The process of developing superconducting materials for large scale applications is mainly oriented to optimize flux pinning and the current carrying capability. A powerful approach to investigate pinning properties is to combine high resolution imaging with transport measurements as a function of the magnetic field orientation, supported by a pinning modelling. We carry out Transmission Electron Microscopy, Electron Energy Loss Spectroscopy and critical current measurements in fields up to 16 T varying the angle between the field and c-axis of Fe (Se, Te) epitaxial thin films deposited on CaF 2 substrates. We find evidence of nanoscale domains with different Te: Se stoichiometry and/or rotated and tilted axes, as well as of lattice distortions and two-dimensional defects at the grain boundaries. These elongated domains are tens of nm in size along the in-plane axes. We establish a correlation between these …