In this paper, we propose an interferometric approach for visualizing and measuring the quasi-static strain experienced by fibre Bragg grating sensors. The method makes use of a simple bi-polished silicon sample acting like an etalon tuneable filter. The Bragg wavelength shift can be evaluated by analysing the overall interferometric signal achieved by tuning the etalon tuneable filter angularly. A fast Fourier transform method is applied for phase retrieval. The choice of the silicon sample is determined by the low-cost and well-developed silicon technology and fabrication, the easy design and tuneability of the spectral response, and the possibility of integrating on the same sample also the circuitry for electronic control. The principle of operation of this method is described and results obtained by employing such a configuration are reported.