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The development of tunable spherical aberration (Cs) imaging correctors for medium-voltage transmission electron microscopes (TEM) offers new opportunities for atomic-scale in-vestigations of materials. A very interesting class of microstructures regarding a variety of dif-ferent physical properties are the transition metal dichalcogenide misfit layer compounds exhibit-ing a high density of incommensurate interfaces due to their stacked nature. In the present study, the benefits coming along with the set-up of negative CS imaging (NCSI) conditions (in TEM) are demonstrated by means of different examples regarding local inhomogeneities in (PbS)1.14NbS2 crystals that can not be dissected in such detail by averaging x-ray techniques.
Springer International Publishing
Publication date: 
1 Dec 2007

Andrea Parisini, Damiano Giubertoni, Massimo Bersani, V Morandi, Pier Giorgio Merli, JA van den Berg

Biblio References: 
Volume: 1026 Issue: 1 Pages: 1-6
MRS Online Proceedings Library