Active-Matrix Liquid-Crystal Displays-TFT Technology--Characterization-Effects of Fabrication Parameters on the Electrical Stability of Gate Overlapped Lightly Doped Drain Polysilicon Thin-Film

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Type:

Journal

Description:

Publisher:

Tokyo, Japan: Publication Board, Japanese Journal of Applied Physics, c1982-

Publication date:

1 Jan 2006

Authors:

A Bonfiglietti, A Valletta, M Rapisarda, L Mariucci, G Fortunato

Biblio References:

Volume: 45 Issue: 5 Pages: 4384-4388

Origin:

Japanese Journal of Applied Physics-Part 1 Regular Papers and Short Notes

Link:

Scientific Productions