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Semiconducting and insulating polymers and copolymers/Au nanograins based hybrid multilayers (HyMLs) were fabricated on p-Si single-crystal substrate by an iterative method that involves, respectively, Langmuir-Blodgett and spin-coating techniques (for the deposition of organic film) and sputtering technique (for the deposition of metal nanograins) to prepare Au/HyMLs/p-Si Schottky device. The electrical properties of the Au/HyMLs/p-Si Schottky device were investigated by current-voltage (I-V) measurements in the thickness range of 1–5 bilayers (BL).At different number of layers, current-voltage (I-V) measurements were performed. Results showed a rectifying behavior. Junction parameters, such as barrier height (BH), from the I-V measurements for example for the PMMA-b-PS based Au/HyMLs/p-Si structure were obtained as 0.72±0.02 eV at 1BL and 0.64±0.02eV at 5BL. It was observed that …
Springer International Publishing
Publication date: 
1 Dec 2014

V Torrisi, MA Squillaci, F Ruffino, I Crupi, MG Grimaldi, G Marietta

Biblio References: 
Volume: 1660 Issue: 1 Pages: 19-24
MRS Online Proceedings Library