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Threshold voltage instability by charge trapping effects in the gate region of p-GaN HEMTs

Type: 
Journal
Description: 
Publisher: 
AIP Publishing LLC
Publication date: 
5 Dec 2022
Authors: 

Giuseppe Greco, Patrick Fiorenza, Filippo Giannazzo, Corrado Bongiorno, Maurizio Moschetti, Cettina Bottari, Mario Santi Alessandrino, Ferdinando Iucolano, Fabrizio Roccaforte

Biblio References: 
Volume: 121 Issue: 23 Pages: 233506
Origin: 
Applied Physics Letters
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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