr.it/pubblicazioni/5128-optical-and-structural-properties-of-er2o3-films-grown-by-magnetron-sputtering/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5129-electroluminescence-and-transport-properties-in-amorphous-silicon-nanostructures/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5130-free-standing-copperii-oxide-nanotube-arrays-through-an-mocvd-template-process/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5131-formation-evolution-and-photoluminescence-properties-of-si-nanoclusters/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5132-novel-approach-to-the-fabrication-of-au-silica-core-shell-nanostructures-based/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5133-the-early-oxynitridation-stages-of-hydrogen-terminated-100-silicon-after/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5134-supported-silver-catalysts-prepared-by-deposition-in-aqueous-solution-of-ag/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5135-formation-of-nanoparticles-from-laser-irradiated-au-thin-film-on-sio2-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5136-heteroepitaxial-growth-and-faceting-of-ge-nanowires-on-si111-by-electron-beam/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5137-he-induced-nanovoids-for-point-defect-engineering-in-b-implanted-crystalline-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5138-pulsed-laser-deposition-of-multiwalled-carbon-nanotubes-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5139-amorphous-crystal-phase-transitions-in-gexte1-x-alloys/2021-03-08T13:08:36+00:00https://www.imm.cnr.it/pubblicazioni/5140-local-order-and-crystallization-of-laser-quenched-and-ion-implanted-amorphous/2021-05-26T02:17:15+00:00https://www.imm.cnr.it/pubblicazioni/5141-the-influence-of-substrate-on-the-properties-of-er-2-o-3-films-grown-by/2018-01-10T23:14:24+00:00https://www.imm.cnr.it/pubblicazioni/5142-dielectric-properties-of-pr2o3-high-k-films-grown-by-metalorganic-chemical/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5143-role-of-the-support-and-the-ru-precursor-on-the-performance-of-ru-carbon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5144-surface-effects-on-the-growth-of-solution-processed-pentacene-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5145-crystallization-of-ion-amorphized-ge2sb2te5-thin-films-in-presence-of-cubic-or/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5146-thermal-evolution-and-photoluminescence-properties-of-nanometric-si-layers/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5147-nanoporous-ge-electrode-as-a-template-for-nano-sized-5-nm-au-aggregates/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5148-shallow-bf2-implants-in-xe-bombardment-preamorphized-si-the-interaction-between/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5149-the-early-oxynitridation-stages-of-hydrogen-terminated-100-silicon-after/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5150-preparation-of-ceria-and-titania-supported-pt-catalysts-through-liquid-phase/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5151-the-dependence-of-the-radiation-damage-formation-on-the-substrate-implant/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5152-dopant-behaviour-and-damage-annealing-in-silicon-implanted-with-1-kev-arsenic/2021-03-08T13:08:36+00:00https://www.imm.cnr.it/pubblicazioni/5153-synthesis-and-luminescence-properties-of-erbium-silicate-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5154-light-scattering-calculations-from-au-and-au-sio2-core-shell-nanoparticles/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5155-tio2-nanofibrous-chemoresistors-coated-with-pedot-and-pani-blends-for-high/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5156-the-zero-field-self-organization-of-cobalt-surfactant-nanocomposite-thin-films/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5157-nanoporous-ge-coated-by-au-nanoparticles-for-electrochemical-application/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5158-tuning-the-electron-transport-mechanism-in-metal-nanoparticles-arrays-by-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5159-a-template-metal-organic-chemical-vapour-deposition-route-to-the-fabrication-of/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/5160-influence-of-preamorphization-on-the-structural-properties-of-ultrashallow/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5161-nanoscale-surface-modification-of-mt-etna-volcanic-ashes/2021-01-11T15:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5162-boron-interaction-with-extended-defects-induced-by-he-h-co-implantation-in-si/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5163-crystallization-of-primed-amorphous-ge2sb2te5-studied-by-transmission-electron/2021-07-20T08:00:11+00:00https://www.imm.cnr.it/pubblicazioni/5164-impact-of-hydrogen-implantation-on-helium-implantation-induced-defects/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/5165-structural-properties-of-si-nanoclusters-produced-by-thermal-annealing-of-siox/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5166-supported-silver-nanoparticles-with-high-catalytic-activity-prepared-through-a/2020-12-11T23:31:47+00:00https://www.imm.cnr.it/pubblicazioni/5167-void-formation-in-differently-oriented-si-in-the-early-stage-of-sic-growth/2019-12-21T23:56:54+00:00https://www.imm.cnr.it/pubblicazioni/5168-solution-processed-pentacene-thin-films-new-routes-for-building-up-plastic/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/5170-pentacene-thin-films-by-solution-methods-new-routes-for-plastic-electronics/2021-01-11T15:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5171-light-emission-from-si-nanostructures/2021-07-20T08:00:10+00:00https://www.imm.cnr.it/pubblicazioni/5172-surface-chemistry-effects-on-the-early-growth-stages-of-pentacene-films-from-a/2023-07-18T13:00:48+00:00https://www.imm.cnr.it/pubblicazioni/5173-chapter-2-sic-epitaxy-2-2-heteroepitaxial-growth-carbonization-study-of/2018-03-30T16:21:12+00:00https://www.imm.cnr.it/pubblicazioni/5174-structural-characterization-of-silicon-nanostructures-by-energy-filtered/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5175-epitaxial-si1-xgex-films-and-superlattice-structures-grown-by-cvd-for-infrared/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/5176-structural-properties-of-silicon-nanostructures-determined-by-energy-filtered/2021-03-08T13:08:51+00:00https://www.imm.cnr.it/pubblicazioni/5177-phase-transitions-in-ge1-xtex-alloys/2021-03-08T13:08:39+00:00https://www.imm.cnr.it/pubblicazioni/5178-akcoltekin-ender-67-akcoltekin-sevilay-67-alkemade-paul-fa-33-allain-jean-paul/2020-12-11T23:31:46+00:00https://www.imm.cnr.it/pubblicazioni/5179-correlation-of-the-highest-energy-cosmic-rays-with-nearby-extragalactic-objects/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5180-observation-of-the-suppression-of-the-flux-of-cosmic-rays-above/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5182-measurement-of-the-depth-of-maximum-of-extensive-air-showers-above/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5183-measurement-of-the-energy-spectrum-of-cosmic-rays-above-1018-ev-using-the/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/5184-update-on-the-correlation-of-the-highest-energy-cosmic-rays-with-nearby/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5185-correlation-of-the-highest-energy-cosmic-rays-with-the-positions-of-nearby/2018-04-01T22:20:48+00:00https://www.imm.cnr.it/pubblicazioni/5186-the-fluorescence-detector-of-the-pierre-auger-observatory/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5187-measurement-of-the-proton-air-cross-section-at-with-the-pierre-auger-observatory/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5188-upper-limit-on-the-cosmic-ray-photon-fraction-at-eev-energies-from-the-pierre/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5189-an-upper-limit-to-the-photon-fraction-in-cosmic-rays-above-1019-ev-from-the/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5190-limit-on-the-diffuse-flux-of-ultrahigh-energy-tau-neutrinos-with-the-surface/2020-12-12T23:27:53+00:00https://www.imm.cnr.it/pubblicazioni/5191-upper-limit-on-the-diffuse-flux-of-ultrahigh-energy-tau-neutrinos-from-the/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5192-trigger-and-aperture-of-the-surface-detector-array-of-the-pierre-auger/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/5193-an-evaluation-of-the-exposure-in-nadir-observation-of-the-jem-euso-mission/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5194-search-for-first-harmonic-modulation-in-the-right-ascension-distribution-of/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5195-anisotropy-studies-around-the-galactic-centre-at-eev-energies-with-the-auger/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5196-the-exposure-of-the-hybrid-detector-of-the-pierre-auger-observatory/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5197-search-for-ultrahigh-energy-neutrinos-in-highly-inclined-events-at-the-pierre/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5198-probing-the-radio-emission-from-air-showers-with-polarization-measurements/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5199-antennas-for-the-detection-of-radio-emission-pulses-from-cosmic-ray-induced-air/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5200-constraints-on-the-origin-of-cosmic-rays-above-1018-ev-from-large-scale/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5201-search-for-point-like-sources-of-ultra-high-energy-neutrinos-at-the-pierre/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5202-advanced-functionality-for-radio-analysis-in-the-offline-software-framework-of/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5203-large-scale-distribution-of-arrival-directions-of-cosmic-rays-detected-above/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5204-description-of-atmospheric-conditions-at-the-pierre-auger-observatory-using-the/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5205-bounds-on-the-density-of-sources-of-ultra-high-energy-cosmic-rays-from-the/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5206-a-search-for-point-sources-of-eev-neutrons/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5207-atmospheric-effects-on-extensive-air-showers-observed-with-the-surface-detector/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5208-measurement-of-the-cosmic-ray-energy-spectrum-using-hybrid-events-of-the-pierre/2021-01-11T15:00:30+00:00https://www.imm.cnr.it/pubblicazioni/5210-highlights-from-the-pierre-auger-observatory/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5211-ultrahigh-energy-neutrinos-at-the-pierre-auger-observatory/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5212-results-of-a-self-triggered-prototype-system-for-radio-detection-of-extensive/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5213-search-for-signatures-of-magnetically-induced-alignment-in-the-arrival/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5214-the-lateral-trigger-probability-function-for-the-ultra-high-energy-cosmic-ray/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5215-a-search-for-anisotropy-in-the-arrival-directions-of-ultra-high-energy-cosmic/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/5216-pierre-auger-observatory-and-telescope-array-joint-contributions-to-the-33rd/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/5217-tailoring-electromagnetic-hot-spots-toward-visible-frequencies-in-ultra-narrow/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5218-the-absolute-relative-and-multi-wavelength-calibration-of-the-pierre-auger/2021-01-11T15:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5219-identifying-clouds-over-the-pierre-auger-observatory-using-infrared-satellite/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5220-multiscale-autocorrelation-function-a-new-approach-to-anisotropy-studies/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5221-operations-of-and-future-plans-for-the-pierre-auger-observatory/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5222-the-pierre-auger-observatory-iv-operation-and-monitoring/2020-12-12T23:27:51+00:00https://www.imm.cnr.it/pubblicazioni/5223-origin-of-atmospheric-aerosols-at-the-pierre-auger-observatory-using-studies-of/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5224-the-jem-euso-mission-status-and-prospects-in-2011/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5225-erratun-search-for-ultrahigh-energy-neutrinos-in-highly-inclined-events-at-the/2020-12-12T23:27:47+00:00https://www.imm.cnr.it/pubblicazioni/5227-nuclear-instruments-methods-in-physics-research-section-a-accelerators/2017-05-15T11:13:15+00:00https://www.imm.cnr.it/pubblicazioni/5228-calibration-and-monitoring-of-the-pierre-auger-observatory/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5229-publishers-note-search-for-ultrahigh-energy-neutrinos-in-highly-inclined-events/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5232-a-multiscale-autocorrelation-function-for-anisotropy-studies/2022-03-15T14:01:26+00:00https://www.imm.cnr.it/pubblicazioni/5233-search-for-signatures-of-magnetically-induced-alignment-in-the-arrival/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5234-the-exposure-of-the-hybrid-detector-of-the-pierre-auger-observatory/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5235-erratum-to-atmospheric-effects-on-extensive-air-showers-observed-with-the/2020-12-12T23:27:52+00:00https://www.imm.cnr.it/pubblicazioni/5236-atmospheric-effects-on-extensive-air-showers-observed-with-the-surface-detector/2018-04-01T22:20:47+00:00https://www.imm.cnr.it/pubblicazioni/5238-ultra-high-energy-cosmic-ray-propagation-in-the-large-scale-galactic-magnetic/2020-12-12T23:27:48+00:00https://www.imm.cnr.it/pubblicazioni/5239-modeling-of-turbulent-flows-applied-to-numerical-simulations-of-galaxy-clusters/2020-12-12T23:27:49+00:00https://www.imm.cnr.it/pubblicazioni/5240-upper-limit-on-the-diffuse-flux-of-uhe-tau-neutrinos-from-the-pierre-auger/2020-12-12T23:27:50+00:00https://www.imm.cnr.it/pubblicazioni/5241-a-neural-network-approach-to-event-by-event-cosmic-ray-primary-mass/2021-10-13T10:46:31+00:00https://www.imm.cnr.it/pubblicazioni/5242-science-and-technology-roadmap-for-graphene-related-two-dimensional-crystals/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/5243-the-exfoliation-of-graphene-in-liquids-by-electrochemical-chemical-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5244-nanoscale-insight-into-the-exfoliation-mechanism-of-graphene-with-organic-dyes/2023-01-11T13:48:23+00:00https://www.imm.cnr.it/pubblicazioni/5245-graphene-solutions/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5246-conductive-sub-micrometric-wires-of-platinum-carbonyl-clusters-fabricated-by/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5248-structural-and-gas-sensing-characterization-of-tungsten-oxide-nanorods-and/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5249-design-of-nano-sized-feox-and-au-feox-catalysts-supported-on-ceo2-for-total/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5250-catalytic-combustion-of-toluene-over-cluster-derived-gold-iron-catalysts/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5251-folded-graphene-membranes-mapping-curvature-at-the-nanoscale/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5252-backscattered-electron-imaging-and-scanning-transmission-electron-microscopy/2021-03-10T21:24:43+00:00https://www.imm.cnr.it/pubblicazioni/5254-high-temperature-growth-of-graphene-films-on-copper-foils-by-ethanol-chemical/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5255-effects-of-ta-nb-doping-on-titania-based-thin-films-for-gas-sensing/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/5256-a-supramolecular-strategy-to-leverage-the-liquidphase-exfoliation-of-graphene/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5257-micron-sized-6-6-phenyl-c61-butyric-acid-methyl-ester-crystals-grown-by-dip/2021-05-01T00:20:22+00:00https://www.imm.cnr.it/pubblicazioni/5258-regenerable-resistive-switching-in-silicon-oxide-based-nanojunctions/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5259-solutions-of-fully-exfoliated-individual-graphene-flakes-in-low-boiling-point/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5261-contrast-and-resolution-versus-specimen-thickness-in-low-energy-scanning/2021-03-13T03:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5262-low-energy-stem-of-multilayers-and-dopant-profiles/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5263-additive-nanoscale-embedding-of-functional-nanoparticles-on-silicon-surface/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5264-gold-nanoparticles-uptake-and-cytotoxicity-assessed-on-rat-liver-precision-cut/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5266-quantitative-determination-of-the-dopant-distribution-in-si-ultrashallow/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5268-synergic-exfoliation-of-graphene-with-organic-molecules-and-inorganic-ions-for/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5269-taguchi-optimized-synthesis-of-graphene-films-by-copper-catalyzed-ethanol/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/5270-images-of-dopant-profiles-in-low-energy-scanning-transmission-electron/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5271-graphene-epoxy-flexible-transparent-capacitor-obtained-by-graphene-polymer/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5272-self-assembly-and-electrical-properties-of-a-novel-heptameric-thiophene/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5274-scanning-electron-microscopy-of-thinned-specimens-from-multilayers-to/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5275-nano-graphene-growth-and-texturing-by-nd-yag-pulsed-laser-ablation-of-graphite/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5277-synthesis-of-small-gold-nanoparticles-au-i-disproportionation-catalyzed-by-a/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5278-photoactive-dendrimer-for-water-photoreduction-a-scaffold-to-combine/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/5279-tailoring-of-quantum-dot-emission-efficiency-by-localized-surface-plasmon/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5280-spatial-resolution-and-energy-filtering-of-backscattered-electron-images-in/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5282-defects-in-nanocrystalline-snomathsf-_-2-studied-by-tight-binding/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/5285-surface-electrostatic-potentials-in-carbon-nanotubes-and-graphene-membranes/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5287-microwave-assisted-synthesis-of-au-ag-and-au-ag-nanoparticles-and-their/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5290-ito-free-organic-light-emitting-transistors-with-graphene-gate-electrode/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5292-scanning-electron-microscopy-of-dopant-distribution-in-semiconductors/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5293-gas-phase-synthesis-of-mg-ti-nanoparticles-for-solid-state-hydrogen-storage/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5295-electrical-and-holographic-characterization-of-gold-catalyzed-titania-based/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5296-a-computational-study-on-co-adsorption-onto-sno2-small-grains/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/5297-photoinduced-processes-between-pyrene-functionalized-silicon-nanocrystals-and/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5298-ge-growth-on-porous-silicon-the-effect-of-buffer-porosity-on-the-epilayer/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5299-graphene-the-exfoliation-of-graphene-in-liquids-by-electrochemical-chemical-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5300-au-ag-and-au-ag-nanoparticles-microwave-assisted-synthesis-in-water-and/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5301-dopant-regions-imaging-in-scanning-electron-microscopy/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5302-liquid-phase-exfoliation-of-graphite-into-single-and-few-layer-graphene-with/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5304-uniform-functionalization-of-highquality-graphene-with-platinum-nanoparticles/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5305-enhanced-performance-of-graphene-epoxy-flexible-capacitors-by-means-of-ceramic/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5306-a-computational-study-on-nanocrystalline-sno-2-adsorption-of-co-and-o-2-onto/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/5307-on-the-spatial-resolution-and-nanoscale-feature-visibility-in-scanning-electron/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5308-transmission-electron-microscopy-study-of-graphene-solutions/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5309-one-pot-synthesis-of-bi-linker-stabilised-cdse-quantum-dots/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5310-solution-of-the-time-dependent-multi-particle-schrodinger-equation-using-monte/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5311-a-tight-binding-study-of-defects-in-nanocrystalline-sno2/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5312-low-temperature-co-detection-by-gold-activated-nanosized-titania/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5313-low-energy-stem-of-multi-layers-and-dopant-profiles/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/5314-photovoltaic-performance-enhancing-patch-with-combined-light-trapping-and/2020-05-17T22:52:23+00:00https://www.imm.cnr.it/pubblicazioni/5315-surfactant-free-single-layer-graphene-in-water/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/5318-si-ultra-shallow-junctions-dopant-profiling-with-adf-stem/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5319-the-scattering-approach-application-to-the-conductance-of-silicon-nanograins/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/5320-the-effects-of-metallic-contacts-on-silicon-nanostructures-studied-quantum/2021-03-10T21:24:43+00:00https://www.imm.cnr.it/pubblicazioni/5321-high-surface-area-graphene-foams-by-chemical-vapor-deposition/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5323-a-new-apparatus-for-electron-tomography-in-the-scanning-electron-microscope/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5324-folds-and-buckles-at-the-nanoscale-experimental-and-theoretical-investigation/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5325-electron-tomography-of-nanostructures-in-the-sem/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5327-sno2-nanograins-au-doped-a-quantum-mechanical-evaluation-of-co-adsorption/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5328-co-adsorption-onto-tin-oxide-clusters-dft-calculations/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5329-the-electronic-configuration-and-the-conductance-of-silicon-nanograins-an/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/5330-about-the-role-of-boundary-conditions-on-compositional-imaging-with-a-scanning/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5331-dopant-profile-investigation-in-low-energy-scanning-transmission-electron/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5332-poly3-hexylthiophene-nanoparticles-containing-thiophene-ss-dioxide-tuning-of/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5335-chemical-vapor-deposited-graphene-based-derivative-as-high-performance-hole/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5336-enhanced-reduction-in-threading-dislocation-density-in-ge-grown-on-porous/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5338-pii-s0167-577x-16-31239-3-doi-http-dx-doi-org-10-1016-j-matlet-2016-07-133/2018-11-19T13:12:45+00:00https://www.imm.cnr.it/pubblicazioni/5339-tracking-graphene-by-fluorescence-imaging-a-tool-for-detecting-multiple/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5342-ultrafast-exciton-dynamics-in-doubly-emitting-asymmetric-giant-pbs-cds-cds/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5343-graphene-a-supramolecular-strategy-to-leverage-the-liquidphase-exfoliation-of/2023-10-18T10:11:35+00:00https://www.imm.cnr.it/pubblicazioni/5345-graphita-2011/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5347-thickness-effects-in-tilted-sample-annular-darkfield-scanning-transmission-em/2021-04-25T08:00:38+00:00https://www.imm.cnr.it/pubblicazioni/5348-a-combined-approach-to-the-determination-of-as-depth-profiling-in-si-ultra/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/5349-size-effect-in-gold-nanoparticles-investigated-by-electron-holography-and-stem/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/5350-on-the-spatial-resolution-and-nanoscale-features-visibility-in-scanning/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5351-thickness-effects-in-tilted-sample-annular-dark-field-scanning-transmission/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5352-an-improved-detection-system-for-low-energy-scanning-transmission-electron/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5353-nanowires-of-semiconducting-metal-oxides-and-their-functional-properties/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5354-evolution-of-nanometric-structures-under-irradiation-studied-by-a-time/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5355-the-effects-of-boundary-conditions-on-dopant-region-imaging-in-scanning/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5357-low-energy-scanning-transmission-electron-microscopy-of-semiconductor/2020-12-18T23:24:04+00:00https://www.imm.cnr.it/pubblicazioni/5358-fragmentation-and-exfoliation-of-low-dimensional-materials-a-statistical/2023-01-11T13:50:29+00:00https://www.imm.cnr.it/pubblicazioni/5359-compressed-sensing-tomography-of-inorganic-and-biological-samples-in-the/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5360-rapid-and-highly-efcient-growth-of-graphene-on-copper-by-chemical-vapor/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/5361-protein-induced-self-assembly-of-go/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/5362-probing-the-distribution-of-crystallographic-charges-in-graphene-membranes/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5363-curvature-driven-nanoparticles-decoration-of-graphene-membranes/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5364-low-energy-scanning-transmission-electron-microscopy/2021-03-10T21:24:55+00:00https://www.imm.cnr.it/pubblicazioni/5365-graphene-as-transparent-conducting-layer-in-si-nanodot-based-pin-thin-film/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5366-numerical-simulation-of-electron-holography-response-in-folded-graphene-sheets/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5367-microelectronics-technologies-and-devices/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5368-graphene-foams-to-tune-the-benefits-of-2d-materials-for-a-3d-world/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5369-additive-free-single-layer-graphene-in-water-and-few-graphene-layers-from-food/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5370-dont-risk-missing-out-subscribe-to-chemphyschem-contact-www-wileycustomerhelp/2018-06-08T22:15:53+00:00https://www.imm.cnr.it/pubblicazioni/5371-valence-charge-mapping-and-potential-trap-depression-in-graphene-membranes-and/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5372-synthesis-of-smooth-graphene-surfaces-by-cvd-for-electrochemical-biosensors/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/5373-i3-4-scanning-electron-microscopy-of-thinned-multilayers-and-biological-samples/2021-03-10T21:24:46+00:00https://www.imm.cnr.it/pubblicazioni/5374-technological-integration-of-cvd-grown-graphene-membranes-for-thermal-and/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5375-cvd-graphene-as-support-for-lipid-membranes-for-the-fabrication-of-novel/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5376-growth-of-luminescent-cds-qds-from-soluble-single-source-precursor-in-solution/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/5377-multilayer-graphene-sheets-computational-studies-for-electron-holography/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5378-graphene-epoxy-flexible-capacitors-enhanced-by-ceramic-fillers/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/5379-low-energy-stem-and-edx-investigation-of-polystyrene-zno-core-shell-structures/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5380-graphita-2011-selected-papers-from-the-workshop-on-fundamentals-and/2018-06-08T22:15:50+00:00https://www.imm.cnr.it/pubblicazioni/5381-science-and-technology-roadmap-for-graphene-related-two-dimensional-crystals/2020-12-18T23:23:59+00:00https://www.imm.cnr.it/pubblicazioni/5382-selective-oxidation-of-hmf-using-au-cu-supported-catalysts-an-insight-on-the/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5383-graphene-based-coatings-on-polymer-films-for-gas-barrier-applications/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5384-nav-view-search/2020-01-13T23:29:51+00:00https://www.imm.cnr.it/pubblicazioni/5388-growth-and-characterization-of-3c-sic-films-for-micro-electro-mechanical/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5391-development-of-mems-strain-sensors-for-crack-monitoring-in-ageing-civil/2021-02-19T19:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5393-a-measurement-technique-for-thermoelectric-power-of-cmos-layers-at-the-wafer/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5394-strain-relaxation-of-gaas-ge-crystals-on-patterned-si-substrates/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5397-fabrication-of-detf-sensors-in-soi-technology-with-submicron-air-gaps-using-a/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5401-miniaturized-fiber-optic-ultrasound-probes-for-endoscopic-tissue-analysis-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5402-challenges-and-progress-toward-a-silicon-based-multi-microring-optical-network/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5403-phonon-scattering-enhancement-in-silicon-nanolayers/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5406-influence-of-grain-size-on-the-thermoelectric-properties-of-polycrystalline/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5407-method-for-making-a-silicon-separation-microcolumn-for-chromatography-or-gas/2017-09-11T08:13:37+00:00https://www.imm.cnr.it/pubblicazioni/5412-processing-induced-electrically-active-defects-in-black-silicon-nanowire-devices/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5413-study-of-induced-strain-in-silicon-rib-structures/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/5414-lattice-deformations-in-strained-silicon-rib-structures-for-photonic-devices/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5415-integration-of-ingap-gaas-ge-triple-junction-solar-cells-on-deeply-patterned/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5417-study-of-birefringence-and-strain-distribution-in-silicon-waveguides-and/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5422-high-quality-surface-micromachining-of-linbo3-by-ion-implantation-assisted/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5423-high-dose-al-implanted-and-microwave-annealed-4h-sic/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5428-direct-detection-of-dna-sequences-based-on-capacitance-measurements-through-a/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5429-wafer-level-measurement-of-thin-films-thermoelectric-power/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/5430-process-dependence-of-doped-polysilicon-thermal-conductivity-for-thermal-mems/2018-11-19T13:12:48+00:00https://www.imm.cnr.it/pubblicazioni/5431-a-computationally-efficient-model-for-thermal-sensors-simulation/2021-04-25T08:00:33+00:00https://www.imm.cnr.it/pubblicazioni/5432-highly-sensitive-thermoelectric-transducers-with-cmos-materials/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5434-an-optimized-front-side-micromachining-process-for-dielectric-membranes-using/2021-04-23T18:00:32+00:00https://www.imm.cnr.it/pubblicazioni/5435-for-dielectric-membranes-usingtmah/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/5436-a-novel-pneumatically-driven-su-8-microvalve-for-high-speed-gas-chromatographic/2020-01-13T23:29:51+00:00https://www.imm.cnr.it/pubblicazioni/5437-conventional-and-enantioselective-gc-microfabricated-columns-versus-fsot/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5438-the-cms-experiment-at-the-cern-lhc/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/5439-radiation-hard-semiconductor-detectors-for-superlhc/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5440-development-of-radiation-tolerant-semiconductor-detectors-for-the-super-lhc/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5441-numerical-simulation-of-radiation-damage-effects-in-p-type-and-n-type-fz/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5443-silicon-carbide-for-uv-alpha-beta-and-x-ray-detectors-results-and-perspectives/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5445-recent-advancements-in-the-development-of-radiation-hard-semiconductor/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5447-analysis-of-electron-traps-at-the-4h-sic-sio2-interface-influence-by-nitrogen/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5448-comprehensive-modeling-of-bulk-damage-effects-in-silicon-radiation-detectors/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5449-numerical-simulation-of-radiation-damage-effects-in-p-type-silicon-detectors/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5450-an-enhanced-approach-to-numerical-modeling-of-heavily-irradiated-silicon-devices/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5452-contact-resistivity-of-al-ti-ohmic-contacts-on-p-type-ion-implanted-4h-and-6h/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5455-effect-of-nitrogen-implantation-at-the-sio2-sic-interface-on-the-electron/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5457-electrical-transport-properties-of-single-undoped-and-n-type-doped-inn-nanowires/2021-07-14T18:00:15+00:00https://www.imm.cnr.it/pubblicazioni/5458-device-simulations-of-silicon-detectors-a-design-perspective/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5459-comprehensive-device-simulation-modeling-of-heavily-irradiated-silicon/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5460-comparison-between-cathodoluminescence-spectroscopy-and-capacitance-transient/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5461-analysis-and-simulation-of-charge-collection-efficiency-in-silicon-thin/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5465-annealing-effects-on-leakage-current-and-epilayer-doping-concentration-of-p-n/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5466-interdefect-charge-exchange-in-silicon-particle-detectors-at-cryogenic/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5467-modeling-of-radiation-damage-effects-in-silicon-detectors-at-high-fluences-hl/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5468-implanted-4h-sic-i-n-diodes-forward-current-negative-temperature-coefficient/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5470-al-implanted-4h-sic-p-in-diodes-evidence-for-post-implantation-annealing/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5472-combined-bulk-and-surface-radiation-damage-effects-at-very-high-fluences-in/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5474-characterization-of-energy-levels-related-to-impurities-in-epitaxial-4h-sic-ion/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/5477-a-comprehensive-numerical-simulation-of-heavily-irradiated-p-type-and-n-type/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5479-device-simulation-of-irradiated-silicon-detectors-at-cryogenic-temperatures/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5480-silicon-carb-rel-mater-2004/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5481-a-comprehensive-analysis-of-irradiated-silicon-detectors-at-cryogenic/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5482-analysis-and-test-of-overhanging-metal-microstrip-detectors/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5483-measurements-and-tcad-simulations-of-bulk-and-surface-radiation-damage-effects/2021-04-25T08:00:40+00:00https://www.imm.cnr.it/pubblicazioni/5484-development-status-of-a-czt-spectrometer-prototype-with-3d-spatial-resolution/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5485-fully-implanted-vertical-p-i-n-diodes-using-high-purity-semi-insulating-4h-sic/2021-04-23T18:00:32+00:00https://www.imm.cnr.it/pubblicazioni/5486-fully-ion-implanted-vertical-pin-diodes-on-high-purity-semi-insulating-4h-sic/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5488-extraction-of-the-schottky-barrier-height-of-ti-al-contacts-on-4h-sic-from-iv/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/5489-sic-donor-doping-by-300-cp-implantation-characterization-of-the-doped-layer/2017-06-15T08:13:20+00:00https://www.imm.cnr.it/pubblicazioni/5490-modeling-of-critical-electric-field-within-irradiated-si-microstrip-detectors/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5497-ar-annealing-at-1600-c-and-1650-c-of-al-implanted-p-n-4h-sic-diodes-analysis-of/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5498-optimization-of-overhanging-metal-microstrip-detectors-test-and-simulation/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5499-a-combined-surface-and-bulk-tcad-damage-model-for-the-analysis-of-radiation/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5500-p-implanted-6h-sic-n-i-p-diodes-evidence-for-a-post-implantation-annealing/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5501-development-of-a-czt-spectroscopic-3d-imager-prototype-for-hard-x-ray-astronomy/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5509-cv-and-dlts-analyses-of-trap-induced-graded-junctions-the-case-of-al-implanted/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5513-numerical-analysis-of-thinned-silicon-detectors/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5514-chapter-5-sic-devices-5-3-bipolar-diodes-effects-of-very-high-neutron-fluence/2018-11-19T13:12:45+00:00https://www.imm.cnr.it/pubblicazioni/5515-chapter-4-sic-processing-4-2-dielectrics-and-passivation-layers-fabrication-of/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5516-chapter-4-sic-processing-4-2-dielectrics-and-passivation-layers/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/5517-part-2-chapter-5-processing-of-sic-5-1-implantation-and-doping-of-sic-current/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5518-radiation-damage-effects-radiation-hardness-after-very-high-neutron-irradiation/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5521-analysis-and-simulation-of-silicon-thin-detectors/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5522-preliminary-measurements-of-charge-collection-of-p-n-junction-sic-detectors-and/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5523-chapter-5-sic-technology-5-3-contacts-etching-and-packaging-ni-silicide/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5524-chapter-5-sic-technology-5-1-doping-and-implantation-n-p-diodes-realized-in-sic/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5525-chapter-5-sic-technology-5-1-doping-and-implantation-ar-annealing-at-1600/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5526-chapter-6-sic-devices-6-4-sensors-and-detectors-measurements-of-charge/2018-11-19T13:12:49+00:00https://www.imm.cnr.it/pubblicazioni/5527-silicon-carbide-particle-detectors-analysis-and-simulation/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5528-chapter-8-device-processing-8-3-implantation-technology-sic-donor-doping-by-300/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5529-an-enhanced-device-simulation-of-heavily-irradiated-silicon-detectors-at/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5531-radiation-active-pixel-sensor-integrated-in-0-25-pm-cmos/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5532-2001-nuclear-science-symposium-nss-room-temperature-semiconductor-detectors/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5533-radiation-active-pixel-sensor-integrated-in-0-25-m-cmos-technology-a/2018-02-04T23:15:24+00:00https://www.imm.cnr.it/pubblicazioni/5534-p-implanted-6h-sic-n-ip-diodes-evidence-for-post-implantation-annealing/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5535-bethke-klaus/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/5536-comprehensive-modeling-of-bulk-damage/2018-02-04T23:15:23+00:00https://www.imm.cnr.it/pubblicazioni/5537-part-i-of-three-parts/2018-02-04T23:15:22+00:00https://www.imm.cnr.it/pubblicazioni/5538-micro-and-nanopatterning-of-spintransition-compounds-into-logical-structures/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5539-highperformance-single-crystal-organic-fieldeffect-transistors-based-on-two/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5540-thin-deposits-and-patterning-of-room-temperature-switchable-one-dimensional/2021-04-25T08:00:36+00:00https://www.imm.cnr.it/pubblicazioni/5541-structure-morphology-and-growth-dynamics-of-perfluoropentacene-thin-films/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/5542-ambipolar-multistripe-organic-fieldeffect-transistors/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5543-the-four-polymorphic-modifications-of-the-semiconductor-dibenzo/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5544-damage-in-ion-implanted-silicon-measured-by-xray-diffraction/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/5545-x-ray-rocking-curve-analysis-of-crystals-with-buried-amorphous-layers-case-of/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5547-structure-and-morphology-of-pdi8cn2-for-ntype-thinfilm-transistors/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5548-effect-of-the-silanization-and-annealing-on-the-morphology-of-thin-poly3/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5549-depth-resolved-molecular-structure-and-orientation-of-polymer-thin-films-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5550-effects-of-boron-interstitial-silicon-clusters-on-interstitial-supersaturation/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5551-influence-of-the-electrolyte-viscosity-on-the-structural-features-of-porous/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5553-logic-gate-devices-based-on-printed-polymer-semiconducting-nanostripes/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5554-structure-and-dynamics-of-pentacene-on-sio-2-from-monolayer-to-bulk-structure/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5555-epr-and-x-ray-diffraction-study-of-damage-produced-by-implantation-of-b-ions-50/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5556-depth-resolved-study-of-impurity-sites-in-low-energy-ion-implanted-as-in-si/2021-04-25T08:00:33+00:00https://www.imm.cnr.it/pubblicazioni/5558-synchrotron-x-ray-investigation-of-tetracene-thin-films-grown-at-different/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5559-selfassembly-of-an-amphiphilic-conjugated-dyad-into-fibers-ultrafast-and/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5561-3d-dumond-diagrams-of-multi-crystal-bragg-case-synchrotron-topography-i-flat/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5564-defects-formation-in-sublimation-grown-6h-sic-single-crystal-boules/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5565-leveraging-the-ambipolar-transport-in-polymeric-fieldeffect-transistors-via/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5566-structural-investigation-of-thin-tetracene-films-on-flexible-substrate-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5567-structural-and-optical-characterization-of-two-dimensional-arrays-of-si/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5569-spectroscopic-investigation-of-the-semiconductor-molecular-packing-in-fully/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5570-coherent-x-ray-imaging-investigation-of-macrodefects-and-micropipes-on-sic/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5571-wafer-warpage-crystal-bending-and-interface-properties-of-4h-sic-epi-wafers/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5572-pre-amorphization-damage-study-in-as-implanted-silicon/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5573-direct-onsurface-patterning-of-a-crystalline-laminar-covalent-organic-framework/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5574-enhancing-the-charge-transport-in-solutionprocessed-perylene-diimide/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5575-on-the-role-of-the-static-debyewaller-factor-in-xray-rocking-curve-analysis/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5576-nanomechanical-characterization-of-zirconia-thin-films-deposited-on-uhmwpe-by/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5578-nature-and-occurrence-of-defects-in-6h-sic-lely-crystals/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5579-x-ray-section-topographic-investigation-of-the-growth-process-of-sic-crystals/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/5580-laser-induced-crystallization-of-hydrogenated-amorphous-silicon-carbon-alloys/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5581-x-ray-diffraction-imaging-investigation-of-silicon-carbide-on-insulator/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5582-structural-analyses-of-thermal-annealed-sro-sio2-superlattices/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5583-depth-resolved-investigations-of-boron-implanted-silicon/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5584-3d-dumond-diagrams-of-multi-crystal-bragg-case-synchrotron-topography-ii-curved/2017-06-26T16:31:33+00:00https://www.imm.cnr.it/pubblicazioni/5586-real-time-investigation-of-the-growth-of-silicon-carbide-nanocrystals-on-si-1-0/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5587-bragg-case-x-ray-interference-in-multilayered-structures-comparison-between/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5588-surface-nanostructures-in-manganite-films/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5589-crystallization-of-organic-semiconductor-molecules-in-nanosized-cavities/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5590-x-ray-synchrotron-topography-investigation-of-porous-silicon-formed-by/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5591-damage-profiles-in-as-implanted-100-si-crystals-strain-by-x-ray-diffractometry/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5593-photocurrent-spectroscopy-of-ion-implanted-organic-thin-film-transistors/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5594-depth-profiling-of-the-lateral-pore-size-and-correlation-distance-in-thin/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/5595-porous-silicon-characterization-by-x-ray-reflectivity-problems-arising-from/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5596-damage-profiles-in-as-implanted-silicon-fluence-dependence/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5597-characterization-of-lattice-defects-in-ion-implanted-silicon/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5598-strain-determination-in-mismatched-heterostructures-by-means-of-high-resolution/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5601-selective-growth-of-sexithiophene-by-using-silicon-oxides-patterns/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5602-properties-of-cdte-layers-deposited-by-a-novel-method-pulsed-plasma-deposition/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5603-non-destructive-techniques-for-identification-and-control-of-processing-induced/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5604-transmission-electron-microscopy-high-resolution-x-ray-diffraction-and/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5606-sensors-selfassembly-of-an-amphiphilic-conjugated-dyad-into-fibers-ultrafast/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5607-structural-analysis-and-depth-profiling-of-nanometric-sio-2-sro-multilayers/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5608-a-novel-industrial-thin-film-deposition-technology-for-sustainable-cdte/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5609-monitoring-the-crystallization-process-of-nano-confined-organic-molecules-by/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5610-preparation-and-characterization-of-nanocrystals-using-ellipsometry-and-x-ray/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/5611-erratum-todamage-profiles-in-as-implanted-100-si-crystals-strain-by-x-ray/2018-06-08T22:15:49+00:00https://www.imm.cnr.it/pubblicazioni/5612-high-anisotropic-and-substrate-independent-mobility-in-polymer-field-effect/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5615-i-40129-bologna-italy/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5616-organic-molecules-for-electronic-devices-memories-wires-and-field-effect/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5617-preparation-and-characterization-of-nanocrystals/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5619-physical-and-analytical-electrochemistry-depth-profiling-of-the-lateral-pore/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5620-dependence-of-the-transient-enhanced-diffusion-of-b-in-si-upon-b-concentration/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5621-semiconductor-devices-materials-and-processing-x-ray-synchrotron-topography/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5622-papers-applied-interfaces-and-surfaces-porous-silicon-characterization-by-x-ray/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/5623-etude-par-imagerie-au-rayonnement-synchrotron-des-materiaux-semi-conducteurs/2019-06-12T22:48:15+00:00https://www.imm.cnr.it/pubblicazioni/5625-for-adv-funct-mater-doi-10-1002-adfm-201101640/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5626-size-dependent-extinction-coefficients-of-pbs-quantum-dots/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5627-characterization-of-defects-in-materials/2020-06-11T22:44:58+00:00https://www.imm.cnr.it/pubblicazioni/5628-largescale-synthesis-of-ultrathin-bi2s3-necklace-nanowires/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5629-room-temperature-polymorphism-in-metastable-bimno3-prepared-by-high-pressure/2021-03-13T03:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5630-composition-and-structure-of-si-ge-layers-produced-by-ion-implantation-and/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5631-shapecontrolled-bi2s3-nanocrystals-and-their-plasma-polymerization-into/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5632-different-quantum-behavior-of-the-e-1-and-e-2-spectral-structures-in-ge/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/5633-electron-holography-of-longrange-electric-and-magnetic-fields/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/5634-high-temperature-polymorphism-in-metastable-bimno3/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5635-structure-of-ti2p-solved-by-three-dimensional-electron-diffraction-data/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5636-structure-and-local-dipole-of-si-interface-layers-in-alas-gaas-heterostructures/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5637-ultrasound-anomaly-at-tc-in-yba2cu3oy/2020-06-11T22:44:53+00:00https://www.imm.cnr.it/pubblicazioni/5638-laser-induced-epitaxial-regrowth-of-si1-xgex-si-layers-produced-by-ge-ion/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5639-antireflecting-passivating-dielectric-films-on-crystalline-silicon-solar-cells/2021-04-25T08:00:36+00:00https://www.imm.cnr.it/pubblicazioni/5640-orthorhombic-low-temperature-superstructures-in/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5641-homojunction-and-heterojunction-silicon-solar-cells-deposited-by-low/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5642-mapping-of-microelectrostatic-fields-by-means-of-electron-holography/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5643-ultrathin-sb-2-s-3-nanowires-and-nanoplatelets/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5644-structural-modulation-and-superconducting-properties-in-bi-pb-2sr2-y-ca-cu2oz/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5645-charge-order-and-tilt-modulation-in-multiferroic-k-x-mii-x-miii1-x-f3-0-4-x-0-6/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5646-secondary-electron-emission-from-diamond-physical-modeling-and-application-to/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5647-oxygen-order-and-charge-transfer-mechanism-in-zn-doped-yba-2-cu-3-o-7/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5648-computer-simulations-of-electron-holographic-contour-maps-of-superconducting/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/5649-structural-properties-and-multiferroic-phase-diagram-of-k-0-6-fe-0-6-ii-fe-0-4/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5650-extreme-undercooling-down-to-of-liquid-metal-nanoparticles/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5651-morphological-characterization-of-poly-3-octylthiophene-plasticizer-c60-blends/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/5652-qed-v-1-0-a-software-package-for-quantitative-electron-diffraction-data/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5653-the-early-stages-of-the-self-assembly-process-of-polystyrene-beads-for-photonic/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5654-flux-assisted-self-assembly-of-monodisperse-colloids/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5655-preparation-of-the-nd-123-phase-in-air-with-as-high-as-95-k/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5656-fundamental-properties-of-lead-and-tin-nanocrystals-in-a-dielectric-matrix/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5657-synthesis-and-characterization-of-multiferroic-bimn-7-o-12/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/5658-on-the-resolution-of-semiconductor-multilayers-with-a-scanning-electron/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5659-optical-and-structural-analysis-of-degraded-high-power-ingaalas-algaas-lasers/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5660-spontaneous-phase-fluctuations-of-nanoparticles-of-lead-in-a-silicon-oxide/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/5661-currentand-magneticfieldinduced-order-and-disorder-in-ordered-nematic-liquid/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5662-template-evaporation-method-for-controlling-anatase-nanocrystal-size-in-ordered/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5663-insight-into-the-premelting-and-melting-processes-of-metal-nanoparticles/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5664-structure-determination-of-bi-8-pb-5-o-17-by-electron-and-powder-x-ray/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/5665-si-gaas-001-superlattice-structure/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5666-open-circuit-voltage-in-homojunction-and-heterojunction-silicon-solar-cells/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5667-critical-chain-length-and-superconductivity-emergence-in-oxygen-equalized-pairs/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5668-comparison-of-spatial-resolutions-obtained-with-different-signal-components-in/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5669-interpretation-of-holographic-contour-maps-of-reverse-biased-pn-junctions/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5672-structure-related-superconducting-properties-in-oxygen-chainequalized-and-order/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5673-optical-spectra-of-nd3-in-niobates-of-the-tetragonal-tungsten-bronze-family/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5674-effect-of-regioregularity-on-the-photoresponse-of-schottky-type-junctions-based/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5675-ba-ca-cu-oxycarbonate-thin-films-prepared-by-pulsed-laser-deposition-structure/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/5676-synthesis-single-crystal-growth-and-structural-determination-of-new-copper/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5677-effects-of-the-annealing-conditions-on-the-structural-and-superconducting/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/5678-in-plane-texture-and-transport-properties-of-ybco-films-grown-on-mgo-cut-off/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5679-thermally-activated-magnetization-reversal-in-bulk-bife-0-5-mn-0-5-o-3/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5680-nanoscale-formation-of-new-solid-state-compounds-by-topochemical-effects-the/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/5681-metallic-versus-covalent-bonding-ga-nanoparticles-as-a-case-study/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5682-synthesis-x-ray-crystal-structure-and-dielectric-measurements-of-a-tetragonal/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/5683-synthesis-crystal-growth-and-structural-characterisation-of-barium-copper/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/5684-characterization-of-defects-produced-during-selfannealing-implantation-of-as-in/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5685-spatial-resolution-optimization-of-backscattered-electron-images-using-monte/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5686-to-oii-oiii-and-oiii-oi-phase-boundary-in-oxygen-chain-equalised-and-order/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5687-from-carbonate-cuprates-to-cuprate-carbonates-the-structural-equivalence-of-co/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/5688-computer-simulations-of-electron-holographic-contour-maps-of-superconducting/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5689-hrtem-raman-and-optical-study-of-cds1-xsex-nanocrystals-embedded-in-silicate/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5690-strategies-in-electron-diffraction-data-collection/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5691-influence-of-oiii-ordering-ont-c-in-ybco/2020-12-17T23:18:34+00:00https://www.imm.cnr.it/pubblicazioni/5692-non-interacting-hard-ferromagnetic-l1-0-fept-nanoparticles-embedded-in-a-carbon/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5693-an-experiment-on-the-particle-wave-nature-of-electrons/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/5694-jc-enhancement-by-partial-melting-in-bscco-2223-ceramics/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5695-thermodynamic-properties-and-optical-characterization-of-metal-nanoparticles-in/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5696-new-approach-to-study-melting-processes-in-metal-nanoparticles-capacitance/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5697-amorphous-carbon-deposited-by-pulsed-laser-ablation-as-material-for-cold/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5698-structure-determination-by-electron-diffraction-and-hrem-of-the-incommensurate/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5699-structural-properties-and-thermal-stability-of-bi8pb5o17fast-ion-conducting/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/5700-effects-of-nitrogen-annealing-on-structural-microstructural-and-superconducting/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/5701-dynamic-behaviour-of-lead-nanoparticles-in-a-dielectric-matrix/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5702-effects-of-simultaneous-pb-bi-and-y-ca-substitution-on-structural-and/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5703-electron-spectroscopic-imaging-of-dopant-precipitation-and-segregation-in/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/5704-the-heisenberg-uncertainty-principle-demonstrated-with-an-electron-diffraction/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5705-inside-cover-largescale-synthesis-of-ultrathin-bi2s3-necklace-nanowires-angew/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5706-building-materials-from-colloidal-nanocrystal-arrays-preventing-crack-formation/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5707-using-high-pressure-to-prepare-polymorphs-of-the-ba2co1-x-zn-x-s3-0-x-1-0/2020-01-09T23:34:19+00:00https://www.imm.cnr.it/pubblicazioni/5708-polymorphism-and-multiferroicity-in-bi1-x-3mniii3mniii4-xmnivxo12/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/5709-neutron-diffraction-study-of-bi8pb5o17-structure-refinement-and-analysis-of/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5710-the-role-of-cuo-chain-length-on-superconductivity-emergence-in-yba2cu3o6-30/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5711-synthesis-single-crystal-growth-and-structural-characterization-of-the-new/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/5714-tridimensional-characterization-of-voids-in-self-annealed-implanted-silicon/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5715-resolution-of-semiconductor-multilayers-using-backscattered-electrons-in/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5716-image-simulation-of-holographic-contour-maps-of-reverse-biased-pn-junctions/2017-09-11T08:13:36+00:00https://www.imm.cnr.it/pubblicazioni/5717-journal-of-materials-chemistry-c/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/5718-phase-transitions-in-gallium-nanodroplets-detected-by-dielectric-spectroscopy/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5719-off-axis-electron-holography-of-nearly-spherical-faceted-voids-in-self-annealed/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5721-xrd-line-profile-analysis-of-htc-superconducting-thin-films/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5722-comparative-study-of-thermodynamic-properties-of-metallic-and-semiconducting/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5723-copper-substitution-effects-on-ybco-microstructure-oxygen-ordering-structural/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5724-dynamics-of-void-formation-during-implantation-of-si-under-self-annealing/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5725-radiation-damage-evolution-and-its-relation-with-dopant-distribution-during/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5726-tem-observation-of-gaas-gaalas-laser-diodes-degraded-in-field-operation/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5729-polymorphism-and-multiferroicity-in-bi1x-3-mn3iiimn4xiiimnxiv-o12/2018-06-08T22:15:49+00:00https://www.imm.cnr.it/pubblicazioni/5730-innentitelbild-largescale-synthesis-of-ultrathin-bi2s3-necklace-nanowires-angew/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5731-inor-1003-polymer-like-inorganic-nanowires/2021-03-13T03:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5732-inor-62-transition-energies-extinction-coefficient-and-oscillator-strength-in/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5733-nanocrystal-plasma-polymerization/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5734-the-strange-behaviour-of-metallic-gallium-at-the-nanoscale/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5736-synthesis-and-applications-of-nanostructured-and-nanocrystalline-silicon-based/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5737-thickness-dependent-imaging-of-atomic-columns-in-caxcuo2-composite-crystal/2020-12-17T23:18:41+00:00https://www.imm.cnr.it/pubblicazioni/5738-imaging-of-atomic-columns-in-a-wedge-shaped-caxcuo2-composite-crystal-as-a/2024-02-22T14:10:13+00:00https://www.imm.cnr.it/pubblicazioni/5739-synthesis-single-crystal-growth-and-structural/2024-02-22T14:10:14+00:00https://www.imm.cnr.it/pubblicazioni/5740-mass-spectrometry-a-tool-to-investigate-matter-transfer-processes-during-pulsed/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5741-angert-i-e-majorovits-and-rr-schrokder-zero-loss-image-formation-and-modi-ed/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5742-dunkelberger-dg-see-fan-gy-84-2000-75/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5743-electric-magnetic-mechanical-and-thermal-properties-dissipative-phenomena-to/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5744-edelstein-norman-20-emirdag-mehtap-287-enjalbert-r-379-ennaqui-abderrahman-143/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5745-preparation-of-cu-1-x-c-x-ba-2-ca-3-cu-4-o-11-thin-films-by-means-of-pulsed/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5746-relationship-between-intensity-and-structure-factor-amplitude-in-saed-data/2020-12-17T23:18:36+00:00https://www.imm.cnr.it/pubblicazioni/5747-preparation-of-the-nd-123-phase-in-air-with-t-c-as-high-as-95-k/2017-09-11T08:13:37+00:00https://www.imm.cnr.it/pubblicazioni/5748-preparation-of-ba-ca-cu-oxycarbonate-superconducting-thin-films-by-pulsed-laser/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5749-kinetic-study-on-the-formation-of-the-aragonite-like-phase-ba-cuo-sub-xsub-1/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5750-beuran-fc-see-hatterer-cj-261-153-borri-ca-see-paracchini-c-261-147-bugoslavsky/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5751-kinetic-study-on-the-formation-of-the-aragonite-like-phase-bacuox1-yco3y/2021-03-11T23:17:10+00:00https://www.imm.cnr.it/pubblicazioni/5752-study-of-metal-and-semiconductor-nano-clusters-crystalline-stability-versus/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5753-bednarczyk-pj-see-mogro-campero-a-247-239-belenli-i-m-ebrahimi-and-ys-hascicek/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/5754-transmission-electron-microscopy-and-optical-characterization-of-nano-particles/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5755-observation-of-semiconductor-superstructures-with-backscattered-electrons-in-a/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5756-effects-of-the-annealing-conditions-on-the-structural-and-superconducting/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5757-tem-characterization-of-self-annealed-as-implanted-silicon/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5758-microstructural-characterization-of-the-b-superconducting-and-c-superconducting/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5759-microstructural-characterization-of-the-85-k-superconducting-phase-in-the-bi-ca/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/5760-evidence-of-theb-andc-superconducting-phases-in-the-bi-ca-sr-cu-o-system/2020-12-17T23:18:35+00:00https://www.imm.cnr.it/pubblicazioni/5761-bachmann-f-see-woratschek-baker-sd-see-milne-bailer-ts-and-j-dieleman/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5762-thermal-stability-of-non-alloyed-ohmic-contact-to-n-gaas/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5763-materials-chemistry-c/2017-06-15T08:13:16+00:00https://www.imm.cnr.it/pubblicazioni/5764-characterization-of-defects-produced-during-self-annealing-implantation-f-as-in/2019-03-02T13:12:37+00:00https://www.imm.cnr.it/pubblicazioni/5765-the-role-of-cuo-chain-length-on-superconductivity-emergence-in-yba2cu3o6-30/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5767-parametrization-of-optical-properties-of-indium-tin-oxide-thin-films-by/2021-03-10T21:24:49+00:00https://www.imm.cnr.it/pubblicazioni/5768-optoelectronic-properties-structure-and-composition-of-sich-films-grown-in/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5769-optical-structural-and-electrical-properties-of-device-quality-hydrogenated/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5771-strain-and-surface-damage-induced-by-proton-exchange-in-ycut-linbo3/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5772-wide-band-gap-silicon-carbon-alloys-deposited-by-very-high-frequency-plasma/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5773-surface-doping-of-semiconductors-by-pulsed-laser-irradiation-in-reactive/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/5774-fluorescence-emission-enhanced-by-surface-electromagnetic-waves-on-one/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5775-anatomy-of-thin-films-by-plasma-enhanced-chemical-vapor-deposition-an/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5777-photoelectrical-characterization-of-schottky-junctions-between-poly-4h/2021-03-10T21:24:47+00:00https://www.imm.cnr.it/pubblicazioni/5779-the-influence-of-hydrogen-dilution-on-the-optoelectronic-and-structural/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5780-silicon-nanocrystals-embedded-in-silicon-carbide-investigation-of-charge/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5781-electro-optical-modulation-at-1550-nm-in-an-as-deposited-hydrogenated-amorphous/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5783-photocarrier-collection-in-a-sic-h-c-si-heterojunction-solar-cells/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5784-ultrathin-c-si-films-deposited-by-pecvd/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5785-plasma-enhanced-chemical-vapour-deposition-of-microcrystalline-silicon-on-the/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5786-spectral-behavior-of-solar-cells-based-on-the-junction-near-local-defect/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5788-very-high-frequency-hydrogen-plasma-treatment-of-growing-surfaces-a-study-of/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5790-properties-of-tin-obtained-by-n2-implantation-on-ticoated-si-wafers/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/5792-the-sign-of-the-hall-effect-in-hydrogenated-amorphous-and-disordered/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/5793-the-role-of-contact-size-on-the-formation-of-schottky-barriers-and-ohmic/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5796-in-guide-pump-and-probe-characterization-of-photoinduced-absorption-in/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5797-boron-and-phosphorus-doping-of-a-sic-h-thin-films-by-means-of-ion-implantation/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5798-amorphous-silicon-waveguides-grown-by-pecvd-on-an-indium-tin-oxide-buried/2018-06-07T08:16:29+00:00https://www.imm.cnr.it/pubblicazioni/5799-optical-characterization-of-random-pyramid-texturization/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5800-a-sin-h-multilayer-versus-bulk-structure-a-real-improvement-of-radiative/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/5801-optimization-of-relevant-deposition-parameters-for-high-quality-a-sic-h-films/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5802-a-quasi-exact-inverteble-equation-for-absorption-coefficient-from-reflectance/2020-05-17T22:52:22+00:00https://www.imm.cnr.it/pubblicazioni/5803-silicon-heterojunction-solar-cells-with-microcrystalline-emitter/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5804-application-of-nanotechnologies-in-high-energy-physics/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5805-charge-transport-in-nanocrystalline-sic-with-and-without-embedded-si/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5806-influence-of-boron-doping-and-hydrogen-passivation-on-recombination-of/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5807-electro-optical-effect-in-hydrogenated-amorphous-silicon-based-waveguide/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5809-photoinduced-absorption-in-b-doped-hydrogenated-amorphous-silicon-alloys/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5810-design-study-of-micromachined-thermal-emitters-for-ndir-gas-sensing-in-the-9-12/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5811-photoluminescence-and-electroluminescence-properties-of-a-si1-xnx-h-based/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5812-defect-distribution-and-bonding-structure-in-high-band-gap-a-si1xcxh-films/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5815-absorption-and-emission-of-silicon-nanocrystals-embedded-in-sic-eliminating/2021-04-25T08:00:38+00:00https://www.imm.cnr.it/pubblicazioni/5816-in-guide-measurement-of-the-infra-red-absorption-variation-induced-in/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5817-photoluminescence-and-optical-characterization-of-a-sixn1-xh-based-multilayers/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5818-compositional-optoelectronic-and-structural-properties-of-amorphous-silicon/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5819-study-of-a-si-h-c-si-heterojunctions-for-pv-applications/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/5820-powder-dissipation-in-pecvd-for-sih4-ch4-h2-gas-mixtures/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5821-brightness-degradation-controlled-by-current-induced-metastable-defect-creation/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5822-optical-and-electrical-properties-of-ion-implanted-titanium-nitride-thin-films/2021-03-10T21:24:43+00:00https://www.imm.cnr.it/pubblicazioni/5823-processing-and-characterisation-of-tandem-solar-cells-from-crystalline-silicon/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5824-effect-of-hydrogen-plasma-treatments-at-very-high-frequency-on-p-type-amorphous/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/5825-influence-of-front-contact-material-on-silicon-heterojunction-solar-cell/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5826-effect-of-plasma-treatment-of-the-tco-on-a-si-solar-cell-performance/2021-03-10T21:24:46+00:00https://www.imm.cnr.it/pubblicazioni/5827-nanocrystalline-sic-formed-by-annealing-of-a-sich-on-si-substrates-a-study-of/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5828-boron-diffusion-in-nanocrystalline-3c-sic/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5829-optical-properties-of-silicon-rich-oxides/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5830-amorphous-silicon-nitrogen-alloys-deposited-by-pecvd-under-hydrogen-dilution/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5831-parameters-affecting-the-incorporation-process-and-doped-layer-characterization/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5832-monolithic-si-nanocrystal-crystalline-si-tandem-cells-involving-si-nanocrystals/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5833-nanotechnology-and-photovoltaic-devices-light-energy-harvesting-with-group-iv/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5834-the-dielectric-function-and-spectrophotometry-from-bulk-to-nanostructures/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5837-the-nascent-project/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5838-microcrystalline-silicon-p-i-n-photodetectors-for-telecommunications-and/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5839-low-cost-chip-integrable-silicon-based-all-optical-infrared-light-micromodulator/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/5840-carrier-confinement-in-a-si1-xnx-h-multilayer-structures-for-increased-light/2022-03-15T17:30:57+00:00https://www.imm.cnr.it/pubblicazioni/5841-acerca-del-arte-argentino-de-los-90-y-la-politica-de-izquierdas/2021-03-10T21:24:47+00:00https://www.imm.cnr.it/pubblicazioni/5842-boron-and-phosphorus-ion-implantation-in-a-sixc1xh-thin-films/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5843-optimization-of-optoelectronic-properties-of-a-sic-h-films/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5844-excimer-laser-amorphous-silicon-film-crystallization-a-study-of-time-resolved/2021-03-10T21:24:43+00:00https://www.imm.cnr.it/pubblicazioni/5845-a-new-ellipsometric-programme-applied-to-the-characterization-of-transparent/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5848-analytical-expression-for-the-imaginary-part-of-the-dielectric-constant-of/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/5851-study-of-in-gap-defects-in-intrinsic-and-b-doped-a-si1-xcx-h-by-photo-induced/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/5852-silicon-nanograins-with-aluminum-contacts-studied-by-the-density-functional/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/5853-amorphous-silicon-based-active-photonic-devices/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5854-amorphous-silicon-thin-film-for-all-optical-micromodulator/2021-03-10T21:24:48+00:00https://www.imm.cnr.it/pubblicazioni/5855-low-cost-vlsi-compatible-resonant-cavity-enhanced-pin-in-micron-si-operating-at/2021-03-10T21:24:55+00:00https://www.imm.cnr.it/pubblicazioni/5856-high-quality-a-sic-h-films-and-their-application-in-pin-structures-for/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5857-study-of-amorphous-hydrogenated-silicon-nitrogen-alloys-for-photovoltaic/2023-03-16T18:40:37+00:00https://www.imm.cnr.it/pubblicazioni/5858-light-scattering-by-acoustic-phonons-in-unhydrogenated-and-hydrogenated/2021-03-10T21:24:43+00:00https://www.imm.cnr.it/pubblicazioni/5859-parameters-affecting-the-performance-of-silicon-solar-cells-obtained-by-laser/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5861-novel-back-reflector-architecture-with-nanoparticle-based-buried-light/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/5864-high-bandgap-silicon-nanocrystal-solar-cells-device-fabrication/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5865-heterojunction-solar-cells-on-multi-crystalline-silicon-surface-treatments/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5866-electro-optical-modulating-multistack-device-based-on-the-cmos-compatible/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5867-in-this-paper-we-report-results-on-a-field-effect-induced-light-modulation-at-1/2018-11-19T13:12:45+00:00https://www.imm.cnr.it/pubblicazioni/5868-design-fabrication-and-characterization-of-an-a-si-h-a-sicn-multistack/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5869-design-fabrication-and-characterization-of-an-si-h-sicn-multistack-waveguide/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/5870-design-fabrication-and-characterization-of-an-si-h-sicn-waveguide-multistack/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5872-nanotechnologies-applied-to-high-energy-physics-detectors/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5873-amorphous-silicon-thin-film-for-all-optical-micromodulator-5116-113/2018-11-19T13:12:44+00:00https://www.imm.cnr.it/pubblicazioni/5874-structural-mechanical-thermodynamic-and-optical-properties-of-condensed-matter/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5875-celle-fotovoltaiche-di-alta-efficienza-a-eterogiunzione-silicio-amorfo/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5876-photoluminescence-and-electroluminescence-properties-of-a-sin-h-based/2023-10-18T10:11:19+00:00https://www.imm.cnr.it/pubblicazioni/5877-hall-effect-and-sign-properties-in-hydrogenated-amorphous-and-disordered/2021-03-10T21:24:50+00:00https://www.imm.cnr.it/pubblicazioni/5878-recent-improvements-on-a-sic-h-films-deposited-by-uhv-pecvd/2023-07-19T10:10:58+00:00https://www.imm.cnr.it/pubblicazioni/5879-the-influence-of-hydrogen-dilution-on-the-optoelectronic-and-structural/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/5880-photoluminescence-and-photothermal-deflection-spectroscopy-in-potassium-doped-a/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5881-effects-of-ion-implantation-of-boron-and-phosphorus-in-a-sic-h-thin-films/2023-10-18T10:10:10+00:00https://www.imm.cnr.it/pubblicazioni/5882-effect-of-boron-and-phosphorus-ion-implantation-on-a-sixc1-x-h-thin-films/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5883-potassium-ion-implantation-doping-of-the-n-layer-for-pin-amorphous-silicon/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5884-electrical-doping-profiles-on-texturized-surfaces/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5885-2008-5th-ieee-international-conference-on-group-iv-photonics-gfp/2017-06-15T08:13:19+00:00https://www.imm.cnr.it/pubblicazioni/5886-author/2018-11-19T13:12:48+00:00https://www.imm.cnr.it/pubblicazioni/5887-cnr-imm-istituto-per-la-microelettronica-ei-microsistemi-bologna-cnr-imm/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5888-17th-european-photovoltaic-solar-energy-conference-munich-germany-22-26-october/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/5889-surface-passivation-of-multi-si-for-heterojunction-solar-cells/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/5890-aim/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/5891-drawbacks-to-using-nist-electromigration-test-structures-to-test-bamboo-metal/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5892-resistance-changes-due-to-cu-transport-and-precipitation-during/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5893-resistance-decay-after-electromigration-as-the-effect-of-mechanical-stress/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/5894-activation-energy-in-the-early-stage-of-electromigration-in-al-1-si-tin-ti/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5895-theory-and-design-of-an-integrated-optical-sensor-based/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/5896-the-evaluation-of-the-true-test-temperature-during-wafer-level-electromigration/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5898-a-fully-integrated-mach-zehnder-microinterferometer-on-lithium-niobate-as-an/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5899-theory-and-design-of-an-integrated-optical-sensor-based-gg-g-ggggggs0-gggglgl/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5900-an-electronic-nose-based-on-solid-state-sensor-arrays-for-low-cost-indoor-air/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5902-selectivity-enhancement-of-metal-oxide-gas-sensors-using-a-micromachined-gas/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5903-thermal-characterization-of-a-microheater-for-micromachined-gas-sensors/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5904-thin-film-gas-sensor-implemented-on-a-low-power-consumption-micromachined/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5905-permeated-porous-silicon-for-hydrocarbon-sensor-fabrication/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5906-gas-sensors-for-air-quality-monitoring-realisation-and-characterisation-of/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5908-a-smart-sensor-system-for-carbon-monoxide-detection/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/5909-a-simple-interface-circuit-for-micromachined-gas-sensors/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5910-tem-characterisation-of-porous-silicon/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/5911-thick-oxidised-porous-silicon-layer-as-a-thermo-insulating-membrane-for-high/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5912-a-resistometric-method-to-characterize-electromigration-at-the-wafer-level/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5913-new-materials-and-heater-geometry-for-high-performance-micromachined-thermally/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/5914-porous-silicon-layer-permeated-with-sn-v-mixed-oxides-for-hydrocarbon-sensor/2021-03-11T23:17:10+00:00https://www.imm.cnr.it/pubblicazioni/5916-permeated-porous-silicon-suspended-membrane-as-sub-ppm-benzene-sensor-for-air/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5918-characterization-of-an-embedded-micro-heater-for-gas-sensors-applications/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5919-micromachined-gas-sensors-for-environmental-pollutants/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5922-fast-pulsed-temperature-mode-operation-a-viable-way-to-improve-the-sensitivity/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5928-a-low-cost-distributed-measurement-system-based-on-gas-smart-sensors-for/2021-04-25T08:00:40+00:00https://www.imm.cnr.it/pubblicazioni/5929-a-micromachined-gas-chromatographic-column-to-optimize-the-gas-selectivity-for/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/5930-accurate-extraction-of-the-temperature-of-the-heating-element-in-micromachined/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/5933-thermal-conductivity-detector-for-gas-chromatography-acquisition-system-and/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5934-measurements-fem-simulation-and-spice-modeling-of-a-thermal-conductivity/2021-04-25T08:00:33+00:00https://www.imm.cnr.it/pubblicazioni/5935-a-novel-gas-sensor-for-hydrocarbons-detection-based-on-porous-silicon-permeated/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5936-thick-oxidized-porous-silicon-layer-as-thermo-insulating-material-for-high/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/5939-a-smart-gas-sensor-for-environmental-monitoring-compliant-with-the-ieee-1451/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5940-low-power-sensor-front-end-electronics-with-rfid-communication-capabilities-for/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/5941-accurate-analytical-thermal-model-of-the-heating-element-in-micromachined-gas/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/5942-trace-benzene-monitoring-in-the-outdoor-air-comparative-results-between/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5943-nano-crystalline-sno-2-thin-films-deposited-by-pulsed-laser-ablation/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5946-a-low-cost-transportable-instrument-based-on-microsystem-technologies-for/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/5947-integration-of-gas-sensors-in-flexible-circuits-towards-a-flexible-tag-microlab/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5948-chapter-9-unipolar-and-bipolar-devices-9-2-unipolar-devices-the-role-of-the-ion/2021-10-14T09:47:59+00:00https://www.imm.cnr.it/pubblicazioni/5950-highly-doped-implanted-pn-junction-for-sic-zener-diode-fabrication/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5951-microcontroller-based-interface-circuit-for-metal-oxide-gas-sensors/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/5952-a-unified-approach-to-compact-modeling-of-power-and-logic-devices-in-low-cost/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/5954-a-new-sensitive-and-fast-detection-system-for-amphetamine-type-stimulants-ats/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5955-c-corsi-n-liberatore-s-mengali-a-mercuri-r-viola-d-zintu/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5956-use-of-cavitands-as-selective-adsorbing-materials-in-gc-like-air-quality/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5957-multi-spectral-infrared-system-for-toxic-gas-detection/2021-04-23T18:00:32+00:00https://www.imm.cnr.it/pubblicazioni/5958-ultra-low-power-electronics-and-devices-for-a-multisensing-rfid-tag-6589-21/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5959-selective-monitoring-of-indoor-voc-at-ppb-level/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/5960-use-of-effective-thermal-parameters-for-the-characterization-of-sensor/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/5961-sub-ppm-level-indoor-air-quality-monitoring-the-clean-air-project/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/5962-driver-design-optimization-in-inkjet-printing/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/5963-driver-design-optimization-in-inkjet-printing-technology/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/5964-part-2-chapter-5-processing-of-sic-5-1-ion-implantation-a-comparative-study-of/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/5965-fast-pulsed-temperature-mode-of-the-sensor-operation-to-reduce-the-power/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/5966-brailsford-ad-93/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/5967-novel-gas-sensor-device-based-on-thin-moo-sub-3-film-and-low-power-consumption/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/5968-sensor-array-and-sigma-delta-converters-for-carbon-monoxide-monitoring/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/5969-defense-security-toward-street-detection-of-amphetamines/2020-01-13T23:29:52+00:00https://www.imm.cnr.it/pubblicazioni/5970-abdelsalam-me-600-ahn-i-73-ahn-j-159-akin-t-336/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/5971-forward-current-of-al-implanted-4h-sic-diodes-a-study-on-periphery-and-area/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5972-invited-4h-sic-ion-implanted-bipolar-junctions-relevance-of-the-1950-c/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/5973-al-implanted-vertical-4h-sic-p-i-n-diodes-experimental-and-simulated-forward/2026-07-17T23:16:10+00:00https://www.imm.cnr.it/pubblicazioni/5974-structural-and-functional-characterizations-of-al-implanted-4h-sic-layers-and/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5975-dlts-study-on-ion-implanted-and-1950-c-annealed-p-in-4h-sic-vertical-diodes/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/5976-effects-of-heating-ramp-rates-on-the-characteristics-of-al-implanted-4h-sic/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/5977-structural-optical-and-electrical-properties-of-silicon-nanocrystals-embedded/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/5978-silicon-nanocrystals-from-hightemperature-annealing-characterization-on-device/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/5979-systematic-characterization-of-silicon-nanodot-absorption-for-third-generation/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/5980-optical-properties-of-silicon-nanodots-in-sic-matrix/2021-03-15T17:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5981-defect-engineering-via-ion-implantation-to-control-b-diffusion-in-si/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5983-trapping-of-metallic-impurities-in-multicrystalline-silicon-wafers/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/5984-roles-of-local-he-concentration-and-si-sample-orientation-on-cavity-growth-in/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5985-cavities-at-the-si-projected-range-by-high-dose-and-energy-si-ion-implantation/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/5987-ion-implantation-a-method-of-producing-low-k-silicon-oxide-based-materials/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/5988-phosphorus-ion-implantation-in-sic-influence-of-the-annealing-conditions-on/2021-03-10T21:24:46+00:00https://www.imm.cnr.it/pubblicazioni/5989-silicon-quantum-dots-in-photovoltaic-devices-device-fabrication/2017-06-15T08:13:17+00:00https://www.imm.cnr.it/pubblicazioni/5990-nature-of-disorder-in-the-ordered-double-perovskite/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/5991-self-organization-of-functional-materials-in-confinement/2021-03-10T21:24:46+00:00https://www.imm.cnr.it/pubblicazioni/5992-nanopatterned-copt-alloys-with-perpendicular-magnetic-anisotropy/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/5993-multi-modal-sensing-in-spin-crossover-compounds/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5994-mechanical-and-optical-properties-of-ultralarge-flakes-of-a-metal-organic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5995-fept-films-on-self-assembled-particle-arrays/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/5996-quantitative-analysis-of-scanning-tunneling-microscopy-images-of-mixed-ligand/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5997-a-multifunctional-polymer-graphene-thin-film-transistor-with-tunable-transport/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/5998-structural-origin-of-perpendicular-magnetic-anisotropy-in-epitaxial/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/5999-growth-structure-and-magnetic-properties-of-fept-nanostructures-on-nacl-001-and/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6000-nonepitaxially-grown-nanopatterned-co-pt-alloys-with-out-of-plane-magnetic/2021-04-23T18:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6001-growth-temperature-effect-on-the-structure-of-copt-islands-on-nacl-001-studied/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6002-copt-alloy-grown-on-the-wse2-0-0-0-1-van-der-waals-surface/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6003-electronic-topological-transition-in-zinc-under-pressure-an-x-ray-absorption/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6004-morphology-of-epitaxial-magnetic-alloy-nanostructures-grown-on-wse2-0001/2021-04-25T08:00:36+00:00https://www.imm.cnr.it/pubblicazioni/6005-optical-input-electrical-output-memory-elements-based-on-a-liquid-crystalline/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6006-properties-of-ultra-thin-vanadium-layers-in-v-ru-superlattices/2021-04-25T08:00:36+00:00https://www.imm.cnr.it/pubblicazioni/6007-zirconia-toughened-alumina-coatings-realised-by-means-of-pulsed-plasma/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/6009-the-dramatic-effect-of-the-annealing-temperature-and-dielectric/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6010-local-structure-and-magneto-transport-in-sr2femoo6-oxides/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6011-fastresponse-photonic-device-based-on-organiccrystal-heterojunctions-assembled/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6013-charge-transfer-and-percolation-in-c60-pentacene-fieldeffect-transistors/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6014-multifunctional-ceramic-thin-films-for-high-performance-orthopaedic-implants/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6015-morphologie-de-nanostructures-dalliages-magnetiques-determinee-par-diffusion-de/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6016-arcadia/2018-11-19T13:12:47+00:00https://www.imm.cnr.it/pubblicazioni/6017-nanostructures-magnetiques-auto-assemblees-sur-des-surfaces-a-faible-energie/2021-03-10T21:24:52+00:00https://www.imm.cnr.it/pubblicazioni/6018-structural-origin-of-magnetic-anisotropy-in-copt3-111-epitaxial-nanostructured/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6019-nanostructures-de-copt3-epitaxiees-sur-wse2-0001-et-nacl-001/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6020-copt-alloy-films-on-sio2-nanoparticle-arrays/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6021-nanostructures-dalliages-auto-assemblees-sur-des-surfaces-de-faible-energie-et/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6022-a-green-approach-to-copper-containing-pesticides-antimicrobial-and-antifungal/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6023-self-assembled-magnetic-nanostructures-on-low-energy-surfaces/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6024-structural-and-magnetic-characterization-of-fept-films-deposited-on-sio2/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6025-gisaxs-on-alloy-nanostructures-grown-by-quasi-van-der-waals-epitaxy/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/6026-fept-thin-films-deposited-onto-sio2-particles/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6028-local-structure-and-magnetotransport-in-sr2femoo6-double-perovskite-compounds/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/6029-electronic-supplementary-information/2018-11-19T13:12:48+00:00https://www.imm.cnr.it/pubblicazioni/6030-effect-of-low-dose-high-energy-o3-implantation-on-refractive-index-and-linear/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6031-defects-introduced-in-silicon-wafers-during-rapid-isothermal-annealing/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6032-titanium-silicide-formation-effect-of-oxygen-distribution-in-the-metal-film/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6033-damage-effects-produced-in-the-near-surface-region-of-x-cut-linbo3-by-low-dose/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6034-growth-and-structure-of-titanium-silicide-phases-formed-by-thin-ti-films-on-si/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6035-determination-of-he-electronic-energy-loss-in-crystalline-si-by-monte-carlo/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6036-epr-of-laser-annealed-ion-implanted-silicon/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/6037-titanium-and-nickel-silicide-formation-after-qswitched-laser-and-multiscanning/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6038-analysis-of-thermal-stresses-induced-in-silicon-during-xenon-arc-lamp-flash/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6039-transmission-energy-loss-of-light-channeled-particles-in-thin-silicon-single/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6040-integrated-mach-zehnder-micro-interferometer-on-linbo3/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6041-on-the-dynamics-of-the-damage-growth-in-5-mev-oxygen-implanted-lithium-niobate/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6042-multiscanning-electron-beam-annealing-of-phosphorusimplanted-silicon/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6043-matrix-atomic-losses-and-oxygen-incorporation-under-ruby-laser-irradiation-of/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6044-pulsed-laser-irradiation-of-gaas-under-oxygen-and-silane-atmosphere/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6045-laser-annealing-of-damaged-silicon-covered-with-a-metal-film-test-for-epitaxial/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6046-the-thermal-oxidation-of-ion-implanted-zirconium/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6047-channeled-and-random-proton-stopping-power-in-the-30-1000-kev-energy-range/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6048-axial-to-planar-channeling-transition/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6049-energy-loss-of-h-d-and-ions-channeled-through-thin-single-crystals-of-silicon/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6050-step-index-optical-waveguide-produced-by-multi-step-ion-implantation-in-linbo3/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6051-twostage-laser-annealing-of-lattice-disorder-in-phosphorus-implanted-silicon/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6053-multiple-scattering-of-mev-light-ions-through-thin-amorphous-anodic-si-o-2/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6054-thermal-profiles-and-thermal-stresses-introduced-on-silicon-during-scanning/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6055-fabrication-of-smooth-ridge-optical-waveguides-in-linbo-3-by-ion-implantation/2019-07-04T16:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6057-analysis-of-boron-predeposited-silicon-wafers-by-combined-ion-beam-techniques/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6058-analysis-of-surface-layers-by-the-channeling-technique-beam-energy-dependence/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6059-annealing-of-phosphorus-implanted-silicon-wafers-by-multiscanning-electron-beam/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6060-channeling-flux-in-single-crystals-with-interstitial-atoms-impurity/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6061-effect-of-oxygen-pressure-on-oxygen-incorporation-in-si-and-ga-as-during-q/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6065-random-and-channeling-stopping-power-of-nitrogen-in-silicon-in-the-700-1500-kev/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6066-laser-doping-of-silicon-role-of-the-surface-status-in-the-incorporation/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6067-comparative-analysis-of-extended-defect-depth-profiles-in-silicon-by-rutherford/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6070-transient-annealing-as-a-tool-for-the-investigation-of-thinfilm-substrate/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6071-silicon-loss-during-tisi2-formation/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6072-charge-states-distribution-of-0-16-3-3-mev-he-ions-transmitted-through-silicon/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6073-energy-loss-and-equilibrium-charge-distribution-of-nitrogen-ions-transmitted/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6074-ion-implantation-of-silicon-in-gallium-arsenide-damage-and-annealing/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6075-transmission-energy-loss-of-light-channeled-particles-in-thin-silicon-crystals/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6077-a-new-miniaturised-optical-system-for-chemical-species-spectroscopic-detection/2021-04-25T08:00:38+00:00https://www.imm.cnr.it/pubblicazioni/6078-solid-state-annealing-of-ion-implanted-silicon-by-incoherent-light-pulses-and/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6079-feeding-in-and-blocking-processes-of-mev-protons-transmitted-through-silicon/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6080-new-aspects-of-axial-to-planar-channeling-transition-in-a-noncubic-compound/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6081-temperature-dependence-of-planar-channeling-in-transmission-experiments/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6083-monolithic-silicon-based-microthruster-for-orbital-and-attitude-control/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6084-charge-states-distribution-of-3350-kev-he-ions-channeled-in-silicon/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6087-channeling-energy-loss-of-he2-in-si-by-transmission-and-back-scattering/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6088-depth-profiles-and-damage-annealing-of-1-06-mev-as2-implanted-in-silicon/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6089-pulsed-laser-doping-of-semiconductors-modelling-and-experimental-results/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6090-native-oxides-behavior-during-pulsed-laser-irradiation-of-gaas/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6091-unanalyzed-ion-implantation-procedure-with-incoherent-light-scanning-annealing/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6092-influence-of-hydrogen-content-on-the-relaxation-spectrum-of-titanium/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6093-in-situ-growth-of-y-ba-cu-o-films-by-laser-deposition/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6094-dielectric-layers-in-semiconductors-novel-techniques-and-devices-june-17th-20th/2017-09-11T08:13:37+00:00https://www.imm.cnr.it/pubblicazioni/6095-surface-oxidation-induced-by-laser-irradiation-in-semiconductors/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6096-oxygen-influence-on-titanium-silicide-formation/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6097-ion-implanted-induced-giant-gettering-of-gold-in-silicon/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6098-applications-of-transient-annealing-to-solar-cell-processing/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6099-a-new-mechanical-device-for-small-angle-etching-in-an-edwards-ibma-1-apparatus/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/6100-detection-of-ultrasoft-xrays-with-a-variable-geometry-proportional-counter/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6101-preparation-and-characterization-of-au-sio2-radio-frequency-co-sputtered-thin/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6102-transmission-energy-loss-of-protons-channeled-in-thin-silicon-single-crystals/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6103-topological-phases-in-two-legged-heisenberg-ladders-with-alternating/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6104-integrated-optical-microsystems-for-interferometric-analytics/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6106-monolithic-fully-integrated-programmable-micro-diffraction-grating-based-on/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/6107-photoinduced-reflectivity-oscillation-in-linbo3-crystals-irradiated-by-a-krf/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6108-photonic-micro-and-sub-micro-structures-in-linbo3-crystals/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6109-integrated-mach-zehnder-micro-interferometer-for-gas-trace-remote-sensing-ei/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/6110-photonic-micro-and-sub-micro-structures-in-linbo3-crystals-art-no-60291j/2017-06-15T08:13:16+00:00https://www.imm.cnr.it/pubblicazioni/6111-photonic-micro-and-sub-micro-structures-in-linbo3-crystals-ei-conference/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/6113-photonic-micro-and-sub-micro-structures-in-linbo-3-crystals-6029-55/2022-03-15T17:29:58+00:00https://www.imm.cnr.it/pubblicazioni/6116-scattering-stopping-and-related-processes/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/6117-point-defects-induced-in-silicon-during-excimer-laser-doping-in-bcl3-and-pcl3/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6118-epm89-energy-pulse-and-particle-beam-modification-of-materials-3-rd/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6119-depth-profiles-and-damage-annealing-of-1-06-mev-as-super-2-implanted-in-silicon/2018-11-19T13:12:45+00:00https://www.imm.cnr.it/pubblicazioni/6120-depth-proles-and-damage-annealing-of-l-06-mev-as2-implanted-in-silicon/2018-11-19T13:12:49+00:00https://www.imm.cnr.it/pubblicazioni/6121-th-anu-structure-of-titaniym-suicide-phases-formed-by-ti-films-on-si-crystals/2019-03-02T13:12:38+00:00https://www.imm.cnr.it/pubblicazioni/6122-laser-and-multiscanning-e-beam/2024-11-05T14:05:30+00:00https://www.imm.cnr.it/pubblicazioni/6123-analysis-of-temperature-and-stress-profiles-induced-by-a-cw-line-scanned/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6124-bentini-et-al-respond/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6125-study-of-titanium-and-nickel-silicide-formation-by-q-switched-laser-and/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6126-thermal-0xidati0n-0f-ion-implanted-p0lycrystalline-zirc0nium/2020-01-09T23:34:18+00:00https://www.imm.cnr.it/pubblicazioni/6127-characterization-of-implanted-layers-after-laser-and-electron-beam-annealing/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6129-effect-of-laser-irradiation-on-the-characteristics-of-implanted-layers-for/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6131-chemical-characterization-of-silicon-using-analytic-devices/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6132-higher-than-100-shoulders-in-axial-to-planar-channeling-transition-in-al-2-o-3/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/6133-axial-and-planar-channeling-in-tiox-system/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6134-study-of-the-channeling-flux-in-single-crystals-with-interstitial-atoms/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6135-impiantazione-ionica-cnr-laboratorio-di-chimica-e-tecnologia-dei-materiali-e/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6136-axial-and-planar-channeling-in-tio-sub-x-system/2020-12-18T23:24:00+00:00https://www.imm.cnr.it/pubblicazioni/6137-energy-dependence-of-the-surface-minimum-yield-for-axial-channeling/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6138-surface-peak-in-channeling-experiments-energy-dependence/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6139-energy-dependence-of-the-surface-minimum-yield-for-axial-channeling-g-della-mea/2020-12-17T23:18:34+00:00https://www.imm.cnr.it/pubblicazioni/6140-transmission-energy-loss-of-light-channeled-particles-in-thin-silicon-single/2017-03-28T13:13:19+00:00https://www.imm.cnr.it/pubblicazioni/6141-effects-of-h-content-on-the-properties-of-ti/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6142-effects-of-hydrogen-content-on-some-properties-of-titanium/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6143-a-reply-to-the-comment-by-f-povolo-on-the-influence-of-h-content-on-the/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6144-monolithic-silicon-based-microthruster-for-orbital-and-attitude-control/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6145-depth-profiles-and-damage-annealing-of-1-06-mev-as2-implanted-in-silicon-paper/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/6146-silicon-i-ss-dyeing-tisit-formation/2019-03-02T13:12:40+00:00https://www.imm.cnr.it/pubblicazioni/6147-micro-electro-optical-systems-meos-for-a-new-generation-of-ultra-small/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6148-fich-o-ja-golovchenko-ko-nielsen-e-uggerhoj-c-vrast-thomsen-g-charpak-s-majewski/2017-09-11T08:13:37+00:00https://www.imm.cnr.it/pubblicazioni/6149-cnr-istituto-lamel-via-castagnoli-bozognu-italy/2019-03-02T13:12:38+00:00https://www.imm.cnr.it/pubblicazioni/6151-photoinduced-electron-transfer-quenching-of-luminescent-silicon-nanocrystals-as/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6152-graphene-and-semicondutor-or-metallic-nanoparticles-for-energy-conversion/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6153-dopant-and-carrier-concentration-in-si-in-equilibrium-with-monoclinic-sip/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6154-precipitation-aggregation-and-diffusion-in-heavily-arsenic-doped-silicon/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6155-electrical-activity-and-structural-evolution-correlations-in-laser-and/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6156-wet-adsorption-of-a-luminescent-euiii-complex-on-carbon-nanotubes-sidewalls/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6157-influence-of-electron-beam-parameters-on-the-radiation-induced-formation-of/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6158-investigation-on-indium-diffusion-in-silicon/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6159-extended-x-ray-absorption-fine-structure-study-of-the-local-atomic-structure-in/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6160-arsenic-uphill-diffusion-during-shallow-junction-formation/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6162-diamond-hexagonal-silicon-phase-and-113-defects-energy-calculations-and-new/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6163-activation-of-porous-silicon-layers-using-zn2sio4-mn2-phosphor-particles/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/6164-monte-carlo-simulation-of-elastic-and-inelastic-scattering-of-electrons-in-thin/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6165-electron-microscopy-characterization-of-monoclinic-sias-precipitates-in-heavily/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6166-a-luminescent-host-guest-hybrid-between-a-euiii-complex-and-mwcnts/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6167-backscattering-spectrometry-and-ion-channeling-studies-of-heavily-implanted-as/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6168-high-resolution-medium-energy-ion-scattering-analysis-for-the-quantitative/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6169-diffusion-and-activation-of-ultrashallow-b-implants-in-silicon-on-insulator-end/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6170-thick-porous-silicon-thermo-insulating-membranes/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6171-boron-deactivation-in-preamorphized-silicon-on-insulator-efficiency-of-the/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6172-characterisation-of-freeze-dried-porous-silicon/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6173-damage-profiles-in-high-energy-as-implanted-si/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6174-porous-silicon-in-high-efficiency-large-area-solar-cells/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/6175-laser-induced-graphitization-of-fullerite/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/6176-investigation-of-the-non-radiative-processes-in-porous-silicon/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6177-high-temperature-thermal-evolution-of-sias-precipitates-in-silicon/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6178-recombination-at-dislocations-associated-with-oxygen-precipitation/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6179-structural-and-optical-properties-of-oxidized-porous-silicon-layers-activated/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6181-tem-and-photoluminescence-characterization-of-porous-silicon-layers-from/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6182-silicon-carbide-nanocrystals-growth-on-si-1-0-0-and-si-1-1-1-from-a-chemisorbed/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6183-contrast-of-small-six-particles-in-silicon-by-computed-hrem-images/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6185-structural-and-electrical-studies-of-ultrathin-layers-with-si0-7ge0-3/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6186-structural-characterization-and-modeling-of-damage-accumulation-in-in-implanted/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6188-structural-and-electronic-properties-of-znse-alas-heterostructures/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6189-low-dimensional-porous-silicon-superlattices/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6190-synthesis-of-carbon-nano-and-meso-structures-by-laser-induced-coalescence-of/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6191-photochemical-and-thermal-effects-in-laser-irradiated-fullerite-from-periodic/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6192-on-the-formation-of-an-interface-amorphous-layer-in-nanostructured/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6193-multi-technique-characterization-of-arsenic-ultra-shallow-junctions-in-silicon/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6194-computer-simulation-of-high-resolution-electron-microscopy-images-of-small/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6197-excitonic-properties-and-band-alignment-in-lattice-matched-zncdse-znmgse/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6198-znse-cdte-znse-heterostructures/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6199-porous-silicon-nanocracking/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6200-on-the-visibility-of-small-sias-particles-in-silicon-by-hrem/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6202-comment-on-luminescent-nanoring-structures-on-silicon/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/6203-sensitivity-and-selectivity-enhancement-in-wo3-and-cr2-xtixo3-thin-films/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6207-electrical-and-structural-properties-of-ultrathin-sion-films-on-si-prepared-by/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6209-structural-and-analytical-characterization-by-scanning-transmission-electron/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6210-the-belphi-soi-technology/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/6211-superlattices-as-characterisation-tool-for-the-beginning-of-ps-formation/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6213-analysis-of-light-elements-in-superposed-layers-by-monte-carlo-simulation-of/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6216-a-luminescent-host-guest-hybrid-of-a-eu-iii-complex-and-mwcnts/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6217-microelectronic-nanoelectronic-devices-electrical-and-structural-properties-of/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6219-ecs-transactions/2017-06-15T08:13:19+00:00https://www.imm.cnr.it/pubblicazioni/6221-formation-during-uhv-annealing-and-structure-of-si-sic-nanostructures-on/2019-03-02T13:12:37+00:00https://www.imm.cnr.it/pubblicazioni/6223-articles-semiconductors-ii-surfaces-interfaces-microstructures-and-related/2017-06-15T08:13:16+00:00https://www.imm.cnr.it/pubblicazioni/6224-papers-from-the-27th-conference-on-the-physics-and-chemistry-of-semiconductor/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6225-hrem-characterization-of-carbon-onions-produced-by-in-situ-electron-irradiation/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/6226-dopant-and-carrier-concentration-in-silicon-in-equilibrium-with-sip-precipitates/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6227-recent-findings-in-silicon-doping-with-phosphorous/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6228-diamond-hexagonal-silicon-phase-and-113-defects/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6229-relation-between-the-local-structure-and-the-desactivation-of-as-heavily/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6230-a-new-form-of-self-interstitial-precipitation-in-silicon-the-113-zig-zag-defects/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6231-a-simple-computer-program-to-obtain-digital-pseudocolored-high-resolution/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6232-si1-x-gex-nanocrystals-based-flash-memory/2019-03-02T13:12:36+00:00https://www.imm.cnr.it/pubblicazioni/6233-znseocdteoznse-heterostructures/2019-03-02T13:12:35+00:00https://www.imm.cnr.it/pubblicazioni/6234-diamond-hexagonal-silicon-phase-and-113-defects/2018-06-07T08:16:28+00:00https://www.imm.cnr.it/pubblicazioni/6242-surface-study-of-thin-film-gas-sensors-on-a-si-micro-machined-substrate/2021-03-10T21:24:45+00:00https://www.imm.cnr.it/pubblicazioni/6244-application-of-a-membrane-reactor-and-an-ultra-short-packed-gas-chromatographic/2021-03-10T21:24:48+00:00https://www.imm.cnr.it/pubblicazioni/6247-in-search-of-the-ultimate-benzene-sensor-the-etqxbox-solution/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6249-detection-of-olfactory-traces-by-orthogonal-gas-identification-technologies/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6251-rfid-reader-with-gas-sensing-capability-for-monitoring-fruit-along-the-logistic/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6252-the-clean-air-project/2021-03-10T21:24:43+00:00https://www.imm.cnr.it/pubblicazioni/6253-effect-of-preparation-procedures-on-long-term-performance-of-sno2-thin-film/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6254-multisensor-array-and-pattern-recognition-techniques-for-characterization-of/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6255-multisensor-array-and-pattern-recognition-techniques-for-characterization-of/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6256-www-rsc-org-chemcomm-number-27-19-july-2007-pages-2761-2884/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6257-nucleationgoverned-reversible-selfassembly-of-an-organic-semiconductor-at/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6259-solid-state-conformation-molecular-packing-and-electrical-and-optical/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/6260-multiscale-self-organization-of-the-organic-semiconductor-quinquethiophene/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6261-liquidcrystalline-rigidcore-semiconductor-oligothiophenes-influence-of/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6263-planar-silicon-spads-with-200-m-diameter-and-35-ps-photon-timing-resolution/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6264-thiophene-benzothiadiazole-cooligomers-synthesis-optoelectronic-properties/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6265-large-area-low-jitter-silicon-single-photon-avalanche-diodes/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6266-large-area-avalanche-diodes-for-picosecond-time-correlated-photon-counting/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6267-new-silicon-spad-technology-for-enhanced-red-sensitivity-high-resolution-timing/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6268-structural-and-electrical-characterization-of-processable-bis-silylated/2021-03-10T21:24:50+00:00https://www.imm.cnr.it/pubblicazioni/6269-monolithic-silicon-matrix-detector-with-50-m-photon-counting-pixels/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6273-resonant-cavity-enhanced-single-photon-avalanche-diodes-on-reflecting-silicon/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6274-high-rate-photon-counting-and-picosecond-timing-with-silicon-spad-based-compact/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6275-photon-counting-arrays-for-astrophysics/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6279-thermal-characterisation-of-porous-silicon-membranes/2021-03-10T21:24:48+00:00https://www.imm.cnr.it/pubblicazioni/6280-planar-silicon-spads-with-improved-photon-detection-efficiency/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6282-codiffusion-of-arsenic-and-phosphorus-implanted-in-silicon/2021-03-10T21:24:45+00:00https://www.imm.cnr.it/pubblicazioni/6283-high-detection-efficiency-and-picosecond-timing-compact-detector-modules-with/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6284-resonant-cavity-enhanced-single-photon-avalanche-diodes-on-double-silicon-on/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6285-a-6x-8-photon-counting-array-detector-system-for-fast-and-sensitive-analysis-of/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6286-thermo-insulated-microstructures-based-on-thick-porous-silicon-membranes/2021-03-10T21:24:44+00:00https://www.imm.cnr.it/pubblicazioni/6289-towards-picosecond-array-detector-for-single-photon-time-resolved-multispot/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6290-advanced-photon-counting-techniques-ii/2021-04-25T08:00:38+00:00https://www.imm.cnr.it/pubblicazioni/6291-a-48-pixel-array-of-single-photon-avalanche-diodes-for-multispot-single/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6292-monolithic-matrix-of-50m-silicon-spad-detectors/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/6294-planar-silicon-spads-with-improved-photon-detection-efficiency/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/6295-carrier-confinement-in-a-sixn1-x-h-multilayer-structures-for-increased-light/2018-06-07T08:16:28+00:00https://www.imm.cnr.it/pubblicazioni/6296-spada-an-array-of-spad-detectors-for-astrophysical-applications/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6297-photoacoustic-evaluation-of-the-thermal-properties-of-porous-silicon/2021-03-10T21:24:47+00:00https://www.imm.cnr.it/pubblicazioni/6299-silicon-single-photon-avalanche-diodes-situation-and-prospect/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6301-electrical-properties-of-thin-sio2-films-nitrided-in-n2o-by-rapid-thermal/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6302-a-novel-pd-sinxoy-hydrogen-sensor-of-high-stability-and-sensitivity/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/6303-resonant-cavity-enhanced-single-photon-avalanche-diodes/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/6304-university-of-roma-tor-vergata-dept-electronic-engineering/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6305-border-effects-in-gas-sensors-and-thermistors/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6306-silicon-single-photon-avalanche-diodes-for-quantum-key-distribution/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6307-large-area-low-jitter-silicon-single-photon-avalanche-diodes-invited-paper6900/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6308-cover-picture-liquidcrystalline-rigidcore-semiconductor-oligothiophenes/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6309-cover-picture-nucleationgoverned-reversible-selfassembly-of-an-organic/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6310-spada-an-array-of-spad-detectors-for-astrophysical-applications/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6311-applications-of-the-digital-holography-to-the-dynamic-characterization-of-mems/2023-07-18T11:42:42+00:00https://www.imm.cnr.it/pubblicazioni/6313-solid-solid-phase-transitions-inter-face-controlled-reactivity-and-forma-tion/2018-06-08T22:15:51+00:00https://www.imm.cnr.it/pubblicazioni/6314-thermoelectric-materials-in-mems-and-nems-a-review/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/6315-adaptive-k-nn-for-the-detection-of-air-pollutants-with-a-sensor-array/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6316-enhancement-of-the-power-factor-in-twophase-silicon-boron-nanocrystalline-alloys/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/6318-ultradense-silicon-nanowire-arrays-produced-via-top-down-planar-technology/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6319-robotic-intelligent-vision-and-control-for-tunnel-inspection-and-evaluation-the/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6320-fiber-optic-broadband-ultrasonic-probe-for-virtual-biopsy-technological/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6321-thermofluid-analysis-of-ultra-low-power-hotplates-for-a-mox-gas-sensing-device/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6322-a-packaging-technique-for-silicon-mems-strain-sensors-on-steel/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6323-industrially-scalable-process-for-silicon-nanowires-for-seebeck-generators/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6324-nanograin-effects-on-the-thermoelectric-properties-of-poly-si-nanowires/2021-04-25T08:00:40+00:00https://www.imm.cnr.it/pubblicazioni/6325-micro-measurement-and-monitoring-system-for-ageing-underground-infrastructure/2020-12-18T23:24:00+00:00https://www.imm.cnr.it/pubblicazioni/6326-cross-talk-simulation-in-cmos-micromachined-gas-sensors-with-electrothermal/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6327-ice-virtual-library-essential-engineering-knowledge/2018-07-25T22:15:00+00:00https://www.imm.cnr.it/pubblicazioni/6330-thermoelectric-properties-of-p-and-n-type-nanocrystalline-silicon-nanowires/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6331-3d-simulation-of-conjugate-heat-transfer-of-ulp-hotplates-for-a-mox-gas-sensing/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6333-ice-virtual-library-essential-engineering-knowledge/2017-03-28T13:14:34+00:00https://www.imm.cnr.it/pubblicazioni/6334-high-resolution-ultrasonic-images-by-miniaturized-fiber-optic-probe/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6336-lamel-cnr/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6337-robotic-system-with-intelligent-vision-for-tunnel-structural-assessment-system/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6339-the-nature-of-electrically-inactive-antimony-in-silicon/2021-03-10T21:24:42+00:00https://www.imm.cnr.it/pubblicazioni/6340-charge-transport-in-graphene-polythiophene-blends-as-studied-by-kelvin-probe/2021-05-01T00:20:22+00:00https://www.imm.cnr.it/pubblicazioni/6341-amorphous-silicon-carbide-crystalline-silicon-heterojunction-solar-cells-a/2021-03-10T21:24:50+00:00https://www.imm.cnr.it/pubblicazioni/6342-graphene-transistors-via-in-situ-voltage-induced-reduction-of-graphene-oxide/2021-05-17T10:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6345-effects-of-ni-catalyst-substrate-interaction-on-carbon-nanotubes-growth-by-cvd/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6347-a-novel-position-detector-based-on-nanotechnologies-the-nanochant-project/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6349-anomalous-distribution-of-as-during-implantation-in-silicon-under-selfannealing/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6350-19-efficient-thick-emitter-silicon-solar-cells/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6351-an-investigation-on-the-formation-of-suprathermal-electrons-in-a-b-min-ecr/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6353-optical-structural-and-electrical-properties-of-device-quality-a-si1-x-nx-h/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6354-annealing-behaviour-of-high-concentration-of-sn-and-sb-implanted-in-silicon/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/6355-modification-of-anisotropic-plasma-diffusion-via-auxiliary-electrons-emitted-by/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6356-field-emission-properties-of-carbon-nanotube-arrays-grown-in-porous-anodic/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6357-raman-amplifier-structure/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6359-electrical-and-structural-characterization-of-bf-2-self-annealed-implantation/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6360-directly-patterned-tio2-nanostructures-for-efficient-light-harvesting-in-thin/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6361-the-conductance-of-monoatomic-as-and-ag-chains-deposited-onto-silicon-steps/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6362-simulation-with-geant4-of-a-novel-position-detector-based-on-nanotechnologies/2019-07-04T16:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6363-chemical-vapor-deposition-of-carbon-nanotubes-on-iron-patterned-substrates/2018-11-19T13:12:46+00:00https://www.imm.cnr.it/pubblicazioni/6364-doping-of-amorphous-silicon-by-potassium-ion-implantation/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6365-injection-of-auxiliary-electrons-for-increasing-the-plasma-density-in-highly/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6366-rapid-fabrication-and-trimming-of-nanostructured-backside-reflectors-for/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/6367-effect-of-the-band-gap-of-the-window-layer-on-the-properties-of-silicon/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6368-hydrocarbon-molecules-deposited-onto-silicon-surfaces-a-dft-study-of-adsorption/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6369-hydrocarbon-molecules-deposited-onto-monolayer-steps-onto-si-1-0-0-a-study-of/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6370-the-conductance-of-monoatomic-as-and-ag-chains-deposited-onto-silicon-steps/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6371-hydrocarbon-molecules-deposited-onto-monolayer-steps-on-si-1-0-0-a-study-of/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6372-patterned-growth-of-carbon-nanotubes-synthesize-by-fe-catalyzed-chemical-vapour/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6373-study-of-an-industrial-fabrication-process-of-monocrystalline-silicon-solar/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6374-incoherent-light-annealing-of-high-dose-arsenic-implantation-in-silicon/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6376-metastable-phase-of-ion-implanted-antimony-in-silicon-by-incoherent-light/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6377-decomposition-kinetics-of-supersaturated-solid-solutions-in-ion-implanted/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6378-high-mobility-tungsten-doped-indium-oxide-as-transparent-electrode-material-for/2020-12-17T23:18:37+00:00https://www.imm.cnr.it/pubblicazioni/6379-the-cantes-experiment-a-carbon-nanotubes-based-electron-gun-to-improve-the/2017-09-11T08:13:37+00:00https://www.imm.cnr.it/pubblicazioni/6380-the-structural-electronic-and-transport-properties-of-monatomic-chains/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6381-influence-of-the-substrate-types-and-treatments-on-carbon-nanotube-growth-by/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6382-dependance-of-c-si-h-film-properties-on-hydrogen-dilution/2023-07-19T10:10:58+00:00https://www.imm.cnr.it/pubblicazioni/6384-roadmap-on-thermoelectricity/2023-07-19T10:11:09+00:00https://www.imm.cnr.it/pubblicazioni/6385-rapid-thermal-annealing-of-ion-implanted-sb-in-silicon/2017-06-15T08:13:18+00:00https://www.imm.cnr.it/pubblicazioni/6386-emitter-tailoring-in-ion-implanted-and-e-beam-annealed-silicon-solar-cells/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6387-field-emission-properties-of-carbon-nanotube-arrays-grown-in-porous-anodic/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6388-nanotubes-growth/2017-09-11T08:13:36+00:00https://www.imm.cnr.it/pubblicazioni/6389-enhancement-of-ecr-performances-by-means-of-carbon-nanotubes-based-electron-guns/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/6390-materials-processing-and-packaging-a-through-wafer-interconnect-in-silicon-for/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6391-graphene-foams-as-new-cathode-and-anode-materials-for-microbial-fuel-cells/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6392-transparent-conducting-graphene-electrodes-for-photovoltaic-applications/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6393-core-shell-strategy-leading-to-high-reversible-hydrogen-storage-capacity-for/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6394-destabilisation-of-complex-hydrides-through-size-effects/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/6395-nanoconfinement-of-borohydrides-in-cus-hollow-nanospheres-a-new-strategy/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6396-oxidation-of-4-substituted-tempo-derivatives-reveals-modifications-at-the-1-and/2021-04-23T18:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6397-synthesis-of-core-shell-nabh-4-m-m-co-cu-fe-ni-sn-nanoparticles-leading-to/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6399-synthesis-of-core-shell-nabh4-m-m-co-cu-fe-ni-sn-nanoparticles-leading-to/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6400-effect-of-size-on-the-hydrogen-storage-properties-of-complex-hydrides/2021-03-13T03:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6401-size-controlled-functional-graphene-foams-for-applications-in-energy-storage/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6402-long-distance-entanglement-in-spin-systems/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6403-qubit-teleportation-and-transfer-across-antiferromagnetic-spin-chains/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6404-local-measures-of-entanglement-and-critical-exponents-at-quantum-phase/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6405-single-site-entanglement-at-the-superconductor-insulator-transition-in-the/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/6406-on-c1-critical-phases-in-anisotropic-spin-1-chains/2017-09-11T08:13:36+00:00https://www.imm.cnr.it/pubblicazioni/6407-investigation-of-quantum-phase-transitions-using-multi-target-dmrg-methods/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/6408-incommmensurability-and-unconventional-superconductor-to-insulator-transition/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6409-part-1-brief-reports-biological-physics-triggering-synchronized-oscillations/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6410-phase-separation-and-pairing-regimes-in-the-one-dimensional-asymmetric-hubbard/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6411-bound-states-and-expansion-dynamics-of-interacting-bosons-on-a-one-dimensional/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6412-rapid-communications-fundamental-concepts-reduction-method-for-the-linear/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6413-stable-particles-in-anisotropic-spin-1-chains/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/6414-pairing-crystallization-and-string-correlations-of-mass-imbalanced-atomic/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6415-rapidly-converging-methods-for-the-location-of-quantum-critical-points-from/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6416-diversity-induced-synchronized-oscillations-in-close-to-threshold-excitable/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6417-detecting-determinism-in-high-dimensional-chaotic-systems/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6418-ab-initio-analysis-of-the-x-ray-absorption-spectrum-of-the-myoglobin-carbon/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6419-nanoscale-phase-separation-and-superconductivity-in-the-one-dimensional-hirsch/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6420-scaling-of-excitations-in-dimerized-and-frustrated-spin-1-2-chains/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6421-particle-content-of-the-nonlinear-sigma-model-with-a-term-a-lattice-model/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6422-effective-mapping-of-spin-1-chains-onto-integrable-fermionic-models-a-study-of/2021-04-23T18:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6423-quantum-states-of-an-oscillator-with-periodic-time-dependent-frequency-under/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6424-brane-parity-orders-in-the-insulating-state-of-hubbard-ladders/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6425-hidden-xy-structure-of-the-bond-charge-hubbard-model/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6426-role-of-transport-performance-for-neuron-cell-morphology/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6427-discriminating-dynamical-from-additive-noise-in-the-van-der-pol-oscillator/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6428-non-mott-metal-insulator-transition-from-hartree-fock-theory/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6429-part-a-rapid-communications-chaos-and-nonlinear-dynamical-systems-nonautonomous/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6430-instability-versus-nonlinearity-in-certain-nonautonomous-oscillators-a-critical/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6431-correlation-length-and-the-scaling-parameter-in-the-renormalization-group/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6432-effects-of-fluctuations-on-electrical-properties-of-gap-junction-connected/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/6433-finding-critical-points-using-improved-scaling-ansatze/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6434-fulde-ferrell-larkin-ovchinnikov-oscillations-and-magnetic-domains-in-the/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6435-recent-progress-and-prospects-in-density-matrix-renormalization/2020-05-17T22:52:19+00:00https://www.imm.cnr.it/pubblicazioni/6436-low-dimensional-spin-systems-hidden-symmetries-conformal-field-theories-and/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6437-role-of-the-equilibrium-size-of-kadanoff-blocks-in-the-loop-expansion-technique/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6438-simplex-coded-botda-fiber-sensor-with-1-m-spatial-resolution-over-a-50-km-range/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6439-analysis-of-distributed-temperature-sensing-based-on-raman-scattering-using/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6440-analysis-of-pulse-modulation-format-in-coded-botda-sensors/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6441-raman-based-distributed-temperature-sensor-with-simplex-coding-and-link/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6442-optimization-of-long-range-botda-sensors-with-high-resolution-using-first-order/2021-04-25T08:00:24+00:00https://www.imm.cnr.it/pubblicazioni/6443-raman-based-fibre-sensors-trends-and-applications/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6444-long-range-simplex-coded-botda-sensor-over-120km-distance-employing-optical/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6445-analysis-of-optical-pulse-coding-in-spontaneous-brillouin-based-distributed/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6446-simplex-coded-botda-sensor-over-120-km-smf-with-1-m-spatial-resolution-assisted/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6447-optimization-of-a-dpp-botda-sensor-with-25-cm-spatial-resolution-over-60-km/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6448-raman-based-distributed-temperature-sensor-with-1-m-spatial-resolution-over-26/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6449-transient-effects-in-gain-clamped-discrete-raman-amplifier-cascades/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6450-long-range-brillouin-optical-time-domain-analysis-sensor-employing-pulse-coding/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6451-distributed-temperature-sensor-system-based-on-raman-scattering-using/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6452-enhanced-simultaneous-distributed-strain-and-temperature-fiber-sensor-employing/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6453-an-objectoriented-tool-for-simulating-distributed-realtime-control-systems/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6454-brillouin-based-distributed-temperature-sensor-employing-pulse-coding/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6455-high-performance-raman-based-distributed-fiber-optic-sensing-under-a-loop/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6456-double-rayleigh-scattering-noise-in-raman-amplifiers-using-pump-time-division/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/6457-fiber-optic-distributed-sensor-based-on-hybrid-raman-and-brillouin-scattering/2021-04-25T08:00:36+00:00https://www.imm.cnr.it/pubblicazioni/6458-bidirectional-higher-order-cascaded-raman-amplification-benefits-for-10-gb-s/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6459-40-km-long-range-raman-based-distributed-temperature-sensor-with-meter-scale/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6461-snr-enhancement-of-raman-based-long-range-distributed-temperature-sensors-using/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6462-high-performance-and-highly-reliable-raman-based-distributed-temperature/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6463-distributed-raman-optical-amplification-in-phase-coherent-transfer-of-optical/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6464-high-power-and-low-rin-lasers-for-advanced-first-and-higher-order-raman/2021-04-25T08:00:35+00:00https://www.imm.cnr.it/pubblicazioni/6465-optical-pulse-coding-in-hybrid-distributed-sensing-based-on-raman-and-brillouin/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6466-performance-enhancement-of-raman-based-distributed-temperature-sensors-using/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6467-novel-scheduling-policies-in-real-time-multithread-control-system-design/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6468-distributed-raman-amplification-for-long-haul-optical-frequency-dissemination/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6469-effective-suppression-of-penalties-induced-by-parametric-nonlinear-interaction/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6471-reduction-of-double-rayleigh-scattering-noise-in-distributed-raman-amplifiers/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6472-analysis-of-brillouin-based-distributed-fiber-sensors-using-optical-pulse-coding/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/6473-soa-based-wdm-metro-ring-networks-with-link-control-technologies/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6474-study-of-raman-amplification-in-dpp-botda-sensing-employing-simplex-coding-for/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6475-long-range-botda-sensing-using-optical-pulse-coding-and-single-source-bi/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6476-simultaneous-distributed-strain-and-temperature-sensing-based-on-combined-raman/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6477-30-km-spontaneous-brillouin-distributed-temperature-sensor-employing-simplex/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6478-coded-optical-time-domain-reflectometry-principle-and-applications/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6479-unrepeated-wdm-transmission-systems-based-on-advanced-first-order-and-higher/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6480-improved-performance-in-raman-based-distributed-temperature-sensing-with-coded/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/6481-resonant-gain-enhancement-induced-by-pump-rin-transfer-in-distributed-raman/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6483-botda-sensor-with-2-m-spatial-resolution-over-120-km-distance-using-bi/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6484-design-optimization-of-high-power-and-low-rin-lasers-for-efficient-raman-co/2021-04-25T08:00:31+00:00https://www.imm.cnr.it/pubblicazioni/6485-experimental-analysis-of-gain-clamping-techniques-for-lumped-raman-amplifiers/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/6486-advanced-cyclic-coding-technique-for-long-range-raman-dts-systems-with-meter/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6487-advanced-techniques-for-distributed-optical-fiber-sensors-based-on-raman-and/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6488-km-simplex-coded-botda-sensor-for-distributed-strain-and-temperature/2018-11-19T13:12:44+00:00https://www.imm.cnr.it/pubblicazioni/6489-use-of-fabry-pa-a-rot-lasers-for-simultaneous-distributed-strain-and/2017-06-15T08:13:16+00:00https://www.imm.cnr.it/pubblicazioni/6490-distributed-strain-and-temperature-sensing-over-50-km-of-smf-with-1-m-spatial/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6491-bi-directional-higher-order-raman-pumping-for-improved-performances-in-long/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6492-theoretical-study-of-dynamics-in-gain-clamped-raman-amplifier-cascades/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6493-in-field-raman-amplification-on-coherent-optical-fiber-links-for-frequency/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6494-long-range-distributed-strain-and-temperature-sensing-with-40-cm-spatial/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6495-distributed-optical-fibre-sensors-based-on-spontaneous-brillouin-scattering/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6496-performance-improvement-in-brillouin-based-simultaneous-strain-and-temperature/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6497-mitigation-of-xgm-and-add-drop-induced-penalties-in-soa-based-metro-wdm-ring/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6498-advanced-first-and-second-order-raman-co-pumping-schemes-for-improved/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6499-high-gain-and-low-noise-discrete-amplifier-based-on-a-second-order-raman-fiber/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6500-cmos-compatible-optical-switching-concept-based-on-strain-induced-refractive/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6501-hybrid-raman-fbg-based-sensing-for-simultaneous-point-dynamic-strain-and/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6503-distributed-optical-fiber-temperature-sensor-using-only-anti-stokes-raman/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6504-enhanced-long-range-distributed-strain-and-temperature-sensing-using-botda-and/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6505-evaluation-of-the-effects-of-silver-nanoparticles-on-danio-rerio-cornea/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6506-transient-control-in-soa-based-wdm-metro-ring-networks-under-add-drop-operation/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6507-transmission-of-8x-10-gb-s-wdm-channels-over-70-db-of-standard-smf-based-on/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6508-high-performance-discrete-amplifier-based-on-a-second-order-fiber-raman/2021-04-25T08:00:38+00:00https://www.imm.cnr.it/pubblicazioni/6510-coherent-frequency-transfer-over-long-haul-and-shared-optical-fiber-links/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6511-cmos-compatible-modulator-concept-based-on-strain-induced-refractive-index/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6512-distributed-raman-amplification-in-phase-coherent-transfer-of-optical/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6513-neat-ft-the-european-fiber-link-collaboration/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6515-metrological-transfer-of-phase-coherent-optical-frequencies-over-long-distances/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6516-raman-based-distributed-optical-fiber-temperature-sensors-industrial/2017-09-11T08:13:38+00:00https://www.imm.cnr.it/pubblicazioni/6517-differential-pulse-width-pair-brillouin-optical-time-domain-analysis-employing/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6518-fiber-raman-amplification-for-metrological-transfer-of-phase-coherent-optical/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6519-enhanced-performance-botda-sensing-through-optimized-pulse-coding-and-low-rin/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6520-impact-of-the-pulse-modulation-format-on-distributed-botda-sensors-based-on/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6521-enhanced-distributed-hybrid-sensor-based-on-brillouin-and-raman-scattering/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6522-download-details/2017-03-28T13:15:42+00:00https://www.imm.cnr.it/pubblicazioni/6523-optoelectronic-measuring-apparatus-for-distributed-physical-characteristic/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6524-fabry-perot-lasers-in-simultaneous-strain-and-temperature-brillouin-based/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6526-sensori-distribuiti-in-fibra-ottica-per-misure-simultanee-di-temperatura-e/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6527-optical-pulse-coding-applied-to-distributed-temperature-sensor-using-coherent/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6528-analysis-of-double-rayleigh-scattering-noise-in-higher-order-pumped-distributed/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6529-acknowledgement-to-reviewers-of-computation-in-2018/2021-10-19T10:47:48+00:00https://www.imm.cnr.it/pubblicazioni/6530-coded-optical-time-domain-reflectometry-principle-and-applications-invited/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6531-raman-amplifier-structure/2017-09-11T08:13:37+00:00https://www.imm.cnr.it/pubblicazioni/6532-a-new-high-power-and-low-rin-raman-pump-laser-for-improved-performance-in-long/2021-04-25T08:00:40+00:00https://www.imm.cnr.it/pubblicazioni/6533-advanced-bi-directional-raman-pumping-schemes-for-long-span-unrepeated-wdm/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6534-benefits-of-bi-directional-raman-pumping-for-10-gb-s-c-band-wdm-transmission/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6535-optimal-bidirectional-raman-pumping-in-dispersion-shifted-fibres-for-wdm-inter/2021-04-25T08:00:39+00:00https://www.imm.cnr.it/pubblicazioni/6536-th3-3-3-high-gain-and-low-noise-discrete-amplifier-based-on-a-second-order/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6537-penalties-induced-by-resonant-noise-enhancement-and-their-mitigation-in-counter/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6538-impact-of-double-rayleigh-scattering-noise-in-time-division-multiplexed-raman/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6539-fiber-amplifiers-and-lasers-effective-suppression-of-penalties-induced-by/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6540-meningeal-carcinomatosis-early-complication-of-inflammatory-breast-cancer/2017-09-11T08:13:34+00:00https://www.imm.cnr.it/pubblicazioni/6541-benefits-of-co-propagating-raman-pumping-for-c-band-wdm-transmission-in/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6542-integrated-hybrid-raman-fbg-interrogation-scheme-for-distributed-temperature/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6543-double-rayleigh-scattering-noise-in-higher-order-distributed-raman-pumping/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6544-design-of-photonic-crystal-fibers-for-optical-parametric-amplification/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/6546-solid-phase-epitaxy-of-amorphous-silicon-induced-by-electron-irradiation-at/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6547-radiation-enhanced-silicon-self-diffusion-and-the-silicon-vacancy-at-high/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6548-ion-implantation-induced-swelling-in-6h-sic/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6549-different-methods-for-the-determination-of-damage-profiles-in-si-from-rbs/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6551-stopping-and-damage-parameters-for-monte-carlo-simulation-of-mev-implants-in/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/6552-low-energy-recoils-in-crystalline-silicon-quantum-simulations/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6553-solid-phase-epitaxy-of-implanted-silicon-at-liquid-nitrogen-and-room/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6554-comparison-of-results-and-models-of-solid-phase-epitaxial-growth-of-implanted/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6555-atomistic-modeling-of-ion-channeling-in-si-with-point-defects-the-role-of/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6556-mev-ion-implantation-induced-damage-in-relaxed-si/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6557-binary-collision-approximation-modeling-of-ion-induced-damage-effects-in/2021-03-11T23:17:03+00:00https://www.imm.cnr.it/pubblicazioni/6558-dose-rate-effects-on-the-dynamic-annealing-mechanism-in-p-implanted-silicon/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6559-vacancy-effects-in-transient-diffusion-of-sb-induced-by-ion-implantation-of-si/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6560-monte-carlo-simulation-of-ion-implantation-in-crystalline-sic/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6561-the-si-surface-yield-as-a-calibration-standard-for-rbs/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6562-ab-initiostructures-of-asmv-complexes-and-the-simulation-of-rutherford/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6563-x-ray-diffraction-analysis-of-damage-accumulation-due-to-the-nuclear-energy/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6564-transmission-electron-microscopy-of-self-annealed-ion-implanted-silicon/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6566-electron-beam-annealing-of-semiconductors-by-means-of-a-specifically-designed/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6567-interpretation-of-ion-channeling-spectra-in-ion-implanted-si-with-models-of/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6568-minority-carrier-lifetime-in-furnace-and-ebeam-annealed-cz-silicon/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6570-dynamic-monte-carlo-simulation-of-nonlinear-damage-growth-during-ion/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6571-solid-phase-epitaxy-of-implanted-silicon-by-electron-irradiation-at-room/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6572-rbs-channeling-determination-of-damage-profiles-in-fully-relaxed-si0-76ge0-24/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6573-on-the-dynamic-annealing-mechanism-in-pimplanted-silicon/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6577-ion-channeling-analysis-of-as-relocation-in-heavily-doped-sias-irradiated-with/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6579-ion-implantation-induced-damage-in-relaxed-si0-75ge0-25/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6582-rbs-channeling-analysis-of-virgin-6h-sic-experiments-and-monte-carlo-simulations/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6583-self-annealing-effects-in-p-implanted-silicon/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6584-numerical-simulation-of-heating-effects-due-to-a-low-power-electron-irradiation/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6586-ion-implantation-of-silicon-at-the-nanometer-scale/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6587-computer-simulation-of-ion-channeling-in-si-containing-structurally-relaxed/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6588-the-minimum-yield-in-channeling/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6589-tailored-emitter-ion-implanted-silicon-solar-cells/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6593-lifetime-and-crystal-order-in-annealed-cz-silicon/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6594-comparison-between-electronbeam-and-furnace-rapid-isothermal-anneals-of/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6596-2-mev-si-ion-implantation-damage-in-relaxed-si1-xgex/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6598-structural-characterization-of-dynamic-annealing-effects-of-p-implanted-si/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6599-a-self-annealing-technique-for-simultaneous-titanium-silicide-and-n-p-junction/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6600-post-testing-removal-of-amorphous-silicon-bragg-gratings/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6602-proceedings-of-the-21st-international-conference-on-atomic-collisions-in-solids/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6603-radiation-induced-defects-in-bipolar-power-transistors-influence-of-radiation/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6605-atomistic-model-of-defects-for-the-simulation-of-rbschanneling-measurements-in/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6606-chapter-4-processing-of-sic-4-2-doping-and-implantation-the-monte-carlo-binary/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6607-structural-mechanical-thermodynamic-and-optical-properties-of-condensed-matter/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/6608-transient-diffusion-effects-of-sb-and-b-in-si-induced-by-medium-and-high-energy/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6609-2-mev-si-ion-implantation-damage-in-relaxed-si/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6610-ion-implantation-induced-damage-in-relaxed-si-sub-1-x-ge-sub-x/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6611-ion-implantation-induced-damage-in-relaxed-si1-xgex/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6612-x-ray-diffraction-analysis-of-damage-accumulation-due-to-the-nuclear-energy/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6613-influence-of-temperature-and-electron-energy-on-solid-phase-epitaxy-of/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6614-self-annealing-implantation-of-as-in-silicon/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6615-low-temperature-equilibria-of-point-defects-induced-by-conventional-and-rapid/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/6616-e-beam-induced-lateral-seeded-epitaxy-of-silicon-on-insulator/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6617-minority-carrier-lifetime-in-furnace-and-e-beam-annealed-cz-silicon/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6618-self-annealing-implantation-of-p-through-ti-films-on-si/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6620-rapid-isothermal-annealing-of-ion-implanted-silicon-devices-by-uniform-large/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6621-silicon-solar-cells-by-ion-implantation-e-beam-and-self-annealing/2021-03-11T23:17:02+00:00https://www.imm.cnr.it/pubblicazioni/6622-an-electron-gun-for-annealing-of-ion-implanted-materials/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6623-civr-istituto-lamel-via-castagnoli-bozogna-italy/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6624-radiation-induced-defects-in-bipolar-power-transistors-influence-of-radiation/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6625-icacs-committees-and-sponsors/2017-09-11T08:13:36+00:00https://www.imm.cnr.it/pubblicazioni/6626-solutions-of-negatively-charged-graphene-sheets-and-ribbons/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6628-lateral-epitaxial-growth-of-germanium-on-silicon-oxide/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6630-highly-luminescent-colloidal-cds-quantum-dots-with-efficient-near-infrared/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6632-growth-of-photoluminescent-cadmium-sulphide-quantum-dots-from-soluble-single/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6633-interference-electron-microscopy-of-one-dimensional-electron-optical-phase/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6637-discrete-atom-imaging-in-carbon-nanotubes-and-peapods-using-cs-corrected-tem/2021-03-12T03:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6638-interferometric-tem-characterization-of-graphene-materials/2021-03-11T23:17:05+00:00https://www.imm.cnr.it/pubblicazioni/6639-green-synthesis-of-noble-metal-and-bimetal-nanosols-and-their-applications-as/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6640-i1-5-a-new-set-of-software-tools-for-holographic-reconstruction-and-analysis/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6641-electrical-properties-of-al-2-o-3-4-hsi-c-structures-grown-by-atomic-layer/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6642-microwave-annealing-of-very-high-dose-aluminum-implanted-4h-sic/2021-03-18T09:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6643-charged-particle-detection-properties-of-epitaxial-4h-sic-schottky-diodes/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6644-formation-of-carbon-vacancy-in-4h-silicon-carbide-during-high-temperature/2026-10-05T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6645-simulation-and-experimental-results-on-the-forward-j-v-characteristic-of-al/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6647-experimental-characterization-and-numerical-analysis-of-the-4h-sic-p-i-n-diodes/2021-04-25T08:00:36+00:00https://www.imm.cnr.it/pubblicazioni/6648-simulation-of-pulse-height-spectra-in-ion-beam-induced-charge-microscopy-of/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6649-low-temperature-oxidation-of-sic-preamorphized-by-ion-implantation/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6650-images-of-grain-boundaries-in-polycrystalline-silicon-solar-cells-by-electron/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6651-selfannealed-ion-implanted-solar-cells/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6652-rbs-channeling-spectra-simulation-of-as-implanted-si-samples-through-an/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6653-on-the-epitaxial-relationships-of-tisi2-on-silicon/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6654-silane-overpressure-post-implant-annealing-of-al-dopants-in-sic-cold-wall-cvd/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6656-structural-characterization-of-ar-ion-amorphized-6h-sic-wafers-annealed-at-1100/2023-07-19T10:13:35+00:00https://www.imm.cnr.it/pubblicazioni/6657-study-of-sno-ga2o3-p-n-diodes-in-planar-geometry/2023-07-19T10:13:39+00:00https://www.imm.cnr.it/pubblicazioni/6658-electrical-and-structural-characterization-of-silicon-layers-directly-doped/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6660-determination-of-the-occupancy-level-of-the-dx-center-resonant-with-the/2023-07-19T10:13:42+00:00https://www.imm.cnr.it/pubblicazioni/6661-x-ray-determination-of-lattice-damage-depth-profiles-due-to-electronic-and/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6662-analysis-of-the-hole-transport-through-valence-band-states-in-heavy-al-doped-4h/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6663-high-dose-phosphorus-implanted-4h-sic-microwave-and-conventional-post/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6664-a-study-about-the-wet-oxidation-of-crystalline-and-ion-damaged-6h-sic/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6665-remarks-on-the-room-temperature-impurity-band-conduction-in-heavily-al/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6666-microwave-annealing-of-high-dose-al-implanted-4h-sic-towards-device-fabrication/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6667-a-study-of-he-ion-induced-damage-in-silicon-by-quantitative-analysis-of-charge/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6668-multiply-scanned-electron-beam-annealing-of-si-implanted-gaas/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6669-numerical-simulations-of-a-4h-sic-bmfet-power-transistor-with-normally-off/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6670-structural-and-electrical-characterization-of-yba2cu3o7-x-thin-films-grown-on/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6671-al-implanted-anode-for-4h-sic-pin-diodes/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6672-elimination-of-carbon-vacancies-in-4h-sic-employing-thermodynamic-equilibrium/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6673-a-robust-process-for-ion-implant-annealing-of-sic-in-a-low-pressure-silane/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6674-the-legnaro-ion-microprobe-in-low-current-experiments/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6675-samarium-as-a-schottky-barrier-on-p-type-silicon/2021-03-11T23:17:06+00:00https://www.imm.cnr.it/pubblicazioni/6677-a-highly-effective-edge-termination-design-for-sic-planar-high-power-devices/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/6678-4h-and-6h-sic-rutherford-back-scattering-channeling-spectrometry-polytype/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6679-rutherford-backscattering-studies-of-ion-implanted-semiconductors/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6680-structural-characterization-of-superconducting-yba2cu3ox-films-grown-by-pulsed/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6682-post-growth-reduction-of-basal-plane-dislocations-by-high-temperature-annealing/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6683-post-implantation-annealing-in-a-silane-ambient-using-hot-wall-cvd/2021-03-13T03:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6684-boron-doping-of-silicon-using-excimer-lasers/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6688-simulation-of-the-temperature-dependence-of-hall-carriers-in-al-doped-4h-sic/2021-04-25T08:00:25+00:00https://www.imm.cnr.it/pubblicazioni/6689-x-ray-and-afm-analysis-of-al2o3-deposited-by-alcvd-on-n-type-4h-sic/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6690-post-implantation-annealing-of-sic-relevance-of-the-heating-rate/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6692-0001-channeling-stopping-power-of-mev-he-ions-in-4h-and-6h-sic/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6693-structural-optical-and-chemical-characterization-of-300-c-mev-ion-implanted-and/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6694-al-implanted-anode-for-4h-sic-pin-diodes/2018-11-19T13:12:47+00:00https://www.imm.cnr.it/pubblicazioni/6695-invited-ion-implanted-bipolar-junction-in-4h-sic-electronics-devices-relevance/2017-06-15T08:13:17+00:00https://www.imm.cnr.it/pubblicazioni/6698-trace-molecule-detection-below-the-part-per-trillion-level-with-doubly-resonant/2023-10-18T10:09:47+00:00https://www.imm.cnr.it/pubblicazioni/6702-about-the-hole-transport-analysis-in-heavy-doped-p-type-4h-sic-al/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6703-al-ion-implanted-on-axis-0001-semi-insulating-4h-sic/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6705-basal-plane-dislocation-mitigation-using-high-temperature-annealing-in-4h-sic/2021-03-12T03:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6706-steady-state-analysis-of-a-normally-off-4h-sic-trench-bipolar-mode-fet/2021-04-25T08:00:33+00:00https://www.imm.cnr.it/pubblicazioni/6707-ion-implanted-4h-sic-pin-diodes-comparison-between-1600-1650-c-and-1950-c-post/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6708-microwave-annealing-of-ion-implanted-4hsic/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6710-ultra-fast-high-temperature-microwave-annealing-of-ion-implanted-large-bandgap/2021-04-25T08:00:34+00:00https://www.imm.cnr.it/pubblicazioni/6711-numerical-simulations-of-al-implanted-4h-sic-diodes-modeling-an-explicit/2021-04-25T08:00:37+00:00https://www.imm.cnr.it/pubblicazioni/6712-x-ray-and-afm-analysis-of-al2o3-deposited-by-alcvd-on-n-type-4h-sic-ulrike/2021-03-11T23:16:52+00:00https://www.imm.cnr.it/pubblicazioni/6713-chapter-4-sic-processing-4-2-dielectrics-and-passivation-layers-x-ray-and-afm/2018-11-19T13:12:47+00:00https://www.imm.cnr.it/pubblicazioni/6714-part-2-chapter-5-processing-of-sic-5-1-implantation-and-doping-of-sic-post/2018-11-19T13:12:46+00:00https://www.imm.cnr.it/pubblicazioni/6715-chapter-5-sic-technology-5-1-doping-and-implantation-jv-characteristics-of-al/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6716-chapter-5-sic-technology-5-2-dielectrics-and-passivation-layers-competition/2018-11-19T13:12:44+00:00https://www.imm.cnr.it/pubblicazioni/6717-jv-characteristics-of-al-ion-implanted-p-n-4h-sic-diodes-annealed-in-silane/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6718-silicon-carbide-and-related-materials-2004-ecscrm-2004-proceedings-of-the-5th/2020-01-04T23:56:10+00:00https://www.imm.cnr.it/pubblicazioni/6719-structural-mechanical-thermodynamic-and-optical-propert1es-of-condensed-matter/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6720-he-ion-damage-in-4h-sic-studied-by-charge-collection-efficiency-measurements/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/6721-he-ion-damage-in-4h-sic-studied-by-charge-collection-efficiency-measurements/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6722-comparison-between-chemical-and-electrical-profiles-in-al-or-n-implanted-and/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6723-comparison-between-chemical-and-electrical-profiles-in-al-exp-or-n-exp/2018-11-19T13:12:49+00:00https://www.imm.cnr.it/pubblicazioni/6724-carrier-and-mobility-profile-measurements-in-n-type-ion-implanted-gaas-by-the/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6725-plasma-anodization-of-silicides/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/6726-effects-of-damage-on-the-electrically-active-profile-in-si-implanted-gaas/2021-03-11T23:17:00+00:00https://www.imm.cnr.it/pubblicazioni/6727-multiply-scanned-electron-beam-annealing-of-si-implanted-gaas/2020-12-18T23:24:07+00:00https://www.imm.cnr.it/pubblicazioni/6728-structural-optical-and-chemical-characterization-of-300-c-mev-ion-implanted-and/2023-01-11T13:49:31+00:00https://www.imm.cnr.it/pubblicazioni/6729-cnr-imm-sezione-di-bologna-via-gobetti-101-i-40129-bologna-italy-soitec-sa-parc/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6730-a-dielectric-calculation-of-energy-loss-to-valence-electrons-of-channelled/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6732-structural-and-analytical-characterization-of-si1-x-gex-si-heterostructures-by/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6734-monte-carlo-calculations-on-spatial-distribution-of-implanted-ions-in-silicon/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6735-monte-carlo-simulation-of-elastic-and-inelastic-scattering-of-electrons-in-thin/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6736-new-resampling-method-to-assess-the-accuracy-of-the-maximal-lyapunov-exponent/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6737-strong-short-range-correlations-and-dichotomic-codon-classes-in-coding-dna/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6738-the-moving-block-bootstrap-to-assess-the-accuracy-of-statistical-estimates-in/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6739-monte-carlo-simulation-of-thinfilm-xray-microanalysis-at-high-energies/2021-03-11T23:16:56+00:00https://www.imm.cnr.it/pubblicazioni/6740-computer-evaluation-of-primary-deposited-energy-profiles-in-ionimplanted/2021-03-11T23:17:08+00:00https://www.imm.cnr.it/pubblicazioni/6741-characterization-of-titanium-nitride-films-deposited-onto-silicon/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6742-a-comprehensive-computer-program-for-ion-penetration-in-solids/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6743-dose-dependence-of-penetration-and-damage-profiles-of-p-channeled-ions-in/2021-03-11T23:17:04+00:00https://www.imm.cnr.it/pubblicazioni/6745-simultaneous-determination-of-composition-and-thickness-of-thin-films-by-x-ray/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6746-doping-and-radiation-damage-profiles-of-p-ions-implanted-in-silicon-along-the/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6747-application-of-monte-carlo-technique-to-the-electron-probe-microanalysis-of/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6748-energy-loss-of-protons-channelling-through-very-thin-gold/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6749-the-merli-missiroli-pozzi-two-slit-electron-interference-experiment/2021-04-25T08:00:38+00:00https://www.imm.cnr.it/pubblicazioni/6750-detecting-structure-in-parity-binary-sequences/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6751-markov-chain-monte-carlo-in-stastical-mechanics-the-problem-of-accuracy/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6752-dna-dichotomic-classes-and-frame-synchronization-a-quasi-crystal-framework/2026-09-27T23:16:02+00:00https://www.imm.cnr.it/pubblicazioni/6753-the-inverse-problem-of-ellipsometry-a-bootstrap-approach/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6754-computer-analysis-of-the-axial-to-planar-channeling-transition-linkage-with/2021-03-11T23:16:53+00:00https://www.imm.cnr.it/pubblicazioni/6755-computer-studies-of-dechanneling-effects-on-ion-implantation-profiles/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6756-evidence-of-deterministic-components-in-the-apparent-randomness-of-grbs-clues/2021-04-25T08:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6757-x-ray-microanalysis-combined-with-monte-carlo-simulation-for-the-analysis-of/2021-03-15T17:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6758-experimental-and-computer-analysis-of-pion-penetration-tails-in-a-sio2si/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6759-characterization-of-tiox-films-and-their-application-as-antireflection-coatings/2021-03-11T23:17:09+00:00https://www.imm.cnr.it/pubblicazioni/6760-influence-of-the-electron-incidence-angle-on-quasi-adiabatic-heating-of-silicon/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6761-the-mathematical-structure-of-the-genetic-code-a-tool-for-inquiring-on-the/2021-04-25T08:00:30+00:00https://www.imm.cnr.it/pubblicazioni/6762-application-of-monte-carlo-method-to-the-electron-probe-microanalysis-of-thin/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6763-testing-chaotic-dynamics-in-systems-with-two-positive-lyapunov-exponents-a/2021-04-25T08:00:27+00:00https://www.imm.cnr.it/pubblicazioni/6764-a-monte-carlo-code-including-an-x-ray-characteristic-fluorescence-correction/2021-03-11T23:16:58+00:00https://www.imm.cnr.it/pubblicazioni/6765-rita-a-promising-monte-carlo-code-for-recoil-implantation/2021-03-11T23:16:51+00:00https://www.imm.cnr.it/pubblicazioni/6766-multiple-scattering-and-central-limit-theorem-a-monte-carlo-approach/2021-03-11T23:16:50+00:00https://www.imm.cnr.it/pubblicazioni/6767-the-non-power-model-of-the-genetic-code-a-paradigm-for-interpreting-genomic/2026-09-28T23:15:55+00:00https://www.imm.cnr.it/pubblicazioni/6768-vectorized-code-for-the-three-dimensional-spin-exchange-kinetic-ising-model-on/2021-03-11T23:16:57+00:00https://www.imm.cnr.it/pubblicazioni/6769-determination-of-composition-and-thickness-of-tinxoy-films-on-silicon-by/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6770-oxygen-and-implanted-ion-profiles-in-oxidized-zirconium/2021-03-11T23:17:07+00:00https://www.imm.cnr.it/pubblicazioni/6771-chaotic-phenomena-of-charged-particles-in-crystal-lattices/2021-03-11T23:17:01+00:00https://www.imm.cnr.it/pubblicazioni/6772-generating-replications-of-chaotic-time-series/2021-03-11T23:16:59+00:00https://www.imm.cnr.it/pubblicazioni/6773-on-the-use-of-the-gela-line-in-thin-film-x-ray-microanalysis-of-si-_vgev-si/2017-09-11T08:13:35+00:00https://www.imm.cnr.it/pubblicazioni/6774-thickness-determination-of-al-films-on-si-by-a-monte-carlo-code-including-a/2021-03-11T23:16:54+00:00https://www.imm.cnr.it/pubblicazioni/6775-fib-preparation-of-a-nio-wedge-lamella-and-stem-x-ray-microanalysis-for-the/2021-04-25T08:00:32+00:00https://www.imm.cnr.it/pubblicazioni/6776-on-the-origin-of-the-mitochondrial-genetic-code/2020-01-09T23:34:21+00:00https://www.imm.cnr.it/pubblicazioni/6777-resolving-statistical-uncertainty-in-correlation-dimension-estimation/2021-04-25T08:00:26+00:00https://www.imm.cnr.it/pubblicazioni/6778-caos-statistica-e-metodi-di-ricampionamento/2021-02-19T19:00:23+00:00https://www.imm.cnr.it/pubblicazioni/6780-statistical-resampling-for-accuracy-estimate-in-monte-carlo-renormalization/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6781-catene-di-markov-monte-carlo-nei-modelli-di-ising/2021-03-11T23:16:55+00:00https://www.imm.cnr.it/pubblicazioni/6782-il-metodo-del-bootstrap-nella-propagazione-degli-errori/2021-03-11T23:16:48+00:00https://www.imm.cnr.it/pubblicazioni/6783-electron-interference-landes-approach-upset-by-a-recent-elegant-experiment/2021-03-11T23:16:49+00:00https://www.imm.cnr.it/pubblicazioni/6784-feeding-in-and-blocking-phenomena-explained-in-terms-of-a-simple-diffusion-model/2021-03-11T23:16:47+00:00https://www.imm.cnr.it/pubblicazioni/6785-perinatal-mortality-and-productivity-at-the-appointed-service-iatf-sheep-in/2021-03-18T09:00:29+00:00https://www.imm.cnr.it/pubblicazioni/6786-quantitative-x-ray-microanalysis-of-thin-nio-films-by-monte-carlo-and-cliff/2021-04-25T08:00:28+00:00https://www.imm.cnr.it/pubblicazioni/6788-genome-characterization-through-dichotomic-classes-an-analysis-of-the-whole/2026-09-28T23:15:55+00:00