Scanning transmission electron microscopy (STEM) high angle annular dark field (HAADF) imaging is now a powerful methodology for studying the structural and chemical properties of solid-state matter at atomic resolution. As the HAADF image intensity depends strongly on the atomic number of the elements in the atomic columns of the specimen, important qualitative elemental and structural information can be achieved by direct inspection of the atomic resolution HAADF image contrast. Nevertheless, if quantitative information on the chemistry of the specimen is sought for, it becomes necessary to couple the experimental results with HAADF image simulations.