Preferential oxidation of stacking faults in epitaxial off-axis (111) 3 C-SiC films

Authors: 

A Severino, M Camarda, S Scalese, P Fiorenza, S Di Franco, C Bongiorno, A La Magna, F La Via

Pulsed laser-deposited SnO x: plasma expansion dynamics effects

Authors: 

E Fazio, F Neri, R Ruggeri, S Trusso

Radiation hardness of silicon photomultipliers under 60 Co γ-ray irradiation

Authors: 

R Pagano, S Lombardo, F Palumbo, D Sanfilippo, G Valvo, G Fallica, S Libertino

Praseodymium Silicate as a High‐k Dielectric Candidate: An Insight into the Pr2O3‐Film/Si‐Substrate Interface Fabricated Through a Metal–Organic Chemical Vapor Deposition Process

Authors: 

Raffaella Lo Nigro, Roberta G Toro, Graziella Malandrino, Guglielmo G Condorelli, Vito Raineri, Ignazio L Fragalà

Integration of silicon nanocrystal memory arrays with HfAlOx based interpoly dielectric

Authors: 

G Molas, M Bocquet, J Buckley, H Grampeix, JP Colonna, L Masarotto, F Martin, M Gely, B De Salvo, S Deleonibus, DS Golubovic, MJ van Duuren, C Bongiorno, S Lombardo

Correlation between macroscopic and microscopic stress fields: Application to the 3C–SiC/Si heteroepitaxy

Authors: 

Massimo Camarda, Ruggero Anzalone, Andrea Severino, Nicolò Piluso, Andrea Canino, Francesco La Via, Antonino La Magna

Effects of the thermal annealing processes on praseodymium oxide based films grown on silicon substrates

Authors: 

Raffaella Lo Nigro, Roberta G Toro, Graziella Malandrino, Vito Raineri, Ignazio L Fragalà

Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage

Authors: 

D Corso, S Aurite, E Sciacca, D Naso, Salvatore Lombardo, A Santangelo, MC Nicotra, S Cascino

Reliability of thermally oxidized Si O 2∕ 4 H-Si C by conductive atomic force microscopy

Authors: 

Patrick Fiorenza, Vito Raineri

Irradiation damage in graphene on SiO 2 probed by local mobility measurements

Authors: 

F Giannazzo, S Sonde, V Raineri, E Rimini

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