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Structural and Electrical Characterization of Ni-Based Ohmic Contacts on 4H-SiC Formed by Solid-State Laser Annealing

Type: 
Conference
Description: 
Publisher: 
Trans Tech Publications Ltd
Publication date: 
1 Jan 2022
Authors: 

Paolo Badalà, Emanuele Smecca, Simone Rascunà, Corrado Bongiorno, Egidio Carria, Anna Bassi, Gabriele Bellocchi, Silvia Castorina, Cristina Tringali, Antonino La Magna, Alessandra Alberti

Biblio References: 
Volume: 1062 Pages: 417-421
Origin: 
Materials Science Forum
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

Scientific Productions