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Type: 
Conference
Description: 
Article PreviewArticle PreviewArticle PreviewWe present a nanoscale morphological and structural characterization of few layers of graphene grown by thermal decomposition of off-axis 4H-SiC (0001). A comparison between transmission electron microscopy (TEM) in cross-section and in plan view allows to fully exploit the potentialities of TEM. Such a comparison was used to get information on the number of graphene layers as well as on the rotational order between the layers and with respect to the substrate. Some peculiar structures observed by TEM (wrinkles) could only be systematically measured by atomic force microscopy (AFM). In particular, the density and the height of the wrinkles in the few layers of graphene was investigated.
Publisher: 
Trans Tech Publications
Publication date: 
1 Jan 2012
Authors: 

Filippo Giannazzo, Martin Rambach, Wielfried Lerch, Corrado Bongiorno, Salvatore Di Franco, Emanuele Rimini, Vito Raineri

Biblio References: 
Volume: 711 Pages: 141-148
Origin: 
Materials Science Forum