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Yttria fully stabilized zirconia (FSZ) is a candidate material for nuclear inert matrix fuel cell and nuclear waste containment due to its isostructure with UO2 and PuO2 and its outstanding radiation resistance. Amorphous and polycrystalline cubic FSZ thin films of thickness around 400 nm were deposited on (100) Si by ultraviolet pulsed laser ablation and irradiated with 2.6 GeV uranium ions at fluences between 2×1011 and 1.2×1012 ions cm−2. The films were characterized before and after irradiation using scanning electron microscopy, atomic force microscopy, grazing incidence x-ray diffraction, and x-ray photoelectron spectroscopy (XPS). Amorphization, followed by partial recrystallization, is observed for irradiated crystalline films, whereas the amorphous films remain unaltered. A shift in the relative position of the XPS Zr 3d, Y 3d, and O 1s core lines is observed upon irradiation both in the crystalline and …
American Institute of Physics
Publication date: 
1 Nov 2008

AP Caricato, A Lamperti, Paolo Maria Ossi, C Trautmann, L Vanzetti

Biblio References: 
Volume: 104 Issue: 9 Pages: 093534
Journal of Applied Physics