Authors: 

F Leccese, M Cagnetti, S Giarnetti, E Petritoli, S Tuti, I Luisetto, A Pecora, L Maiolo, R Durovic-Pejcev, T Dordevic, A Tomasevic, V Bursic, V Arenella, P Gabriele, E De Francesco

Authors: 

Sabina Spiga, Francesco Driussi, Gabriele Congedo, Claudia Wiemer, Alessio Lamperti, Elena Cianci

Authors: 

Francesco Sgarbossa, Sara Maria Carturan, Davide De Salvador, Gian Andrea Rizzi, Enrico Napolitani, G Maggioni, W Raniero, DR Napoli, G Granozzi, A Carnera

Authors: 

Massimo Catalano, Antonietta Taurino, Jiangtao Zhu, Peter A Crozier, Simone Dal Zilio, Matteo Amati, Luca Gregoratti, Benedetto Bozzini, Claudio Mele

Authors: 

G. D’Arrigo, A.M. Mio, M. Boniardi, A. Redaelli, E. Varesi, S. Privitera, G. Pellegrino, C. Spinella, E. Rimini

Date: 
2018-09-24

The workshop is jointly organized by STMicroelectronics and the Institute for Microelectronics and Microsystems of the Italian National Research Council (IMM-CNR). It represents a melting point between the academic and research world and the industrial development in the field of the structural characterization and the microanalysis by electron microscopy (https://www.st.com/content/st_com/en/about/events/events.html/electron-microscopy-workshop.html).

Authors: 
Authors: 

Antonio Alessio Leonardi, Maria Josè Lo Faro, Salvatore Petralia, Barbara Fazio, Paolo Musumeci, Sabrina Conoci, Alessia Irrera, Francesco Priolo

Authors: 

Abhishek Singh Dahiya, Sarah Boubenia, Giorgia Franzo, Guylaine Poulin-Vittrant, Salvatore Mirabella, Daniel Alquier

Pages