Erratum to: Electron Microscopy Study of Surface Islands in Epitaxial Ge3Sb2Te6 Layer Grown on a Silicon Substrate | IMM Container

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Erratum to: Electron Microscopy Study of Surface Islands in Epitaxial Ge3Sb2Te6 Layer Grown on a Silicon Substrate

Type:

Journal

Description:

An Erratum to this paper has been published: https://doi.org/10.1134/S1063774521330014

Publisher:

Pleiades Publishing

Publication date:

1 Nov 2021

Authors:

Yu S Zaytseva, NI Borgardt, AS Prikhodko, E Zallo, R Calarco

Biblio References:

Volume: 66 Issue: 6 Pages: 1167-1167

Origin:

Crystallography Reports

Link:

https://link.springer.com/article/10.1134/S1063774521330014