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Type: 
Patent
Description: 
A method is provided for fabricating a wafer of semiconductor material intended for use for the integration of electronic and/or optical and/or optoelectronic devices. The method comprises: providing a starting wafer of crystalline silicon (205); on the starting wafer of crystalline silicon, epitaxially growing a buffer layer (210) consisting of a sub-stoichiometric alloy of silicon and germanium; epitaxially growing on the buffer layer a layer (225) of a semiconductor material having an energy gap greater than that of the crystalline silicon ...
Publisher: 
Publication date: 
25 Jul 2012
Authors: 

Camarda Massimo, Andrea Severino, Francesco La Via, , Francesco La Via

Biblio References: 
Origin: 
US20140264385