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Type: 
Book
Description: 
We present a study of the influence of specimen thickness on the accurate quantification of specimen chemistry by scanning transmission electron microscopy and high angle annular dark field imaging. It has been observed that the influence of uncertainty in specimen thickness produces errors in the chemical quantification, which depend on the material system under study. The work was performed by comparing experiments and simulations for different materials systems.
Publisher: 
Springer, Dordrecht
Publication date: 
1 Jan 2008
Authors: 

V Grillo, E Carlino, G Ciasca, M De Seta, C Ferrari

Biblio References: 
Pages: 173-176
Origin: 
Microscopy of Semiconducting Materials 2007