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We describe a systematic study on the influence of different experimental conditions on the Kelvin probe force microscopy (KPFM) quantitative determination of the local surface potential (SP) of organic semiconducting nanostructures of perylene‐bis‐dicarboximide (PDI) self‐assembled at surfaces. We focus on the effect of the amplitude, frequency, and phase of the oscillating voltage on the absolute surface potential value of a given PDI nanostructure at a surface. Moreover, we investigate the role played by the KPFM measuring mode employed and the tip–sample distance in the surface potential mapping by lift‐mode KPFM. We define the ideal general conditions to obtain a reproducible quantitative estimation of the SP and we find that by decreasing the tip–sample distance, the area of substrate contributing to the recorded SP in a given location of the surface becomes smaller. This leads to an improvement of …
Publication date: 
21 Jul 2006

Andrea Liscio, Vincenzo Palermo, Desirée Gentilini, Fabian Nolde, Klaus Müllen, Paolo Samorì

Biblio References: 
Volume: 16 Issue: 11 Pages: 1407-1416
Advanced Functional Materials