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Type: 
Book
Description: 
Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches IRIS IRIS Home Sfoglia Macrotipologie & tipologie Autore Titolo Riviste Serie Settore Scientifico Disciplinare Tipologia ISI-CRUI Afferenza IT Italiano Italiano English English LOGIN 1.IRIS 2.Pubblicazioni 3.03 - Contributo in libro Marcelli, R., Lucibello, A., De Angelis, G., Proietti, E., Papaioannou, G., Bartolucci, G., et al. (2012). Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches. In Nazmul Islam (a cura di), Microelectromechanical Systems and Devices (pp. 233-268). InTech [10.5772/29299]. Characterization and Modeling of Charging Effects in Dielectrics for the Actuation of RF MEMS Ohmic Series and Capacitive Shunt Switches BARTOLUCCI, GIANCARLO; 2012-03-01 Scheda breve …
Publisher: 
InTech
Publication date: 
1 Jan 2012
Authors: 

Romolo Marcelli, Andrea Lucibello, Giorgio De Angelis, Emanuela Proietti, George Papaioannou, Giancarlo Bartolucci, Flavio Giacomozzi, Benno Margesin

Biblio References: 
Pages: 233-268
Origin: 
Microelectromechanical Systems and Devices