F Leccese, M Cagnetti, S Giarnetti, E Petritoli, S Tuti, I Luisetto, A Pecora, L Maiolo, R Durovic-Pejcev, T Dordevic, A Tomasevic, V Bursic, V Arenella, P Gabriele, E De Francesco
Francesco Sgarbossa, Sara Maria Carturan, Davide De Salvador, Gian Andrea Rizzi, Enrico Napolitani, G Maggioni, W Raniero, DR Napoli, G Granozzi, A Carnera
The workshop is jointly organized by STMicroelectronics and the Institute for Microelectronics and Microsystems of the Italian National Research Council (IMM-CNR). It represents a melting point between the academic and research world and the industrial development in the field of the structural characterization and the microanalysis by electron microscopy (https://www.st.com/content/st_com/en/about/events/events.html/electron-microscopy-workshop.html).