Experimental analysis of a BMFET light intensity modulator: from static distributions to the carrier plasma dynamic and electro-optical device performance

Authors: 

A Sciuto, S Libertino

Analyses of the As doping of SiO2/Si/SiO2 nanostructures

Authors: 

Francesco Ruffino, Mario Vincenzo Tomasello, Maria Miritello, Riccardo De Bastiani, Giuseppe Nicotra, Corrado Spinella, Maria Grazia Grimaldi

Structural characterization of in‐situ silicided contacts textured on p‐type [001] silicon

Authors: 

Paolo Badalà, Giuseppe Faro, Cinzia Marcellino, Giovanna Pellegrino, Antonello Santangelo, Alessandra Alberti

The Silicon Photomultiplier: Optimum design, performance, applications

Authors: 

R Pagano, S Libertino, S Lombardo, G Valvo, D Sanfilippo, PG Fallica

Kinetic Monte Carlo simulations for transient thermal fields: Computational methodology and application to the submicrosecond laser processes in implanted silicon

Authors: 

Giuseppe Fisicaro, L Pelaz, P Lopez, Antonino La Magna

Effects of the Growth Rate on the Quality of 4H Silicon Carbide Films for MOSFET Applications

Authors: 

Massimo Camarda, Stefania Privitera, Ruggero Anzalone, Nicolò Piluso, Patrick Fiorenza, Alessandra Alberti, Giovanna Pellegrino, Antonino La Magna, Francesco La Via, Carmelo Vecchio, Marco Mauceri, Grazia Litrico, Antonino Pecora, Danilo Crippa

Industrial approach for next generation of power devices based on 4H-SiC.

Authors: 

Mario Saggio, Alfio Guarnera, Edoardo Zanetti, Simone Rascunà, Alessia Frazzetto, Dario Salinas, Filippo Giannazzo, Patrick Fiorenza, Fabrizio Roccaforte

Strong infrared photoluminescence in highly porous layers of large faceted Si crystalline nanoparticles

Authors: 

EML D de Jong, G Mannino, A Alberti, R Ruggeri, M Italia, F Zontone, Y Chushkin, AR Pennisi, T Gregorkiewicz, G Faraci

Chapter 4-SiC Characterization-4.2 Optical and Electrical-Effects of Epitaxial Layer Growth Parameters on the Defect Density and on the Electrical Characteristics of Schottky Diodes

Authors: 

F La Via, F Roccaforte, S Di Franco, A Ruggiero, L Neri, R Reitano, L Calcagno, G Foti, M Mauceri, S Leone, G Pistone, G Abbondanza, G Abbagnale, GL Valente, D Crippa

Single Atom Detection Through HAADF-STEM and EELS/EDX Characterization of Fluorophore Ru (bpy) 32+ for Optical DNA-Chip Applications

Authors: 

G Nicotra, EL Sciuto, MF Santangelo, G Villaggio, F Sinatra, C Bongiorno, S Libertino

Pages