Advanced materials nanocharacterization

Data di pubblicazione: 31 Gen 2011

RivistaFonte dati: OPENALEXTipo OpenAlex: editorialOpen Access
Autori: Filippo Giannazzo, Pierre Eyben, J. M. Baranowski, Jean Camassel, Š. Lányi

This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13th to 17th September, 2010.

Editore
SpringerOpen
Fonte
Nanoscale Research Letters
Volume
6
Fascicolo
1
Pagine
107
Citazioni
5
ID archivio
ae99869c8d14832aa49d0fc23aa93b5b
Riferimenti
Volume: 6 Issue: 1 Pages: 1-2