MICROSTRUCTURES OF SPUTTERED ORIENTED Si/CeO2 BILAYERs YBa2Cu3O7-δ/Si INTEGRATED MICROELECTRONICS

Data di pubblicazione: 10 Mar 2003

RivistaFonte dati: ARCHIVIO

In the framework of a research aimed to superconductor/semiconductor integrated electronics, we have grown a-axis oriented YBa2Cu3O7-δ (YBCO) thin films on silicon (100) substrates with (111) oriented insulating buffer layers of cerium dioxide (CeO2), using magnetron sputtering deposition techniques. The properties of the cerium dioxide layer have been preliminary optimized by means of several layout and by monitoring the growing procedures through X-ray diffraction, AFM and TEM techniques. The lattice matching between CeO2 and YBCO resulted to be worsened by an amorphous thin SiO2 layer at the Si/CeO2 interface, that decouples the buffer orientation from the seed orientation. However, it was possible to grow a relatively thick, optimally textured layer of CeO2 without spurious orientations. The YBCO films deposited on top of this layer result preferentially a-axis oriented. The transition widths …

Editore
World Scientific Publishing Company
Fonte
International Journal of Modern Physics B
ID archivio
aa994b1ae18a0b5086b8a6fa1ef7ea98
Riferimenti
Volume: 17 Issue: 04n06 Pages: 848-854