- University of Leoben research gateway University of Leoben research gateway University of Leoben research gateway University of Leoben research gateway Research Portal frontpage banner Research Portal > Research output > Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy Menu Home Research output Profile Citation formats Persons Organisational units Activities Theses/Final papers Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy Research output: Contribution to conference › Poster › Research › peer-review Authors Harald Wurmbauer Andrei Andreev Christian Teichert And 5 others Sascha Kremmer G. Tallarida S. Spiga C. Wiemer M. Fanciulli Organisational units Institute of Physics Details Translated title of the contribution Nano-scale characterization of high-k dielectric materials by conducting atomic force , …