Near-field microwave techniques for micro- and nano-scale characterization in materials science | IMM Container

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Near-field microwave techniques for micro- and nano-scale characterization in materials science

Type:

Conference

Description:

Publisher:

Publication date:

1 Jan 2017

Authors:

Romolo Marcelli, Andrea Lucibello, Giovanni Capoccia, Emanuela Proietti, Giovanni Maria Sardi, Christopher Hardly Joseph, Loukas Michalas, Giancarlo Bartolucci, Ferry Kienberger, Georg Gramse, Manuel Kasper

Biblio References:

Pages: 29-36

Origin:

2017 International Semiconductor Conference (CAS)

Link:

https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…