A new method for fast and accurate multislice calculation, in the frozen-phonon approximation for high angle annular dark field scanning transmission electron microscopy images, is presented. The improvement with respect to the existing approaches is in a strong reduction of the time necessary for image contrast simulation, without losing accuracy. The method is based on the development of optimized parallel computer codes for the multislice calculations in the frozen-phonon approximation.
1 Jan 2008
Microscopy of Semiconducting Materials 2007