The possibility of sagittally focusing synchrotron radiation using an asymmetric Laue crystal with profiled surfaces has been experimentally demonstrated for the first time. The sample was a Si single crystal with two parallel cylindrical holes of diameter 8 mm. The axes of the holes formed an angle of 7.95° with the (111) diffracting planes and were arranged vertically with respect to the diffracting planes. 15.35 keV synchrotron radiation was diffracted in the space between the holes. The minimum thickness of this Laue crystal was 0.5 mm. The diffracted beam formed an angle of 0.55° with the exit surface. The experiment was performed at beamline BM05 at the ESRF. The length of the beamline was not sufficiently long to detect the focus, but the experiment clearly showed that the diffracted beam was sagittally convergent.
International Union of Crystallography
1 Sep 2006
Volume: 13 Issue: 5 Pages: 392-396
Journal of synchrotron radiation