Chemical and structural properties of atomic layer deposited La 2 O 3 films capped with a thin Al 2 O 3 layer

Authors: 

XL Li, D Tsoutsou, G Scarel, C Wiemer, SC Capelli, SN Volkos, L Lamagna, M Fanciulli

Neutral wetting brush layers for block copolymer thin films using homopolymer blends processed at high temperatures

Authors: 

M Ceresoli, M Palermo, F Ferrarese Lupi, G Seguini, M Perego, G Zuccheri, SD Phadatare, D Antonioli, V Gianotti, K Sparnacci, M Laus

Subsurface Imaging of Coupled Carrier Transport in GaAs/AlGaAs Core–Shell Nanowires

Authors: 

Guannan Chen, Terrence McGuckin, Christopher J Hawley, Eric M Gallo, Paola Prete, Ilio Miccoli, Nico Lovergine, Jonathan E Spanier

Hot-carrier effects in p-channel polycrystalline silicon thin film transistors

Authors: 

L Mariucci, A Valletta, P Gaucci, G Fortunato, F Templier

Atomic layer-deposited Al–HfO 2/SiO 2 bi-layers towards 3D charge trapping non-volatile memory

Authors: 

Gabriele Congedo, Claudia Wiemer, Alessio Lamperti, Elena Cianci, Alessandro Molle, Flavio G Volpe, Sabina Spiga

Synthesis of multiferroic Er-Fe-O thin films by atomic layer and chemical vapor deposition

Authors: 

R Mantovan, S Vangelista, C Wiemer, A Lamperti, G Tallarida, E Chikoidze, Y Dumont, M Fanciulli

Elemental distribution in fluorinated amorphous carbon thin films

Authors: 

A Lamperti, CE Bottani, PM Ossi

Precision patterning with luminescent nanocrystal-functionalized beads

Authors: 

Elisabetta Fanizza, Laurent Malaquin, Tobias Kraus, Heiko Wolf, Marinella Striccoli, Norberto Micali, Antonietta Taurino, Angela Agostiano, M Lucia Curri

Degradation kinetics of ultrathin HfO 2 layers on Si (100) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM

Authors: 

Andrei Zenkevich, Yu Lebedinskii, G Scarel, Marco Fanciulli, Andrey Baturin, N Lubovin

A novel approach to data analysis for semiconductor metal-oxide gas sensors in chromatographic systems

Authors: 

Andrea Adami, Elisa Morganti, Leandro Lorenzelli, L Francioso, P Siciliano

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