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Type: 
Patent
Description: 
Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials with a single measurement operation. The system employs an interferometer as a “shear interferometer” with the advantage of varying the wavelength of the luminous source. The index of refraction and the thickness are determined in two phases. Firstly it is determined the optical path analyzing the displacement of interferometric signal obtained by orthogonal incidence; successively, by means of phase …
Publisher: 
Publication date: 
16 May 2006
Authors: 

Giuseppe Coppola, Pietro Ferraro, Mario Iodice, Sergio De Nicola

Biblio References: 
Origin: 
US7046373