Effect of Thermal Annealing on the Electrically Active Profiles and Surface Roughness in Multiple Al Implanted 4H-SiC

Authors: 

F Giannazzo, F Roccaforte, V Raineri, D Salinas

Impact of the epilayer doping on the performance of thin metal film Ni2Si/4H-SiC Schottky photodiodes

Authors: 

M Mazzillo, A Sciuto, S Marchese

PZT thin film deposition on Si wafers and optical fibers prepared by reactive DC pulsed magnetron sputtering from a single metallic target

Authors: 

R Thapliyal, P Schwaller, M Amberg, FJ Haug, G Fortunato, D Hegemann, HJ Hug, A Fischer

Silicon resonant cavity enhanced photodetectors at 1.55 μm

Authors: 

M Casalino, L Sirleto, L Moretti, D Panzera, S Libertino, I Rendina

Degradation mechanisms in CMOS power amplifiers subject to radio-frequency stress and comparison to the DC case

Authors: 

Calogero D Presti, Francesco Carrara, Antonino Scuderi, Salvatore Lombardo, Giuseppe Palmisano

Conductive filament structure in HfO 2 resistive switching memory devices

Authors: 

S Privitera, G Bersuker, S Lombardo, C Bongiorno, DC Gilmer

Laser plasma monitored by silicon carbide detectors

Authors: 

L Calcagno, P Musumeci, M Zimbone, F La Via

Evolution of the Transrotational Structure During Crystallization of Amorphous Ge 2 Sb 2 Te 5 Thin Films

Authors: 

Emanuele Rimini, Riccardo De Bastiani, Egidio Carria, Maria Grazia Grimaldi, Giuseppe Nicotra, Corrado Bongiorno, Corrado Spinella

Nanoscale probing of the lateral homogeneity of donors concentration in nitridated SiO2/4H–SiC interfaces

Authors: 

Patrick Fiorenza, Salvatore Di Franco, Filippo Giannazzo, Fabrizio Roccaforte

Electrical properties of the graphene/4 H-SiC (0001) interface probed by scanning current spectroscopy

Authors: 

S Sonde, F Giannazzo, V Raineri, Rositsa Yakimova, J-R Huntzinger, Antoine Tiberj, Jean Camassel

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