Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches IRIS IRIS Home Sfoglia Macrotipologie & tipologie Autore Titolo Riviste Serie Settore Scientifico Disciplinare Tipologia ISI-CRUI Afferenza IT Italiano Italiano English English LOGIN 1.IRIS 2.Pubblicazioni 3.03 - Contributo in libro Marcelli, R., Lucibello, A., De Angelis, G., Proietti, E., Papaioannou, G., Bartolucci, G., et al. (2012). Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches. In Nazmul Islam (a cura di), Microelectromechanical Systems and Devices (pp. 233-268). InTech [10.5772/29299]. Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches BARTOLUCCI, GIANCARLO; 2012-03-01 Scheda breve …