Type:
Conference
Description:
Double-gate and tri-gate FinFET type memories with nitride (SONOS-like) or Si nanocrystals storage with minimum feature sizes of 10 nm were realized. Strong performance advantages in program / erase characteristics and reliability deeply linked to the FinFET architecture are demonstrated.
Publisher:
IEEE
Publication date:
10 Dec 2007
Biblio References:
Pages: 921-924
Origin:
2007 IEEE International Electron Devices Meeting