TFT Characterization & Reliability-Hot Carrier Effects in p-Channel Polycrystalline Silicon Thin Film Transistors Fabricated on Flexible Substrates | IMM Container

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TFT Characterization & Reliability-Hot Carrier Effects in p-Channel Polycrystalline Silicon Thin Film Transistors Fabricated on Flexible Substrates

Type:

Journal

Description:

Publisher:

Tokyo, Japan: Publication Board, Japanese Journal of Applied Physics, c1982-

Publication date:

1 Jan 2007

Authors:

Luigi Mariucci, Paolo Gaucci, Antonio Valletta, Francois Templier, Guglielmo Fortunato

Biblio References:

Volume: 46 Issue: 3 Pages: 1299-1302

Origin:

Japanese Journal of Applied Physics-Part 1 Regular Papers and Short Notes

Link:

http://scholar.google.com/scholar?cluster=15611297182247661817&hl=en&oi=scholarr