The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
Publishing House of the Romanian Academy
1 Jan 2009
Volume: 12 Issue: 3 Pages: 394-401
ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY