Negative refraction in Photonic Crystals: thickness dependence and Pendellösung phenomenon

Authors: 

Vito Mocella

Strain Measurements in Porous Silicon by Raman Scattering

Authors: 

MA FERRARA, L SIRLETO, G MESSINA, MG DONATO, L ROTIROTI, I RENDINA

Optical characterization of liquid crystals by combined ellipsometry and half-leaky-guided-mode spectroscopy in the visible-near infrared range

Authors: 

G Abbate, V Tkachenko, A Marino, F Vita, M Giocondo, A Mazzulla, L De Stefano

Frequency-comb-referenced singly-resonant OPO for sub-Doppler spectroscopy

Authors: 

I Ricciardi, E De Tommasi, P Maddaloni, S Mosca, A Rocco, J-J Zondy, M De Rosa, P De Natale

A silicon compatible resonant cavity enhanced photodetector working at 1.55 µm

Authors: 

M Casalino, L Sirleto, L Moretti, I Rendina

Optical characterization of aminosilane-modified silicon dioxide surface for biosensing

Authors: 

M Terracciano, I Rea, J Politi, L De Stefano

Thermal properties of GdSr2RuCu2O8-δ based mixtures in the GdSr2RuO6–CuO pseudo-binary system

Authors: 

Marcello Gombos, Regina Ciancio, Antonio Vecchione, Sandro Pace

Silicon photodetectors based on internal photoemission effect: the challenge of detecting near-infrared light

Authors: 

Maurizio Casalino, Luigi Sirleto, Mario Iodice, Giuseppe Coppola, S Gateva

Ellipsometric study of liquid crystal infiltrated porous silicon

Authors: 

A Marino, G Abbate, V Tkachenko, I Rea, L De Stefano, M Giocondo

Aberrations in curved x-ray multilayers

Authors: 

Ch Morawe, J-P Guigay, V Mocella, C Ferrero, H Mimura, S Handa, K Yamauchi

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