Resistance minimum and electrical conduction mechanism in polycrystalline Co40Fe40B20 thin films

Authors: 

G Venkat Swamy, PK Rout, Manju Singh, RK Rakshit

Defects at the High-k/Semiconductor Inter-faces Investigated by Spin Dependent Spectroscopies

Authors: 

MARCO Fanciulli, OMAR Costa, SILVIA Baldovino, SIMONE Cocco, GABRIELE Seguini, ENRICO Prati, GIOVANNA Scarel

Ultra-fast Processes in Optically Excited Ge2Sb2Te5 by Transient X-ray Diffraction Using a Free-Electron Laser

Authors: 

Kirill Mitrofanov, Paul Fons, Kotaro Makino, Ryo Terashima, Alexander V Kolobov, Junji Tominaga, Alessandro Giussani, Raffella Calarco, Henning Riechert, Tetsuo Katayama, Takahiro Sato, Kanade Ogawa, Tadashi Togashi, Makina Yabashi, Muneaki Hase

W-like states of N uncoupled spins

Authors: 

E Ferraro, A Napoli, MA Jivulescu, A Messina

A Density Function Investigation of Excited-State Effects due to Ultrafast Excitation in Ge2Sb2Te5 Epitaxial Films

Authors: 

Paul Fons, Kirill Mitrofanov, Kotaro Makino, Ryo Terashima, Alexander V Kolobov, Junji Tominaga, Alessandro Giussani, Raffella Calarco, Henning Riechert, Tetsuo Katayama, Takahiro Sato, Kanade Ogawa, Tadashi Togashi, Makina Yabashi, Muneaki Hase

Chloride-based route for monodisperse Cu

Authors: 

Cristy Leonor Azanza Ricardo, Fabrizio Girardi, Elisa Cappelletto, Renato D'Angelo, Regina Ciancio, Elvio Carlino, Pier Carlo Ricci, Claudia Malerba, Alberto Mittiga, Rosa Di Maggio, Paolo Scardi

Simulation and experimental results on the forward JV characteristic of Al implanted 4H-SiC pin diodes

Authors: 

Francesco G Della CORTE, Fortunate PEZZIMENTI, Roberta NIPOTI

Non-destructive testing of olive oil off-flavors by means of a micro-optic smart cap

Authors: 

AG Mignani, L Ciaccheri, AA Mencaglia, R Paolesse, M Mastroianni, D Monti, G Buonocore, MA Del Nobile, A Mentana, MF Grimaldi

Polymorphism in N, N′-dialkyl-naphthalene diimides

Authors: 

Silvia Milita, Fabiola Liscio, Lewis Cowen, Massimiliano Cavallini, Ben A Drain, Thibault Degousée, Sally Luong, Oliver Fenwick, Antonietta Guagliardi, Bob C Schroeder, Norberto Masciocchi

Ni-Al-Ti Ohmic Contacts with Preserved form Factor and Few 10-4 Ωcm² Specific Resistance on 0.1-1 Ωcm P-Type 4H-SiC.

Authors: 

Roberta Nipoti, Maurizio Puzzanghera, Mariaconcetta Canino, Giovanna Sozzi, Paolo Fedeli

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