Authors: 

Massimo Catalano, Antonietta Taurino, Jiangtao Zhu, Peter A Crozier, Simone Dal Zilio, Matteo Amati, Luca Gregoratti, Benedetto Bozzini, Claudio Mele

Authors: 

G. D’Arrigo, A.M. Mio, M. Boniardi, A. Redaelli, E. Varesi, S. Privitera, G. Pellegrino, C. Spinella, E. Rimini

Date: 
2018-09-24

The workshop is jointly organized by STMicroelectronics and the Institute for Microelectronics and Microsystems of the Italian National Research Council (IMM-CNR). It represents a melting point between the academic and research world and the industrial development in the field of the structural characterization and the microanalysis by electron microscopy (https://www.st.com/content/st_com/en/about/events/events.html/electron-microscopy-workshop.html).

Authors: 
Authors: 

Antonio Alessio Leonardi, Maria Josè Lo Faro, Salvatore Petralia, Barbara Fazio, Paolo Musumeci, Sabrina Conoci, Alessia Irrera, Francesco Priolo

Authors: 

Abhishek Singh Dahiya, Sarah Boubenia, Giorgia Franzo, Guylaine Poulin-Vittrant, Salvatore Mirabella, Daniel Alquier

Authors: 

F Ganci, R Inguanta, S Piazza, C Sunseri, S Lombardo

Authors: 

ZG Hu, P Hess

Authors: 

Shomnath Bhowmick, Orlando Leo, Giuseppe Coppola, Mariano Gioffrè, Marilena Musto, Giuseppe Rotondo, Mario Iodice

Pages