Low temperature rectifying junctions for crossbar non-volatile memory devices

Data di pubblicazione: 10 Mag 2009

ConvegnoFonte dati: ARCHIVIO

ZnO-based Schottky junctions fabricated at low temperature are proposed as selectors for crossbar non-volatile memory devices. Rectifying ratio over 10 7 and forward current density as high as 10 4 A/cm 2 are reported. Results of the integration with NiO based switching memory elements are also shown.

Editore
IEEE
Fonte
2009 IEEE International Memory Workshop
ID archivio
c66911b720dfaa679652110574c7af97
Riferimenti
Pages: 1-3