Thermal modeling and characterization of a thin-film heater on glass substrate for lab-on-chip applications

Authors: 

Andrea Scorzoni, Michele Tavernelli, Pisana Placidi, Stefano Zampolli

Strain sensitivity and transport properties in organic field-effect transistors

Authors: 

Piero Cosseddu, S Milita, Annalisa Bonfiglio

Impact of loss variations on double-ended distributed temperature sensors based on Raman anti-Stokes signal only

Authors: 

Marcelo A Soto, Alessandro Signorini, Tiziano Nannipieri, Stefano Faralli, Gabriele Bolognini, Fabrizio Di Pasquale

Nanocristalli di Silicio: una piattaforma funzionale per la costruzione di nanostrutture ibride per la conversione di energia.

Authors: 

Raffaello Mazzaro

Fabrication of Smooth Ridge Optical Waveguides inby Ion Implantation-Assisted Wet Etching

Authors: 

P De Nicola, S Sugliani, GB Montanari, A Menin, P Vergani, A Meroni, M Astolfi, M Borsetto, G Consonni, R Longone, A Nubile, M Chiarini, M Bianconi, GG Bentini

On the crossing-point of 4H-SiC power diodes characteristics

Authors: 

Luigi Di Benedetto, Gian Domenico Licciardo, Roberta Nipoti, Salvatore Bellone

Perimeter and Area Components in the – Curves of 4H-SiC Vertical p+-i-n Diode With Al+ Ion-Implanted Emitters

Authors: 

Roberta Nipoti, Maurizio Puzzanghera, Giovanna Sozzi, Roberto Menozzi

Preferential removal of pesticides from water by molecular imprinting on TiO2 photocatalysts

Authors: 

Roberto Fiorenza, Alessandro Di Mauro, Maria Cantarella, Carmelo Iaria, Elena Maria Scalisi, Maria Violetta Brundo, Antonino Gulino, Luca Spitaleri, Giuseppe Nicotra, Sandro Dattilo, Sabrina Carola Carroccio, Vittorio Privitera, Giuliana Impellizzeri

Conventional and Counting EELS spectroscopy school, Catania, 22-25 July

Date: 
2019-07-22 to 2019-07-25

The Conventional and Counting EELS spectrocopy school is an intensive 4-day training school that incorporates lectures, computer laboratories, and microscope practicals to provide participants with comprehensive, hands-on training on key EELS topics and technology. The practical lessons will be made at the new Beyond-Nano Sub-Ångstom Lab on integrated JEOL GIF/EELS systems. Thanks to the Transmission electron microscopy (TEM) nowadays we can reveals details of natural and man-made structures even at sub-nanometer scale.

All‐Dielectric Silicon Metasurface with Strong Subterahertz Toroidal Dipole Resonance

Authors: 

Dimitrios C Zografopoulos, Antonio Ferraro, José Francisco Algorri, Pedro Martín‐Mateos, Braulio García‐Cámara, Aldo Moreno‐Oyervides, Viktor Krozer, Pablo Acedo, Ricardo Vergaz, José Manuel Sánchez‐Pena, Romeo Beccherelli

Pages