We report a beam deflection technique that exploits electric-field controlled deflection and total internal reflection at the interface between two anti-parallel domains realized in a single crystal lithium niobate wafer. The LiNbO3 z-cut sample was 500-μm-thick and was photolithographically patterned and poled by means of an applied electric field, in order to realize two adjacent regions of opposite domain orientation. The boundary between these domains should be very regular and free from residual stress, but in practice, a small residual index difference exists at the interface. An electric filed Ez applied across the interface region, produces equal in magnitude, but opposite in sign, refractive index variations between the adjacent anti-parallel domains. For sufficiently large index variation, and for grazing incidence geometry, that is when the incidence angle is between 87° and 89°, we obtain a high efficient beam …