Scanning electron microscopy of dopant distribution in semiconductors

Authors: 

PG Merli, V Morandi, G Savini, M Ferroni, G Sberveglieri

Rapid fabrication and trimming of nanostructured backside reflectors for enhanced optical absorption in a-Si: H solar cells

Authors: 

Yao-Chung Tsao, Thomas Søndergaard, Peter Kjær Kristensen, Rita Rizzoli, Kjeld Pedersen, Thomas Garm Pedersen

High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers

Authors: 

MA Reading, JA Van den Berg, PC Zalm, DG Armour, Paul Bailey, TCQ Noakes, A Parisini, T Conard, Stefan De Gendt

Modification of anisotropic plasma diffusion via auxiliary electrons emitted by a carbon nanotubes-based electron gun in an electron cyclotron resonance ion source a

Authors: 

L Malferrari, F Odorici, GP Veronese, R Rizzoli, D Mascali, L Celona, S Gammino, G Castro, R Miracoli, T Serafino

Part 2-Chapter 5-Processing of SiC-5.1 Implantation and Doping of SiC-Post-Implantation Annealing in a Silane Ambient Using Hot-Wall CVD

Authors: 

SP Bergamini, F Rao, R Hoff, AM Nipoti, E Saddow, SE Oborina

Doped ZnO nanowires: towards homojuctions

Authors: 

E Comini, M Ferroni, N Poli, G Sberveglieri, S Kaciulis, A Mezzi, L Pandolfi

Single-site entanglement at the superconductor-insulator transition in the Hirsch model

Authors: 

Alberto Anfossi, Cristian Degli Esposti Boschi, Arianna Montorsi, Fabio Ortolani

Electro-Optical Modulating Multistack Device Based on the CMOS-Compatible Technology of Amorphous Silicon

Authors: 

Sandro Rao, Francesco G Della Corte, Caterina Summonte

Boron doping of silicon rich carbides: electrical properties

Authors: 

C Summonte, M Canino, M Allegrezza, M Bellettato, A Desalvo, R Shukla, IP Jain, I Crupi, S Milita, L Ortolani, L López-Conesa, S Estradé, F Peiró, B Garrido

Characterization of Near-Surface Defects Caused by Ultralow Energy Ion Implantation

Authors: 

Miklos Fried, Peter Petrik, Jaap Van den Berg, Michael A Reading, Andrea Parisini

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