Pascal and Francis Bibliographic Databases

Data di pubblicazione: 1 Set 2000

RivistaFonte dati: ARCHIVIO

Pascal 001 Exact sciences and technology/001B Physics/001B60 Condensed matter: structure, mechanical and thermal properties/001B60A Structure of solids and liquids; crystallography/001B60A16 Electron, ion, and scanning probe microscopy/001B60A16B Transmission, reflection and scanning electron microscopy (including ebic)Pascal 001 Exact sciences and technology/001B Physics/001B60 Condensed matter: structure, mechanical and thermal properties/001B60A Structure of solids and liquids; crystallography/001B60A16 Electron, ion, and scanning probe microscopy/001B60A16M Scanning auger microscopy, photoelectron microscopy

Fonte
Proceedings of the 2nd LEEM/PEEM Workshop
ID archivio
a4a5dc244b65e9e9a6e167e3b32b417b
Riferimenti
Volume: 26 Pages: 28