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Type: 
Conference
Description: 
Article PreviewArticle PreviewArticle PreviewGraphene films were grown on thin polycrystalline Ni using a buried amorphous carbon (aC) layer as C source. Rapid thermal processes (RTP) at temperatures from 600 to 800 C were used to promote C diffusion into Ni and its subsequent segregation on Ni surface, during the sample cool down. RTP at 800 C was the optimal condition for graphene film formation. Micro-Raman spectroscopy showed that the grown film is mostly composed by multilayers of graphene. Atomic force microscopy showed that the film presents peculiar corrugations (wrinkles), isotropically oriented and with heights ranging from from~ 1 to~ 15 nm. Selected area diffraction by transmission electron microscopy on the MLG membranes shows a rotational disorder between the stacked graphene layers.
Publisher: 
Trans Tech Publications
Publication date: 
1 Jan 2011
Authors: 

Vito Raineri, Corrado Bongiorno, Salvatore Di Franco, Raffaella Lo Nigro, Emanuele Rimini, Filippo Giannazzo

Biblio References: 
Volume: 178 Pages: 125-129
Origin: 
Solid State Phenomena